KLI−2104
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7
Table 4. SPECIFICATIONS (continued)
Description
Verification
Plan
15
NotesUnitsMax.Nom.Min.Symbol
Brightfield Defect, Dark or
Bright
Bfld Def − − 0 Allowed 13 Die
Smear, Photodiode to CCD
Crosstalk
Blue Channel @ 450 nm
Green Channel @ 550 nm
Red Channel @ 650 nm
Smear,
Chroma
−
−
−
0.2
0.05
0.4
−
−
−
% Design
Smear
Luma channel @ 550 nm
Smear, Luma
− 1.2 −
% Design
Linearity, Maximum from Best
Fit Straight Line
Blue Channel
Green Channel
Red Channel
Luma Channel
Linearity,
Chroma
Linearity, Luma
−
−
−
−
0.6
1.2
1
1
−
−
−
−
% Design
DC Amplifier Gain Gain, DC − 0.75 − Design
Amplifier Output Resistance R
OUT
− 220 −
W
Design
Output Buffer Bandwidth f
−3dB
− 72 − MHz Design
1. Calculated under a flat field illumination. Defined as the maximum output level achievable before linearity or PRNU performance is degraded
beyond specification.
2. With color filter. Values specified at filter peaks. 50% bandwidth = ±30 nm. Color filter arrays become transparent after 710 nm. It is
recommended that a suitable IR cut filter be used to maintain spectral balance and optimal MTF. See quantum efficiency plots in Figure 7.
3. This device utilizes 2-phase clocking for cancellation of driver displacement currents. Symmetry between f1 and f2 phases must be
maintained to minimize clock noise.
4. Dark current doubles approximately every +7°C.
5. Measured per transfer, 2 phases per pixel. For the typical total line (Chroma): (0.99999)
4256
= 0.9583. For the typical total line (Luma):
(0.99999)
4256
= 0.9583. It should be noted that this parameter degrades with increasing horizontal clock frequency.
6. Low frequency response is measured across the entire array with a 1,000 pixel-moving window and a 5 pixel median filter evaluated under
a flat field illumination.
7. Medium frequency response is measured across the entire array with a 50 pixel-moving window and a 5 pixel median filter evaluated under
a flat field illumination.
8. High frequency response non-uniformity represents individual pixel defects evaluated under a flat field illumination. An individual pixel value
may deviate above or below the average response for the entire array by a certain threshold.
9. Increasing the current load (nominally 6 mA) to improve signal bandwidth will decrease these parameters.
10.If resistive loads are used to set current, the amplifier gain will be reduced, thereby reducing the output sensitivity and net responsivity.
11. Where defective pixels are allowed, they will be separated by at least one non-defective pixel within and across channels.
12.Pixels whose response is greater than the average response by the specified threshold, (16 mV). See Figure 6.
13.Pixels, whose response is greater or less than the average response by the specified threshold, contained in the high frequency PRNU
specification for that channel. See Figure 6.
14.Absolute difference between the maximum and minimum average signal level for an entire video channel.
15.A “die” parameter is measured on every sensor during production testing. A “design” parameter is quantified during design verification and
not guaranteed by specification.
Figure 6. Defective Pixel Classification
Exposure
Signal Out
Average
Pixel
Note 13 Bright
Field Dark Pixel
Field Bright Pixel
Note 12: Dark
Field Bright
Pixel
