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VNN7NV04PTR-E
P1-P3
P4-P6
P7-P9
P10-P12
P13-P15
P16-P18
P19-P21
P22-P24
P25-P27
P28-P29
Prote
ction feat
ures
VNN
7NV04P-
E, VNS7N
V04P-E
10/29
Doc ID 15632
Rev 4
Figure
4.
Switching t
ime test circu
it for resis
tive load
Figure 5.
T
e
st circ
uit for diode recovery times
t
I
D
90%
10%
t
V
gen
t
d(on)
t
d(off
)
t
f
t
r
L=100uH
A
B
8.5
Ω
V
DD
R
gen
F
AST
DIODE
OMNIFET
A
D
I
S
150
Ω
B
OMNIFET
D
S
I
V
gen
VNN7NV04P
-E, VNS7NV
04P-E
Protecti
on features
Doc ID 1
5632 Re
v 4
1
1/29
Figure 6.
Unclamped inductiv
e load test
circuits
Figure 7.
Input charge test
circuit
Figure 8.
Unclamped induc
tive waveforms
R
GEN
P
W
V
IN
V
IN
Prote
ction feat
ures
VNN
7NV04P-
E, VNS7N
V04P-E
12/29
Doc ID 15632
Rev 4
3.1 Electr
ical
characteris
tics
curves
Figure 9.
Dera
ting curve
Figure 10.
T
r
ansconduct
ance
Figure 1
1.
St
atic dr
ain-source on resist
ance
vs input volt
age (p
art 1/2)
Figure 12.
St
atic drain-sou
rce on resistance
vs input voltage
(par
t 2/2)
Figure 13.
Source-drain diode for
ward
character
istics
Figure 14.
St
atic drain source on res
ist
ance
0
1234567
8
Id(A)
0
2
4
6
8
10
12
14
16
18
20
Gfs (S)
Vds=
13V
Tj=25ºC
Tj=150ºC
Tj=-40ºC
33
.
5
44
.
5
55
.
566
.
5
7
Vin(V)
0
10
20
30
40
50
60
70
80
90
100
110
120
Rds(on) (mOhm)
Id=3.5
A
Tj=150ºC
Tj= - 40ºC
Tj=25ºC
3
3.5
4
4
.5
5
5.5
6
6.5
Vin(V)
0
20
40
60
80
100
120
140
Rds(on) (
mOhm)
Id=6A
Id=1A
Id=6A
Id=1A
Id=6A
Id=1A
Tj=25ºC
Tj=150ºC
Tj=-40ºC
0
2
4
6
8
1
01
21
4
Id(A
)
500
550
600
650
700
750
800
850
900
950
1000
Vsd (mV
)
Vin=
0V
0
1
2345
6
Id(A
)
0
25
50
75
100
125
150
Rds(on
) (mohms)
Tj=25ºC
Tj=150ºC
Tj=-40ºC
Vin=5V
P1-P3
P4-P6
P7-P9
P10-P12
P13-P15
P16-P18
P19-P21
P22-P24
P25-P27
P28-P29
VNN7NV04PTR-E
Mfr. #:
Buy VNN7NV04PTR-E
Manufacturer:
STMicroelectronics
Description:
Gate Drivers 40V 6A OMNIFET
Lifecycle:
New from this manufacturer.
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VNN7NV04PTR-E
VNS7NV04PTR-E