16
AT45DB642
1638F–DFLSH–09/02
Test Waveforms and Measurement Levels
Output Test Load
AC Characteristics – Parallel Interface
Symbol Parameter Min Max Units
f
SCK1
CLK Frequency 5MHz
f
CAR1
CLK Frequency for Continuous Array Read 3 MHz
f
BARSD1
CLK Frequency for Burst Array Read with Synchronous Delay 5 MHz
t
WH
CLK High Time 80 ns
t
WL
CLK Low Time 80 ns
t
CS
Minimum CS High Time 250 ns
t
CSS
CS Setup Time 250 ns
t
CSH
CS Hold Time 250 ns
t
CSB
CS High to RDY/BUSY Low 150 ns
t
SU
Data In Setup Time 75 ns
t
H
Data In Hold Time 25 ns
t
HO
Output Hold Time 0 ns
t
DIS
Output Disable Time 55 ns
t
V
Output Valid 70 ns
t
XFR
Page to Buffer Transfer/Compare Time 700 µs
t
EP
Page Erase and Programming Time 20 ms
t
P
Page Programming Time 14 ms
t
PE
Page Erase Time 8ms
t
BE
Block Erase Time 12 ms
t
RST
RESET Pulse Width 10 µs
t
REC
RESET Recovery Time 1 µs
AC
DRIVING
LEVELS
AC
MEASUREMENT
LEVEL
0.45V
2.0
0.8
2.4V
tR, tF < 3 ns (10% to 90%)
DEVICE
UNDER
TEST
30 pF
