7
ATF1502AS(L)
0995J–PLD–09/02
All pin transitions are ignored until the PD pin is brought low. When the power-down feature is
enabled, the PD1 or PD2 pin cannot be used as a logic input or output. However, the pin’s
macrocell may still be used to generate buried foldback and cascade logic signals.
All power-down AC characteristic parameters are computed from external input or I/O pins,
with reduced-power bit turned on. For macrocells in reduced-power mode (reduced-power bit
turned on), the reduced-power adder, t
RPA
, must be added to the AC parameters, which
include the data paths t
LAD
,t
LAC
,t
IC
,t
ACL
,t
ACH
and t
SEXP
.
The ATF1502AS macrocell also has an option whereby the power can be reduced on a per-
macrocell basis. By enabling this power-down option, macrocells that are not used in an appli-
cation can be turned down, thereby reducing the overall power consumption of the device.
Each output also has individual slew rate control. This may be used to reduce system noise by
slowing down outputs that do not need to operate at maximum speed. Outputs default to slow
switching, and may be specified as fast switching in the design file.
Design
Software
Support
ATF1502AS designs are supported by several third-party tools. Automated fitters allow logic
synthesis using a variety of high-level description languages and formats.
Power-up Reset The ATF1502AS is designed with a power-up reset, a feature critical for state machine initial-
ization. At a point delayed slightly from V
CC
crossing V
RST
, all registers will be initialized, and
the state of each output will depend on the polarity of its buffer. However, due to the asynchro-
nous nature of reset and uncertainty of how V
CC
actually rises in the system, the following
conditions are required:
1. The V
CC
rise must be monotonic,
2. After reset occurs, all input and feedback setup times must be met before driving the
clock pin high, and,
3. The clock must remain stable during T
D
.
The ATF1502AS has two options for the hysteresis about the reset level, V
RST
, Small and
Large. During the fitting process users may configure the device with the Power-up Reset hys-
teresis set to Large or Small. Atmel POF2JED users may select the Large option by including
the flag “-power_reset” on the command line after “filename.POF”. To allow the registers to be
properly reinitialized with the Large hysteresis option selected, the following condition is
added:
4. If V
CC
falls below 2.0V, it must shut off completely before the device is turned on again.
When the Large hysteresis option is active, I
CC
is reduced by several hundred microamps as
well.
Security Fuse
Usage
A single fuse is provided to prevent unauthorized copying of the ATF1502AS fuse patterns.
Once programmed, fuse verify is inhibited. However, the 16-bit User Signature remains
accessible.
Programming ATF1502AS devices are in-system programmable (ISP) devices utilizing the 4-pin JTAG pro-
tocol. This capability eliminates package handling normally required for programming and
facilitates rapid design iterations and field changes.
8
ATF1502AS(L)
0995J–PLD–09/02
Atmel provides ISP hardware and software to allow programming of the ATF1502AS via the
PC. ISP is performed by using either a download cable, a comparable board tester or a simple
microprocessor interface.
When using the ISP hardware or software to program the ATF1502AS devices, four I/O pins
must be reserved for the JTAG interface. However, the logic features that the macrocells have
associated with these I/O pins are still available to the design for burned logic functions.
To facilitate ISP programming by the Automated Test Equipment (ATE) vendors, Serial Vector
Format (SVF) files can be created by Atmel-provided software utilities.
ATF1502AS devices can also be programmed using standard third-party programmers. With a
third-party programmer, the JTAG ISP port can be disabled, thereby allowing four additional
I/Opinstobeusedforlogic.
Contact your local Atmel representatives or Atmel PLD applications for details.
ISP
Programming
Protection
The ATF1502AS has a special feature that locks the device and prevents the inputs and I/O
from driving if the programming process is interrupted for any reason. The inputs and I/O
default to high-Z state during such a condition. In addition, the pin-keeper option preserves the
previous state of the input and I/O PMS during programming.
All ATF1502AS devices are initially shipped in the erased state, thereby making them ready to
use for ISP.
Note: For more information refer to the “Designing for In-System Programmability with Atmel CPLDs”
application note.
JTAG-BST/ISP
Overview
The JTAG boundary-scan testing is controlled by the Test Access Port (TAP) controller in the
ATF1502AS. The boundary-scan technique involves the inclusion of a shift-register stage
(contained in a boundary-scan cell) adjacent to each component so that signals at component
boundaries can be controlled and observed using scan testing methods. Each input pin and
I/O pin has its own boundary-scan cell (BSC) to support boundary-scan testing. The
ATF1502AS does not include a Test Reset (TRST) input pin because the TAP controller is
automatically reset at power-up. The five JTAG modes supported include:
SAMPLE/PRELOAD, EXTEST, BYPASS, IDCODE and HIGHZ. The ATF1502AS’s ISP can
be fully described using JTAG’s BSDL as described in IEEE Standard 1149.1b. This allows
ATF1502AS programming to be described and implemented using any one of the third-party
development tools supporting this standard.
The ATF1502AS has the option of using four JTAG-standard I/O pins for boundary-scan test-
ing (BST) and in-system programming (ISP) purposes. The ATF1502AS is programmable
through the four JTAG pins using the IEEE standard JTAG programming protocol established
by IEEE Standard 1149.1 using 5V TTL-level programming signals from the ISP interface for
in-system programming. The JTAG feature is a programmable option. If JTAG (BST or ISP) is
not needed, then the four JTAG control pins are available as I/O pins.
9
ATF1502AS(L)
0995J–PLD–09/02
JTAG
Boundary-scan
Cell (BSC)
Testing
The ATF1502AS contains up to 32 I/O pins and four input pins, depending on the device type
and package type selected. Each input pin and I/O pin has its own boundary-scan cell (BSC)
in order to support boundary-scan testing as described in detail by IEEE Standard 1149.1. A
typical BSC consists of three capture registers or scan registers and up to two update regis-
ters. There are two types of BSCs, one for input or I/O pin, and one for the macrocells. The
BSCs in the device are chained together through the capture registers. Input to the capture
register chain is fed in from the TDI pin while the output is directed to the TDO pin. Capture
registers are used to capture active device data signals, to shift data in and out of the device
and to load data into the update registers. Control signals are generated internally by the
JTAG TAP controller. The BSC configuration for the input and I/O pins and macrocells is
shown below.
BSC
Configuration
for Input and I/O
Pins (Except
JTAG TAP Pins)
Note: 1. The ATF1502AS has a pull-up option on TMS and TDI pins. This feature is selected as a
design option.
BSC
Configuration
for Macrocell
0
1
0
1
DQ
DQ
Capture
DR
Update
DR
0
1
0
1
DQ
DQ
TDI
OUTJ
OEJ
Shift
Clock
Mode
TDO
BSC for I/O Pins and Macrocells
0
1
D
Q
TDI
CLOCK
TDO
Pin

ATF1502ASL-25AI44

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IC CPLD 32MC 25NS 44TQFP
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