Table 15: DDR2 I
DD
Specifications and Conditions – 4GB
Values shown for MT47H256M8 DDR2 SDRAM only and are computed from values specified in the 2Gb (256 Meg x 8) com-
ponent data sheet
Parameter Symbol
-80E/
-800 -667 -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are switching; Data bus inputs are switching
I
DD0
1
1125 990 900 900 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL =
4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN
(I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data pattern is same as I
DD4W
I
DD1
1
1575 1395 1035 1035 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
);
CKE is LOW; Other control and address bus inputs are stable; Data bus in-
puts are floating
I
DD2P
2
180 180 180 180 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
);
CKE is HIGH, S# is HIGH; Other control and address bus inputs are stable;
Data bus inputs are floating
I
DD2Q
2
1170 990 810 720 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching; Da-
ta bus inputs are switching
I
DD2N
2
1260 1080 900 810 mA
Active power-down current: All device banks open;
t
CK
=
t
CK (I
DD
); CKE is LOW; Other control and address bus in-
puts are stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P
2
810 720 630 540 mA
Slow PDN exit
MR[12] = 1
252 252 252 252
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid com-
mands; Other control and address bus inputs are switching; Data bus
inputs are switching
I
DD3N
2
1170 990 810 720 mA
Operating burst write current: All device banks open; Continuous
burst writes; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX
(I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data bus inputs are switching
I
DD4W
1
1710 1440 1260 1215 mA
Operating burst read current: All device banks open; Continuous burst
read, I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS
MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid com-
mands; Address bus inputs are switching; Data bus inputs are switching
I
DD4R
1
1800 1620 1440 1350 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC
(I
DD
) interval; CKE is HIGH, S# is HIGH between valid commands; Other con-
trol and address bus inputs are switching; Data bus inputs are switching
I
DD5
2
5400 5040 4680 4500 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
I
DD6
2
180 180 180 180 mA
512MB, 1GB, 2GB, 4GB (x72, DR) 240-Pin DDR2 SDRAM UDIMM
I
DD
Specifications
PDF: 09005aef80e8ad4d
htf18c64_128_256_512x72ay – Rev. I 3/10 EN
19
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2003 Micron Technology, Inc. All rights reserved.
Table 15: DDR2 I
DD
Specifications and Conditions – 4GB (Continued)
Values shown for MT47H256M8 DDR2 SDRAM only and are computed from values specified in the 2Gb (256 Meg x 8) com-
ponent data sheet
Parameter Symbol
-80E/
-800 -667 -53E -40E Units
Operating bank interleave read current: All device banks interleaving
reads; I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK
=
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are stable
during deselects; Data bus inputs are switching
I
DD7
1
3600 3150 2745 2745 mA
Notes:
1. Value calculated as one module rank in this operating condition; all other module ranks
in I
DD2P
(CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
512MB, 1GB, 2GB, 4GB (x72, DR) 240-Pin DDR2 SDRAM UDIMM
I
DD
Specifications
PDF: 09005aef80e8ad4d
htf18c64_128_256_512x72ay – Rev. I 3/10 EN
20
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2003 Micron Technology, Inc. All rights reserved.
Serial Presence-Detect
For the latest SPD data, refer to Micron's SPD page: www.micron.com/SPD.
Table 16: SPD EEPROM Operating Conditions
Parameter/Condition Symbol Min Max Units
Supply voltage V
DDSPD
1.7 3.6 V
Input high voltage: logic 1; All inputs V
IH
V
DDSPD
× 0.7 V
DDSPD
+ 0.5 V
Input low voltage: logic 0; All inputs V
IL
–0.6 V
DDSPD
× 0.3 V
Output low voltage: I
OUT
= 3mA V
OL
0.4 V
Input leakage current: V
IN
= GND to V
DD
I
LI
0.1 3 µA
Output leakage current: V
OUT
= GND to V
DD
I
LO
0.05 3 µA
Standby current I
SB
1.6 4 µA
Power supply current, READ: SCL clock frequency = 100 kHz I
CCR
0.4 1 mA
Power supply current, WRITE: SCL clock frequency = 100 kHz I
CCW
2 3 mA
Table 17: SPD EEPROM AC Operating Conditions
Parameter/Condition Symbol Min Max Units Notes
SCL LOW to SDA data-out valid
t
AA 0.2 0.9 µs 1
Time bus must be free before a new transition can start
t
BUF 1.3
µs
Data-out hold time
t
DH 200
ns
SDA and SCL fall time
t
F
300 ns 2
SDA and SCL rise time
t
R
300 ns 2
Data-in hold time
t
HD:DAT 0
µs
Start condition hold time
t
HD:STA 0.6
µs
Clock HIGH period
t
HIGH 0.6
µs
Noise suppression time constant at SCL, SDA inputs
t
I
50 µs
Clock LOW period
t
LOW 1.3
µs
SCL clock frequency
t
SCL
400 kHz
Data-in setup time
t
SU:DAT 100
ns
Start condition setup time
t
SU:STA 0.6
µs 3
Stop condition setup time
t
SU:STO 0.6
µs
WRITE cycle time
t
WRC
10 ms 4
Notes:
1. To avoid spurious start and stop conditions, a minimum delay is placed between SCL = 1
and the falling or rising edge of SDA.
2. This parameter is sampled.
3. For a restart condition or following a WRITE cycle.
4. The SPD EEPROM WRITE cycle time (
t
WRC) is the time from a valid stop condition of a
write sequence to the end of the EEPROM internal ERASE/PROGRAM cycle. During the
WRITE cycle, the EEPROM bus interface circuit is disabled, SDA remains HIGH due to pull-
up resistance, and the EEPROM does not respond to its slave address.
512MB, 1GB, 2GB, 4GB (x72, DR) 240-Pin DDR2 SDRAM UDIMM
Serial Presence-Detect
PDF: 09005aef80e8ad4d
htf18c64_128_256_512x72ay – Rev. I 3/10 EN
21
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2003 Micron Technology, Inc. All rights reserved.

MT18HTF25672AY-667A3

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR2 SDRAM 2GB 240UDIMM
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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