SL28748
DOC#: SP-AP-0017 (Rev. AA) Page 13 of 19
AC Electrical Specifications
Parameter Description Condition Min. Max. Unit
Crystal
T
DC
XIN Duty Cycle The device will operate reliably with input
duty cycles up to 30/70 but the REF clock
duty cycle will not be within specification
47.5 52.5 %
T
PERIOD
XIN Period When XIN is driven from an external
clock source
69.841 71.0 ns
T
R
/T
F
XIN Rise and Fall Times Measured between 0.3V
DD
and 0.7V
DD
–10.0ns
T
CCJ
XIN Cycle to Cycle Jitter As an average over 1-s duration 500 ps
L
ACC
Long-term Accuracy Measured at VDD/2 differential 250 ppm
Clock Input
T
DC
CLKIN Duty Cycle Measured at VDD/2 47 53 %
T
R
/T
F
CLKIN Rise and Fall Times Measured between 0.2V
DD
and 0.8V
DD
0.5 4.0 V/ns
T
CCJ
CLKIN Cycle to Cycle Jitter Measured at VDD/2 250 ps
T
LTJ
CLKIN Long Term Jitter Measured at VDD/2 350 ps
V
IL
Input Low Voltage XIN / CLKIN pin 0.8 V
V
IH
Input High Voltage XIN / CLKIN pin 2 VDD+0.3 V
I
IL
Input LowCurrent XIN / CLKIN pin, 0 < VIN <0.8 20 uA
I
IH
Input HighCurrent XIN / CLKIN pin, VIN = VDD 35 uA
CPU at 0.7V
T
DC
CPUT and CPUC Duty Cycle Measured at 0V differential
45 55
%
T
PERIOD
100 MHz CPUT and CPUC Period Measured at 0V differential at 0.1s
9.99900 10.00100
ns
T
PERIOD
133 MHz CPUT and CPUC Period Measured at 0V differential at 0.1s
7.49925 7.50075
ns
T
PERIODSS
100 MHz CPUT and CPUC Period, SSC Measured at 0V differential at 0.1s
10.02406 10.02607
ns
T
PERIODSS
133 MHz CPUT and CPUC Period, SSC Measured at 0V differential at 0.1s
7.51804 7.51955
ns
T
PERIODAbs
100 MHz CPUT and CPUC Absolute
period
Measured at 0V differential at 1 clock
9.91400 10.0860
ns
T
PERIODAbs
133 MHz CPUT and CPUC Absolute
period
Measured at 0V differential at 1 clock
7.41425 7.58575
ns
T
PERIODSSAbs
100 MHz CPUT and CPUC Absolute
period, SSC
Measured at 0V differential at1 clock
9.914063 10.1362
ns
T
PERIODSSAbs
133 MHz CPUT and CPUC Absolute
period, SSC
Measured at 0V differential at1 clock
7.41430 7.62340
ns
T
CCJ
CPU Cycle to Cycle Jitter Measured at 0V differential 85 ps
Skew CPU0 to CPU1 skew Measured at 0V differential 100 ps
L
ACC
Long-term Accuracy Measured at 0V differential 100 ppm
T
R
/ T
F
CPU Rising/Falling Slew rate Measured differentially from ±150 mV 2.5 8 V/ns
T
RFM
Rise/Fall Matching Measured single-endedly from ±75 mV 20 %
V
HIGH
Voltage High 1.15 V
V
LOW
Voltage Low –0.3 V
V
OX
Crossing Point Voltage at 0.7V Swing 300 550 mV
SRC at 0.7V
T
DC
SRC Duty Cycle Measured at 0V differential 45 55 %
T
PERIOD
100 MHz SRC Period Measured at 0V differential at 0.1s
9.99900 10.0010
ns
T
PERIODSS
100 MHz SRC Period, SSC Measured at 0V differential at 0.1s
10.02406 10.02607
ns
T
PERIODAbs
100 MHz SRC Absolute Period Measured at 0V differential at 1 clock
9.87400 10.1260
ns
T
PERIODSSAbs
100 MHz SRC Absolute Period, SSC Measured at 0V differential at 1 clock
9.87406 10.1762
ns
SL28748
DOC#: SP-AP-0017 (Rev. AA) Page 14 of 19
T
SKEW(window)
Any SRC Clock Skew from the earliest
