2010 Sep 16 9
NXP Semiconductors Product specification
N-channel dual-gate PoLo MOS-FETs BF1202; BF1202R; BF1202WR
handbook, full pagewidth
DUT
C1
4.7 nF
R1
10 kΩ
MGS315
C4
4.7 nF
L1
≈2.2 μH
C3
4.7 nF
R
L
50 Ω
V
GG
V
AGC
V
DS
R
GEN
50 Ω
V
I
R2
50 Ω
4.7 nF
C2
R
G1
Fig.21 Cross-modulation test set-up.
Table 1 Scattering parameters: V
DS
=5V; V
G2-S
=4V; I
D
=12mA; T
amb
=25C
Table 2 Noise data: V
DS
=5V; V
G2-S
=4V; I
D
=12mA; T
amb
=25C
f
(MHz)
s
11
s
21
s
12
s
22
MAGNITUDE
(ratio)
ANGLE
(deg)
MAGNITUDE
(ratio)
ANGLE
(deg)
MAGNITUDE
(ratio)
ANGLE
(deg)
MAGNITUDE
(ratio)
ANGLE
(deg)
50 0.988 3.26 2.989 176.2 0.0005 92.6 0.995 1.50
100 0.988 6.52 3.017 172.5 0.0009 88.0 0.995 3.01
200 0.984 12.99 2.990 165.0 0.0018 82.5 0.994 5.95
300 0.977 19.39 2.949 157.6 0.0027 78.2 0.992 8.86
400 0.965 25.65 2.913 150.3 0.0036 75.4 0.990 11.79
500 0.951 31.76 2.853 143.2 0.0039 71.8 0.988 14.65
600 0.936 37.68 2.793 136.3 0.0042 69.9 0.986 17.41
700 0.919 43.42 2.727 129.5 0.0044 68.9 0.984 20.10
800 0.903 48.94 2.664 123.0 0.0043 68.5 0.980 22.69
900 0.887 54.25 2.593 116.7 0.0041 70.7 0.975 25.27
1000 0.870 59.34 2.518 110.5 0.0038 72.4 0.970 27.90
f
(MHz)
F
min
(dB)
opt
R
n
()
(ratio) (deg)
400 0.9 0.805 28.5 50
800 1.1 0.725 47.2 40