DRAM Operating Conditions
Recommended AC operating conditions are given in the DDR2 component data sheets.
Component specifications are available on Micron's Web site. Module speed grades cor-
relate with component speed grades.
Table 10: Module and Component Speed Grades
DDR2 components may exceed the listed module speed grades; module may not be available in all listed speed grades
Module Speed Grade Component Speed Grade
-1GA -187E
-80E -25E
-800 -25
-667 -3
-53E -37E
-40E -5E
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully de-
signed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level. Mi-
cron encourages designers to simulate the signal characteristics of the system's memo-
ry bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the DRAM, not at the edge connector of the module.
Designers must account for any system voltage drops at anticipated power levels to en-
sure the required supply voltage is maintained.
512MB, 1GB, 2GB, 4GB (x72, DR) 240-Pin DDR2 SDRAM UDIMM
DRAM Operating Conditions
PDF: 09005aef80e8ad4d
htf18c64_128_256_512x72ay – Rev. I 3/10 EN
10
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2003 Micron Technology, Inc. All rights reserved.
I
DD
Specifications
Table 11: DDR2 I
DD
Specifications and Conditions – 512MB
Values shown for MT47H32M8 DDR2 SDRAM only and are computed from values specified in the 256Mb (32 Meg x 8)
component data sheet
Parameter Symbol -667 -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC
(I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data bus inputs are switching
I
DD0
1
855 765 720 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL = 4, CL
= CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus in-
puts are switching; Data pattern is same as I
DD4W
I
DD1
1
945 855 810 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
LOW; Other control and address bus inputs are stable; Data bus inputs are float-
ing
I
DD2P
2
90 90 90 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE
is HIGH, S# is HIGH; Other control and address bus inputs are stable; Data bus
inputs are floating
I
DD2Q
2
720 630 450 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching; Data bus
inputs are switching
I
DD2N
2
720 630 540 mA
Active power-down current: All device banks open;
t
CK =
t
CK (I
DD
); CKE is LOW; Other control and address bus inputs are
stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P
2
540 450 360 mA
Slow PDN exit
MR[12] = 1
108 108 108
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS
MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Other control and address bus inputs are switching; Data bus inputs are switching
I
DD3N
2
900 720 540 mA
Operating burst write current: All device banks open; Continuous burst
writes; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs
are switching; Data bus inputs are switching
I
DD4W
1
1755 1485 1170 mA
Operating burst read current: All device banks open; Continuous burst read,
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus
inputs are switching; Data bus inputs are switching
I
DD4R
1
1665 1395 1080 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC (I
DD
)
interval; CKE is HIGH, S# is HIGH between valid commands; Other control and
address bus inputs are switching; Data bus inputs are switching
I
DD5
2
3240 3060 2970 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and ad-
dress bus inputs are floating; Data bus inputs are floating
I
DD6
2
90 90 90 mA
512MB, 1GB, 2GB, 4GB (x72, DR) 240-Pin DDR2 SDRAM UDIMM
I
DD
Specifications
PDF: 09005aef80e8ad4d
htf18c64_128_256_512x72ay – Rev. I 3/10 EN
11
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2003 Micron Technology, Inc. All rights reserved.
Table 11: DDR2 I
DD
Specifications and Conditions – 512MB (Continued)
Values shown for MT47H32M8 DDR2 SDRAM only and are computed from values specified in the 256Mb (32 Meg x 8)
component data sheet
Parameter Symbol -667 -53E -40E Units
Operating bank interleave read current: All device banks interleaving
reads; I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK =
t
CK
(I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is
HIGH between valid commands; Address bus inputs are stable during deselects;
Data bus inputs are switching
I
DD7
1
2295 2205 2115 mA
Notes:
1. Value calculated as one module rank in this operating condition; all other module ranks
in I
DD2P
(CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
512MB, 1GB, 2GB, 4GB (x72, DR) 240-Pin DDR2 SDRAM UDIMM
I
DD
Specifications
PDF: 09005aef80e8ad4d
htf18c64_128_256_512x72ay – Rev. I 3/10 EN
12
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2003 Micron Technology, Inc. All rights reserved.

MT18HTF25672AY-667A3

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR2 SDRAM 2GB 240UDIMM
Lifecycle:
New from this manufacturer.
Delivery:
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