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AUIRF2804S-7P
P1-P3
P4-P6
P7-P9
P10-P11
AUIRF2804S-7P
4
2015-11-11
Fig 5.
Typical Capacitance vs.
Drain-to-Source
Voltage
Fig 6.
Typical Gate Charge vs.
Gate-to-Source Voltage
Fig 8.
Maximum Safe Operating Area
Fig. 7
Typical Source-to-Drain Diode
Forward Voltage
1
10
100
V
DS
,
Dr
ai
n-
t
o-
Sour
ce Volt
age (
V)
0
2000
4000
6000
8000
10000
12000
14000
C
,
C
a
p
a
c
i
t
a
n
c
e
(
p
F
)
Coss
Cr
ss
Ci
ss
V
GS
=
0V, f = 1 MHZ
C
iss
= C
gs
+ C
gd
, C
ds
SHO
RTED
C
rs
s
= C
gd
C
oss
= C
ds
+ C
gd
0
50
100
150
200
250
300
Q
G
Tot
al
Gat
e Char
ge (
nC)
0
4
8
12
16
20
V
G
S
,
G
a
t
e
-
t
o
-
S
o
u
r
c
e
V
o
l
t
a
g
e
(
V
)
V
DS
= 3
2
V
VDS=
20V
I
D
=
160A
0
.
00
.
40
.
81
.
21
.
62
.
02
.
4
V
SD
,
Sour
ce-
t
o-
Dr
ai
n Vol
t
age (
V)
0.1
1.0
10.0
100.0
1000.0
I
S
D
,
R
e
v
e
r
s
e
D
r
a
i
n
C
u
r
r
e
n
t
(
A
)
T
J
= 25
°C
T
J
= 175°
C
V
GS
= 0
V
0
1
10
100
1000
V
DS
,
Dr
ai
n-
t
oSour
ce Vol
t
age (
V)
0.
1
1
10
100
1000
10000
I
D
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
C
u
r
r
e
n
t
(
A
)
Tc = 25°
C
Tj
= 175°
C
Si
ngl
e Pul
se
1msec
10msec
OPERATION I
N THI
S AREA
LIM
ITED BY R
DS
(
on)
100µsec
DC
AUIRF2804S-7P
5
2015-11-11
Fig 10.
Normalized O
n-Resistanc
e
vs. Temperature
Fig 11.
Maximum Effective Transient Thermal Impedance, Jun
c
tion-to-Case
Fig 9.
Maximum Drain Current vs.
Case Temperature
25
50
75
100
125
150
175
T
C
,
Case T
emper
at
u
r
e (
°
C
)
0
50
100
150
200
250
300
350
I
D
,
D
r
a
i
n
C
u
r
r
e
n
t
(
A
)
Lim
it
ed By Packa
ge
-60
-40
-20
0
20
40
60
80
100
120
140
160
180
T
J
,
Junct
i
on
Tempe
r
at
ur
e (
°
C)
0.5
1.0
1.5
2.0
R
D
S
(
o
n
)
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
O
n
R
e
s
i
s
t
a
n
c
e
(
N
o
r
m
a
l
i
z
e
d
)
I
D
= 1
60A
V
GS
= 10
V
1E-006
1E-005
0.0001
0.001
0.01
0.1
t
1
,
Rect
angul
ar
Pul
se Du
r
at
i
on (
sec)
0.0001
0.001
0.01
0.1
1
T
h
e
r
m
a
l
R
e
s
p
o
n
s
e
(
Z
t
h
J
C
)
0.
20
0.10
D = 0.
50
0.
02
0.
01
0.
05
SINGLE PULSE
(
THERM
AL RESPONSE
)
Not
es:
1
.
Du
ty F
ac
tor D
= t1
/t2
2.
Peak Tj
=
P dm
x Zt
hj
c +
Tc
Ri (°C/W)
i (sec)
0.1951
0.000743
0.3050
0.008219
J
J
1
1
2
2
R
1
R
1
R
2
R
2
C
C
Ci=
i
Ri
Ci=
i
Ri
AUIRF2804S-7P
6
2015-11-11
Fig 12a.
Unclamped Inductive Test Circuit
Fig 12b.
Unclamped Inductive Waveforms
Fig 13a.
Basic Gate Charge Waveform
Fig 13b.
Gate Charge Test Circuit
R
G
I
AS
0.01
t
p
D.U.T
L
V
DS
+
-
V
DD
DRIVER
A
15V
20V
t
p
V
(BR)DSS
I
AS
Vds
Vgs
Id
Vgs(th)
Qgs1
Qgs2
Qgd
Qgodr
Fig 12c.
Maximum Avalanche Energy
vs. Drain Current
Fig 14.
Threshold Voltage vs. Temperature
25
50
75
100
125
150
17
5
St
ar
t
i
ng T
J
,
Junct
i
on
Temper
at
ur
e (
°
C)
0
500
1000
1500
2000
2500
E
A
S
,
S
i
n
g
l
e
P
u
l
s
e
A
v
a
l
a
n
c
h
e
E
n
e
r
g
y
(
m
J
)
I
D
TOP
21
A
33
A
BO
TTO
M
160A
-75
-50
-25
0
25
50
75
100
125
15
0
175
T
J
,
Tem
per
a
t
ur
e
(
°
C
)
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
V
G
S
(
t
h
)
G
a
t
e
t
h
r
e
s
h
o
l
d
V
o
l
t
a
g
e
(
V
)
I
D
= 1.0
A
I
D
= 1.0
mA
I
D
=
250µA
P1-P3
P4-P6
P7-P9
P10-P11
AUIRF2804S-7P
Mfr. #:
Buy AUIRF2804S-7P
Manufacturer:
Infineon / IR
Description:
MOSFET AUTO 40V 1 N-CH HEXFET 2.3mOhms
Lifecycle:
New from this manufacturer.
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AUIRF2804S-7P