EDW2032BBBG-7A-F-D

Figure 3: 170-Ball FBGA – MF = 1 (Top View)
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
(Top view)
GroundSupplyGDDR5AddressesData
1
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
DD
V
SS
MF
V
SS
V
DD
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
2
DQ25
DQ27
EDC3
DBI3_n
DQ29
DQ31
V
DDQ
V
SSQ
RESET_n
V
SSQ
V
DDQ
DQ7
DQ5
DBI0_n
EDC0
DQ3
DQ1
3
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
CAS_n
V
DDQ
CKE_n
V
DDQ
RAS_n
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
4
DQ24
DQ26
V
SSQ
WCK23_t
DQ28
DQ30
V
DD
A8, A7
ABI_n
A10, A0
V
DD
DQ6
DQ4
WCK01_t
V
SSQ
DQ2
DQ0
6 7 8 9 10
V
REFD
V
SS
V
DD
V
SS
V
DDQ
V
SSQ
V
SS
BA1, A5
SEN
BA3, A3
V
SS
V
SSQ
V
DDQ
V
SS
V
DD
V
SS
V
REFD
11
DQ16
DQ18
V
SSQ
V
DD
DQ20
DQ22
V
DD
BA2, A4
CK_c
BA0, A2
V
DD
DQ14
DQ12
V
DD
V
SSQ
DQ10
DQ8
12
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
WE_n
V
DDQ
CK_t
V
DDQ
CS_n
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
13
DQ17
DQ19
EDC2
DBI2_n
DQ21
DQ23
V
DDQ
V
SSQ
ZQ
V
SSQ
V
DDQ
DQ15
DQ13
DBI1_n
EDC1
DQ11
DQ9
14
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
DD
V
SS
V
REFC
V
SS
V
DD
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
5
NC
V
SS
V
DD
WCK23_c
V
DDQ
V
SSQ
V
SS
A11, A6
A12, RFU
A9, A1
V
SS
V
SSQ
V
DDQ
WCK01_c
V
DD
V
SS
NC
Note:
1. Balls shown with a heavy, solid outline are off in x16 mode.
2Gb: x16, x32 GDDR5 SGRAM
Ball Assignments and Descriptions
PDF: 09005aef858b7e99
2gb_gddr5_sgram_brief.pdf - Rev. A 2/14 EN
4
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.
Table 2: 170-Ball FBGA Ball Descriptions
Symbol Type Description
A[12:0] Input Address inputs: Provide the row address for ACTIVE commands. A[5:0] (A6) provide
the column address and A8 defines the auto precharge bit for READ/WRITE com-
mands, to select one location out of the memory array in the respective bank. A8
sampled during a PRECHARGE command determines whether the PRECHARGE ap-
plies to one bank (A8 LOW, bank selected by BA[3:0]) or all banks (A8 HIGH). The ad-
dress inputs also provide the op-code during a MODE REGISTER SET command and
the data bits during LDFF commands. A[12:8] are sampled with the rising edge of
CK_t and A[7:0] are sampled with the rising edge of CK_c.
ABI_n Input Address bus inversion: Reduces the power requirements on address pins by limit-
ing the number of address lines driving LOW to 5. ABI_n is enabled by the corre-
sponding ABI mode register bit.
BA[3:0] Input Bank address inputs: Define the bank to which an ACTIVE, READ, WRITE, or PRE-
CHARGE command is being applied. BA[3:0] define which mode register is loaded
during the MODE REGISTER SET command. BA[3:0] are sampled with the rising edge
of CK_t.
CK_t, CK_c Input Clock: CK_t and CK_c are differential clock inputs. Command inputs are latched on
the rising edge of CK_t. Address inputs are latched on the rising edge of CK_t and
the rising edge of CK_c. All latencies are referenced to CK_t. CK_t and CK_c are ex-
ternally terminated.
WCK01_t, WCK01_c/
WCK23_t, WCK23_c
Input Data Clocks: WCK_t and WCK_c are differential clocks used for write data capture
and read data output. WCK01_t and WCK01_c are associated with DQ[15:0], DBI0_n,
DBI1_n, EDC0, and EDC1. WCK23_t and WCK23_c are associated with DQ[31:16],
DBI2_n, DBI3_n, EDC2, and EDC3. WCK clocks operate at nominally twice the CK
clock frequency.
CKE_n Input Clock enable: CKE_n enables (registered LOW) and disables (registered HIGH) inter-
