83023I Data Sheet
©2015 Integrated Device Technology, Inc December 14, 20153
TABLE 3A. POWER SUPPLY DC CHARACTERISTICS, V
DD
= 3.3V±0.3V, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
DD
Positive Supply Voltage 3.0 3.3 3.6 V
I
DD
Positive Supply Current 20 mA
TABLE 3B. LVCMOS / LVTTL DC CHARACTERISTICS, V
DD
= 3.3V±0.3V, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
OH
Output High Voltage; NOTE 1 2.6 V
V
OL
Output Low Voltage; NOTE 1 0.5 V
NOTE 1: Outputs terminated with 50Ω to V
DD
/2. See Parameter Measurement Section, 3.3V Output Load Test Circuit.
TABLE 3C. DIFFERENTIAL DC CHARACTERISTICS, V
DD
= 3.3V±0.3V, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
I
IH
Input High Current
nCLK0, nCLK1 V
IN
= V
DD
= 3.6V 5 µA
CLK0, CLK1 V
IN
= V
DD
= 3.6V 150 µA
I
IL
Input Low Current
nCLK0, nCLK1 V
IN
= 0V, V
DD
= 3.6V -150 µA
CLK0, CLK1 V
IN
= 0V, V
DD
= 3.6V -5 µA
V
PP
Peak-to-Peak Input Voltage 0.15 1.3 V
V
CMR
Common Mode Input Voltage;
NOTE 1, 2
GND + 0.5 V
DD
- 0.85 V
NOTE 1: For single-ended applications, the maximum input voltage for CLKx, nCLKx is V
DD
+ 0.3V.
NOTE 2: Common mode voltage is defi ned as V
IH
.
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V
DD
4.6V
Inputs, V
I
-0.5V to V
DD
+ 0.5 V
Outputs, V
O
-0.5V to V
DD
+ 0.5V
Package Thermal Impedance, θ
JA
112.7°C/W (0 lfpm)
Storage Temperature, T
STG
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifi cations only. Functional
operation of product at these conditions or any conditions
beyond those listed in the DC Characteristics or AC Charac-
teristics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
