KLI−2104
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13
Figure 18. Typical KLI−2104 Dark Noise vs. CCD Clock Frequency
f
CCD
1
Noise (e
)
10
Typical KLI−2104 Dark Noise vs. CCD Clock Frequency
10
100
1,000
BLUE Noise (e
)
GREEN Noise (e
)
RED Noise (e
)
EO Noise (e
)
Figure 19. Typical KLI−2104 Dark Noise vs. CCD Clock Frequency
f
CCD
1
Noise (e
)
0
Typical KLI−2104 Dark Noise vs. CCD Clock Frequency
BLUE Noise (e
)
GREEN Noise (e
)
RED Noise (e
)
EO Noise (e
)
23 45 67 8
50
100
150
200
250
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Figure 20. Noise vs. Temperature
Temperature (5C)
0
Noise (e
)
10
Typical KLI−2104 Noise vs. Temperature
(1 MHz)
Chroma Average
Luma Average
100
10 20 30 40 50 60 70
Figure 21. Dark Voltage vs. Temperature
Temperature (5C)
35
Dark Voltage (V)
0.001
Typical KLI−2104 Dark Voltage vs. Temperature
(1 MHz/t
INT
= 2.2 ms)
Blue
Green
Red
E/O
40 45 50 55 60 65
0.01
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OPERATION
Table 5. ABSOLUTE MAXIMUM RATINGS
Description Symbol Minimum Maximum Units Notes
Gate Pin Voltage V
GATE
0 16 V 1, 2
Pin-to-Pin Voltage V
PIN−PIN
16 V 1, 3
Diode Pin Voltages V
DIODE
−0.5 16 V 1, 4
Output Bias Current I
DD
−10 −1 mA 5
Output Load Capacitance C
VID,LOAD
10 pF 9
CCD Clocking Frequency f
CLK
20 MHz 6
Operating Temperature T
OP
0 70 °C 7
Storage Temperature T
ST
−25 80 °C 8
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Referenced to substrate voltage.
2. Includes pins: H1n, H2n, TGx, fRx, OGx, IGx.
3. Voltage difference (either polarity) between any two pins.
4. Includes pins: VIDn, VSSn, RDx, VDDx, LS and IDx.
5. Care must be taken not to short output pins to ground during operation as this may cause permanent damage to the output structures.
6. Charge transfer efficiency will degrade at frequencies higher than the maximum clocking frequency. VIDn load resistor values may need to
be decreased as well.
7. Noise performance will degrade with increasing temperatures.
8. Long term storage at the maximum temperature will accelerate color filter degradation.
9. Exceeding the upper limit on output load capacitance will greatly reduce the output frequency response. Thus, direct probing of the output
pins with conventional oscilloscope probes is not recommended.
10.The absolute maximum ratings for the entire table indicate the limits of this device beyond which damage may occur. The Operating ratings
indicate the conditions that the device is functional. Operating at or near these ratings do not guarantee specific performance limits.
Guaranteed specifications and test conditions are contained in the Imaging Performance section.
Device Input ESD Protection Circuit (Schematic)
Figure 22. ESD Protection Circuit
To Device
Function
I/O Pin
V
t
= ~20 V
CAUTION: To allow for maximum performance, this device was designed with limited input protection; thus, it is sensitive to electrostatic
induced damage. These devices should be installed in accordance with strict ESD handling procedures!

KLI-2104-DAA-ED-AA

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
Image Sensors LINEAR CCD IMAGE SENSOR
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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