nal circuitry and clocks on the SGRAM. The specific circuitry that is enabled/disabled
is dependent upon the device configuration and operating mode. Taking CKE_n
HIGH provides PRECHARGE POWER-DOWN and SELF REFRESH operations (all banks
idle), or active power-down (row active in any bank). CKE_n is synchronous for pow-
er-down entry and exit and for self refresh entry. CKE_n must be maintained LOW
throughout read and write accesses. Input buffers (excluding CKE_n) are disabled
during SELF REFRESH operation. The value of CKE_n latched at power-up with RE-
SET_n going HIGH determines the termination value of the address and command
inputs.
CS_n Input Chip select: CS_n enables (registered LOW) and disables (registered HIGH) the
command decoder. All commands are masked when CS_n is registered HIGH, but in-
ternal command execution continues. CS_n is considered part of the command code.
MF Input Mirror function: V
DDQ
CMOS input. Must be tied to V
DDQ
or V
SS
.
RAS_n, CAS_n, WE_n Input Command inputs: RAS_n, CAS_n, and WE_n (along with CS_n) define the com-
mand being entered.
RESET_n Input Reset: RESET_n is an active LOW CMOS input referenced to V
SS
. A full chip reset may
be performed at any time by pulling RESET_n LOW. With RESET_n LOW all ODTs are
disabled.
SEN Input Scan enable: V
DDQ
CMOS input. Must be tied to V
SS
when not in use.
2Gb: x16, x32 GDDR5 SGRAM
Ball Assignments and Descriptions
PDF: 09005aef858b7e99
2gb_gddr5_sgram_brief.pdf - Rev. A 2/14 EN
5
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.
Table 2: 170-Ball FBGA Ball Descriptions (Continued)
Symbol Type Description
DQ[31:0] I/O Data input/output: Bidirectional 32-bit data bus.
DBI[3:0]_n I/O Data bus inversion: Reduces the DC power consumption and supply noise induced
jitter on data pins. DBI0_n is associated with DQ[7:0], DBI1_n with DQ[15:8], DBI2_n
with DQ[23:16], and DBI3_n with DQ[31:24].
EDC[3:0] Output Error detection code: The calculated CRC data is transmitted on these pins. In ad-
dition, these pins drive a hold pattern when idle and can be used as an RDQS func-
tion. EDC0 is associated with DQ[7:0], EDC1 with DQ[15:8], EDC2 with DQ[23:16], and
EDC3 with DQ[31:24].
V
DD
Supply Power supply: 1.6V/1.5V ±3% and 1.35V ±3%.
V
DDQ
Supply DQ power supply: 1.6V/1.5V ±3% and 1.35V ±3%. Isolated on the device for im-
proved noise immunity.
V
REFC
Supply Reference voltage for control and address: V
REFC
must be
maintained at all times (including self refresh) for proper device operation.
V
REFD
Supply Reference voltage for data: V
REFD
must be maintained at all times (including self
refresh) for proper device operation.
V
SS
Supply Ground.
V
SSQ
Supply DQ ground: Isolated on the device for improved noise immunity.
ZQ Reference External reference ball for output drive calibration: This ball is tied to an
external 120Ω resistor (ZQ), which is tied to V
SSQ
.
NC No connect: These balls should be left unconnected (the ball has no connection to
the SGRAM or to other balls).
2Gb: x16, x32 GDDR5 SGRAM
Ball Assignments and Descriptions
PDF: 09005aef858b7e99
2gb_gddr5_sgram_brief.pdf - Rev. A 2/14 EN
6
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.

EDW2032BBBG-7A-F-D

Mfr. #:
Manufacturer:
Micron
Description:
IC RAM 2G PARALLEL 170FBGA
Lifecycle:
New from this manufacturer.
Delivery:
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