bank to the latest bank
Measured at 0V differential 3.0 ns
T
CCJ
SRC Cycle to Cycle Jitter Measured at 0V differential 125 ps
RMS
GEN1
Output PCIe* Gen1 REFCLK phase
jitter
BER = 1E-12 (including PLL BW 8 - 16
MHz, ζ = 0.54, Td=10 ns,
Ftrk=1.5 MHz)
0108ps
RMS
GEN2
Output PCIe* Gen2 REFCLK phase
jitter
Includes PLL BW 8 - 16 MHz, Jitter
Peaking = 3dB, ζ = 0.54, Td=10 ns),
Low Band, F < 1.5MHz
03.0ps
RMS
GEN2
Output PCIe* Gen2 REFCLK phase
jitter
Includes PLL BW 8 - 16 MHz, Jitter
Peaking = 3dB, ζ = 0.54, Td=10 ns),
Low Band, F < 1.5MHz
03.1ps
L
ACC
SRC Long Term Accuracy Measured at 0V differential 100 ppm
T
R
/ T
F
SRC Rising/Falling Slew Rate Measured differentially from ±150 mV 2.5 8 V/ns
T
RFM
Rise/Fall Matching Measured single-endedly from ±75 mV 20 %
V
HIGH
Voltage High 1.15 V
V
LOW
Voltage Low –0.3 V
V
OX
Crossing Point Voltage at 0.7V Swing 300 550 mV
DOT96 at 0.7V
T
DC
DOT96 Duty Cycle Measured at 0V differential 45 55 %
T
PERIOD
DOT96 Period Measured at 0V differential at 0.1s
10.4156 10.4177
ns
T
PERIODAbs
DOT96 Absolute Period Measured at 0V differential at 0.1s
10.1656 10.6677
ns
T
CCJ
DOT96 Cycle to Cycle Jitter Measured at 0V differential at 1 clock 250 ps
L
ACC
DOT96 Long Term Accuracy Measured at 0V differential at 1 clock 100 ppm
T
R
/ T
F
DOT96 Rising/Falling Slew Rate Measured differentially from ±150 mV 2.5 8 V/ns
T
RFM
Rise/Fall Matching Measured single-endedly from ±75 mV 20 %
V
HIGH
Voltage High 1.15 V
V
LOW
Voltage Low –0.3 V
V
OX
Crossing Point Voltage at 0.7V Swing 300 550 mV
27M_NSS/27_SS at 3.3V
T
DC
Duty Cycle Measurement at 1.5V 45 55 %
T
PERIOD
Spread 27M Period Measurement at 1.5V 37.03594 37.03813 ns
Spread Enabled 27M Period Measurement at 1.5V 37.12986 37.13172 ns
T
R
/ T
F
Rising and Falling Edge Rate Measured between 0.8V and 2.0V 1.0 4.0 V/ns
T
CCJ
Cycle to Cycle Jitter Measurement at 1.5V 300 ps
L
ACC
27_M Long Term Accuracy Measured at crossing point V
OX
–50ppm
REF
T
DC
REF Duty Cycle Measurement at 1.5V 45 55 %
T
PERIOD
REF Period
Measurement at 1.5V 69.82033 69.86224 ns
T
PERIODAbs
REF Absolute Period
Measurement at 1.5V 68.83429 70.84826 ns
T
HIGH
REF High time
Measurement at 2V 29.97543 38.46654 ns
T
LOW
REF Low time
Measurement at 0.8V 29.57543 38.26654 ns
T
R
/ T
F
REF Rising and Falling Edge Rate Measured between 0.8V and 2.0V 1.0 4.0 V/ns
AC Electrical Specifications (continued)
Parameter Description Condition Min. Max. Unit
SL28748
DOC#: SP-AP-0017 (Rev. AA) Page 15 of 19
T
CCJ
REF Cycle to Cycle Jitter Measurement at 1.5V 1000 ps
L
ACC
Long Term Accuracy Measurement at 1.5V 100 ppm
ENABLE/DISABLE and SET-UP
T
STABLE
Clock Stabilization from Power-up 1.8 ms
T
SS
Stopclock Set-up Time 10.0 ns
AC Electrical Specifications (continued)
Parameter Description Condition Min. Max. Unit

SL28748ELI

Mfr. #:
Manufacturer:
Silicon Labs
Description:
Clock Generators & Support Products Calpella, IronLake, Jasper Forest, Ibex Peak.
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet