HEF4794B_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 7 August 2012 9 of 17
NXP Semiconductors
HEF4794B-Q100
8-stage shift-and-store register LED driver
11. Waveforms
Parallel output measurement points are given in Table 9.
V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 6. Propagation delay clock (CP) to output (QPn, QS1, QS2), clock pulse width and maximum clock
frequency
001aag222
t
PLH
1/f
clk(max)
V
M
V
M
V
X
V
I
V
SS
V
DD
V
OL
V
OL
V
OL
t
W
t
PLZ
t
PLH
t
PZL
V
Y
CP input
QS1 output
QS2 output
t
THL
t
TLH
90 %
10 %
V
M
90 %
10 %
t
PHL
t
THL
t
TLH
QPn output
t
W
t
PHL
V
OH
V
OH
Table 9. Measurement points
Supply Input Output
V
DD
V
M
V
M
V
X
V
Y
5 V to 15 V 0.5V
DD
0.5V
DD
0.1V
O
0.9V
O
Measurement points are given in Table 9.
V
OL
is the typical output voltage level that occurs with the output load.
Fig 7. Strobe (STR) to output (QPn) propagation delays and the strobe pulse width
001aag802
CP input
t
W
t
PLZ
t
PZL
V
M
V
M
V
X
V
Y
V
I
V
SS
V
I
V
SS
STR input
V
DD
V
OL
QPn output
HEF4794B_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 7 August 2012 10 of 17
NXP Semiconductors
HEF4794B-Q100
8-stage shift-and-store register LED driver
Measurement points are given in Table 9.
V
OL
is the typical output voltage level that occurs with the output load.
Fig 8. Enable and disable times for input OE
001aag803
OE input
output
LOW to OFF-state
OFF-state to LOW
V
I
V
M
V
X
t
PZL
t
PLZ
outputs
disabled
outputs
enabled
outputs
enabled
V
Y
V
SS
V
DD
V
OL
Measurement points are given in Table 9.
The shaded areas indicate when the input is permitted to change for predictable output performance.
V
OL
is the typical output voltage level that occurs with the output load.
Fig 9. Set-up and hold times for the data input (D)
V
I
V
M
t
su
t
h
t
su
t
h
V
M
V
SS
V
I
V
SS
V
DD
CP input
D input
QPn output
001aag805
V
OL
HEF4794B_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 7 August 2012 11 of 17
NXP Semiconductors
HEF4794B-Q100
8-stage shift-and-store register LED driver
Test data is given in Table 10.
Definitions for test circuit:
DUT - Device Under Test.
R
L
= Load resistance.
C
L
= load capacitance.
R
T
= Termination resistance should be equal to output impedance of Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 10. Test circuit for measuring switching times
001aag804
DUT
V
EXT
R
T
C
L
R
L
t
r
10 %
90 %
t
f
V
I
V
I
V
O
V
DD
V
SS
input pulse
G
Table 10. Test data
Supply Input V
EXT
Load
V
DD
V
I
t
r
, t
f
t
PLZ
, t
PZL
t
PLH
, t
PHL
C
L
R
L
5 V to 15 V V
DD
20 ns V
DD
open 50 pF 1 k

HEF4794BT-Q100J

Mfr. #:
Manufacturer:
Nexperia
Description:
Counter Shift Registers HEF4794BT-Q100/SO16/REEL 13" Q
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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