22 Altera Corporation
FLEX 6000 Programmable Logic Device Family Data Sheet
Figure 11. Global Clock & Clear Distribution Note (1)
Notes:
(1) The global clock and clear distribution signals are shown for EPF6016 and EPF6016A devices. In EPF6010A devices,
LABs in rows B and C drive global signals. In EPF6024A devices, LABs in rows C and E drive global signals.
(2) The local interconnect from LABs C1 and D1 can drive two global control signals on the left side.
(3) Global signals drive into every LAB as clock, asynchronous clear, preset, and data signals.
(4) The local interconnect from LABs C22 and D22 can drive two global control signals on the right side.
Dedicated
Inputs
LAB C1
LAB
(Repeated
Across
Device)
4
Dedicated
Inputs
(3)
(2)
(2) (4)
(4)
LAB D1 LAB D22
LAB C22
Altera Corporation 23
FLEX 6000 Programmable Logic Device Family Data Sheet
I/O Elements
An IOE contains a bidirectional I/O buffer and a tri-state buffer. IOEs can
be used as input, output, or bidirectional pins. An IOE receives its data
signals from the adjacent local interconnect, which can be driven by a row
or column interconnect (allowing any LE in the device to drive the IOE) or
by an adjacent LE (allowing fast clock-to-output delays). A FastFLEX
TM
I/O pin is a row or column output pin that receives its data signals from
the adjacent local interconnect driven by an adjacent LE. The IOE receives
its output enable signal through the same path, allowing individual
output enables for every pin and permitting emulation of open-drain
buffers. The Altera Compiler uses programmable inversion to invert the
data or output enable signals automatically where appropriate. Open-
drain emulation is provided by driving the data input low and toggling
the OE of each IOE. This emulation is possible because there is one OE per
pin.
A chip-wide output enable feature allows the designer to disable all pins
of the device by asserting one pin (DEV_OE). This feature is useful during
board debugging or testing.
Figure 12 shows the IOE block diagram.
Figure 12. IOE Block Diagram
From LAB Local Interconnect
Slew-Rate
Control
From LAB Local Interconnect
To Row or Column Interconnect
Chip-Wide Output Enable
Delay
24 Altera Corporation
FLEX 6000 Programmable Logic Device Family Data Sheet
Each IOE drives a row or column interconnect when used as an input or
bidirectional pin. A row IOE can drive up to six row lines; a column IOE
can drive up to two column lines. The input path from the I/O pad to the
FastTrack Interconnect has a programmable delay element that can be
used to guarantee a zero hold time. Depending on the placement of the
IOE relative to what it is driving, the designer may choose to turn on the
programmable delay to ensure a zero hold time. Figure 13 shows how an
IOE connects to a row interconnect, and Figure 14 shows how an IOE
connects to a column interconnect.
Figure 13. IOE Connection to Row Interconnect
Row Interconnect
Any LE can drive
a pin through the
row and local
interconnect.
FastFLEX I/O: An LE can drive a pin through the
local interconnect for faster clock-to-output times.
IOE
IOE
Up to 10 IOEs are on either
side of a row. Each IOE can
drive up to six row
channels, and each IOE data
and OE signal is driven by
the local interconnect.
LAB

EPF6024AFI256-2

Mfr. #:
Manufacturer:
Intel
Description:
IC FPGA 219 I/O 256FBGA FLEX 6000
Lifecycle:
New from this manufacturer.
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