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PHE13005,127
P1-P3
P4-P6
P7-P9
P10-P12
P13-P13
NXP Semiconductors
PHE13005
Silicon diffused power transistor
PHE13005
All information provided in this document is subject to legal disclaimers.
© NXP N.V. 2014. All rights reserved
Product data sheet
21 January 2014
3 / 12
001aab999
DUT
L
C
L
B
I
Bon
V
BB
V
CC
V
CL(CE)
probe point
Fig. 1.
T
est circuit for reverse bias safe operating area
V
CL(CE)
(V)
0
800
600
200
400
003aad544
4
2
6
8
I
C
(A)
0
V
BE
= -
5V
Fig. 2.
Reverse bias safe operating area
03aa13
0
40
80
12
0
0
50
100
15
0
2
00
T
h
(°C)
P
der
(%)
Fig. 3.
Normalized total power dissipation as a function of heatsink temperature
NXP Semiconductors
PHE13005
Silicon diffused power transistor
PHE13005
All information provided in this document is subject to legal disclaimers.
© NXP N.V. 2014. All rights reserved
Product data sheet
21 January 2014
4 / 12
001aai071
10
-
1
10
-
2
10
1
10
2
I
C
(A)
10
-
3
V
CL(CE)
(V)
1
10
3
10
2
10
(1)
100 µs
200 µs
(3)
t
p
= 20 µs
duty cycle = 0.01
50 µs
500 µs
DC
(4)
(5)
(2)
I
CM(max)
I
C(max)
Fig. 4.
Forward bias safe operating area
8.
Thermal characteristics
T
able 5.
Thermal characteristics
Symbol
Parameter
Conditions
Min
T
yp
Max
Unit
R
th(j-mb)
thermal resistance
from junction to
mounting base
Fig. 5
-
-
1.67
K/W
R
th(j-a)
thermal resistance
from junction to
ambient
in free air
-
60
-
K/W
003aad543
t
p
(s)
10
-
5
1
10
10
-
1
10
-
2
10
- 4
10
-
3
1
10
-
1
10
Z
th(j-mb)
(K/W)
10
-
2
δ
= 0.5
0.2
0.1
t
p
t
p
1/f
P
t
1/f
δ
=
0.01
0.05
0.02
Fig. 5.
T
ransient thermal impedance from junction to mounting base as a function of pulse duration
NXP Semiconductors
PHE13005
Silicon diffused power transistor
PHE13005
All information provided in this document is subject to legal disclaimers.
© NXP N.V. 2014. All rights reserved
Product data sheet
21 January 2014
5 / 12
9.
Characteristics
T
able 6.
Characteristics
Symbol
Parameter
Conditions
Min
T
yp
Max
Unit
Dynamic characteristics
I
C
= 2 A; I
Bon
= 0.4 A; I
Boff
= -0.4 A;
R
L
= 75 Ω; T
mb
= 25 °C; resistive load;
Fig. 12
;
Fig. 13
-
2.7
4
µs
I
C
= 2 A; I
Bon
= 0.4 A; V
BB
= -5 V;
L
B
= 1 µH; T
mb
= 25 °C; inductive load;
Fig. 14
;
Fig. 15
-
1.2
2
µs
t
s
storage time
I
C
= 2 A; I
Bon
= 0.4 A; V
BB
= -5 V;
L
B
= 1 µH; T
mb
= 100 °C; inductive
load;
Fig. 14
;
Fig. 15
-
1.4
4
µs
I
C
= 2 A; I
Bon
= 0.4 A; I
Boff
= -0.4 A;
R
L
= 75 Ω; T
mb
= 25 °C; resistive load;
Fig. 12
;
Fig. 13
-
0.3
0.9
µs
I
C
= 2 A; I
Bon
= 0.4 A; V
BB
= -5 V;
L
B
= 1 µH; T
mb
= 25 °C; inductive load;
Fig. 14
;
Fig. 15
-
0.1
0.5
µs
t
f
fall time
I
C
= 2 A; I
Bon
= 0.4 A; V
BB
= -5 V;
L
B
= 1 µH; T
mb
= 100 °C; inductive
load;
Fig. 14
;
Fig. 15
-
0.16
0.9
µs
Static characteristics
V
BE
= -1.5 V; V
CE
= 700 V; T
j
= 25 °C
-
-
1
mA
I
CES
collector-emitter cut-off
current
V
BE
= -1.5 V; V
CE
= 700 V; T
j
= 100 °C
-
-
5
mA
I
CBO
collector-base cut-off
current
V
CB
= 700 V; I
E
= 0 A; T
mb
= 25 °C
-
-
1
mA
I
CEO
collector-emitter cut-off
current
V
CE
= 400 V; I
B
= 0 A; T
mb
= 25 °C
-
-
0.1
mA
I
EBO
emitter-base cut-off
current
V
EB
= 9 V; I
C
= 0 A; T
mb
= 25 °C
-
-
1
mA
V
CEOsus
collector-emitter
sustaining voltage
I
B
= 0 A; I
C
= 10 mA; L
C
= 25 mH;
T
mb
= 25 °C;
Fig. 6
;
Fig. 7
400
-
-
V
I
C
= 1 A; I
B
= 0.2 A; T
mb
= 25 °C;
Fig. 8
;
Fig. 9
-
0.1
0.5
V
I
C
= 2 A; I
B
= 0.5 A; T
mb
= 25 °C;
Fig. 8
;
Fig. 9
-
0.2
0.6
V
V
CEsat
collector-emitter
saturation voltage
I
C
= 4 A; I
B
= 1 A; T
mb
= 25 °C;
Fig. 8
;
Fig. 9
-
0.3
1
V
V
BEsat
base-emitter saturation
voltage
I
C
= 1 A; I
B
= 0.2 A; T
mb
= 25 °C;
Fig. 10
-
0.85
1.2
V
P1-P3
P4-P6
P7-P9
P10-P12
P13-P13
PHE13005,127
Mfr. #:
Buy PHE13005,127
Manufacturer:
WeEn Semiconductors
Description:
Bipolar Transistors - BJT RAIL BIPOLAR
Lifecycle:
New from this manufacturer.
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PHE13005,127