CY7C056V
CY7C057V
Document #: 38-06055 Rev. ** Page 10 of 23
Data Retention Mode
The CY7C056V and CY7C057V are designed with battery
backup in mind. Data retention voltage and supply current are
guaranteed over temperature. The following rules ensure data
retention:
1. Chip Enable (CE
)
[3]
must be held HIGH during data retention,
within V
DD
to V
DD
– 0.2V.
2. CE
must be kept between V
DD
– 0.2V and 70% of V
DD
during the power-up and power-down transitions.
3. The RAM can begin operation >t
RC
after V
DD
reaches the
minimum operating voltage (3.15 volts).
Notes:
20. t
BDD
is a calculated parameter and is the greater of t
WDD
–t
PWE
(actual) or t
DDD
–t
SD
(actual).
21. CE
= V
DD
, V
in
= V
SS
to V
DD
, T
A
= 25°C. This parameter is guaranteed but not tested.
Busy Timing
[19]
t
BHC
BUSY HIGH from CE HIGH 12 15 20 ns
t
PS
Port Set-Up for Priority 5 5 5 ns
t
WB
R/W LOW after BUSY (Slave) 0 0 0 ns
t
WH
R/W HIGH after BUSY HIGH (Slave) 11 13 15 ns
t
BDD
[20]
BUSY HIGH to Data Valid 12 15 20 ns
Interrupt Timing
[19]
t
INS
INT Set Time 12 15 20 ns
t
INR
INT Reset Time 12 15 20 ns
Semaphore Timing
t
SOP
SEM Flag Update Pulse (OE or SEM)10 10 10 ns
t
SWRD
SEM Flag Write to Read Time 5 5 5 ns
t
SPS
SEM Flag Contention Window 5 5 5 ns
t
SAA
SEM Address Access Time 12 15 20 ns
Switching Characteristics Over the Operating Range
[13]
(continued)
Parameter Description
CY7C056V
CY7C057V
Unit
-12
-15 -20
Min. Max.
Min. Max. Min. Max.
Timing
Parameter Test Conditions
[21]
Max. Unit
ICC
DR1
@ VDD
DR
= 2V 50 µA
Data Retention Mode
3.15V
3.15V
V
CC
> 2.0V
V
CC
to V
CC
– 0.2V
V
CC
CE
t
RC
V
IH