AD7298
Rev. B | Page 12 of 24
TERMINOLOGY
Signal-to-Noise and Distortion Ratio (SINAD)
The measured ratio of signal-to-noise and distortion at the
output of the ADC. The signal is the rms amplitude of the
fundamental. Noise is the sum of all nonfundamental signals
up to half the sampling frequency (f
S
/2), excluding dc. The
ratio is dependent on the number of quantization levels in the
digitization process; the more levels, the smaller the quantization
noise. The theoretical signal-to-noise and distortion ratio for
an ideal N-bit converter with a sine wave input is given by
Signal-to-(Noise + Distortion) = (6.02 N + 1.76) dB
Thus, the SINAD is 74 dB for an ideal 12-bit converter.
Total Harmonic Distortion (THD)
The ratio of the rms sum of harmonics to the fundamental. For
the AD7298, it is defined as
1
2
6
2
5
2
4
2
3
2
2
log20)dB(
V
VVVVV
THD
++++
=
where V
1
is the rms amplitude of the fundamental, and V
2
, V
3
,
V
4
, V
5
, and V
6
are the rms amplitudes of the second through
sixth harmonics.
Peak Harmonic or Spurious Noise
The ratio of the rms value of the next largest component in the
ADC output spectrum (up to f
S
/2 and excluding dc) to the rms
value of the fundamental. Typically, the value of this specification
is determined by the largest harmonic in the spectrum, but for
ADCs where the harmonics are buried in the noise floor, it is a
noise peak.
Integral Nonlinearity
The maximum deviation from a straight line passing through
the endpoints of the ADC transfer function. The endpoints are
zero scale, a point 1 LSB below the first code transition, and full
scale, a point 1 LSB above the last code transition.
Differential Nonlinearity
The difference between the measured and the ideal 1 LSB
change between any two adjacent codes in the ADC.
Offset Error
The deviation of the first code transition (00…000) to
(00…001) from the ideal—that is, GND1 + 1 LSB.
Offset Error Match
The difference in offset error between any two channels.
Gain Error
The deviation of the last code transition (111…110) to
(111…111) from the ideal (that is, REF
IN
− 1 LSB) after the
offset error has been adjusted out.
Gain Error Matching
The difference in gain error between any two channels.
Track-and-Hold Acquisition Time
The track-and-hold amplifier returns to track mode at the end
of conversion. Track-and-hold acquisition time is the time
required for the output of the track-and-hold amplifier to reach
its final value, within ±1 LSB, after the end of conversion.
Power Supply Rejection Ratio (PSRR)
PSRR is defined as the ratio of the power in the ADC output at
full-scale frequency, f, to the power of a 100 mV p-p sine wave
applied to the ADC V
DD
supply of frequency, f
S
. The frequency
of the input varies from 5 kHz to 25 MHz.
PSRR (dB) = 10 log(Pf/Pf
S
)
where:
Pf is the power at frequency, f, in the ADC output.
Pf
S
is the power at frequency, f
S
, in the ADC output.
AD7298
Rev. B | Page 13 of 24
CIRCUIT INFORMATION
The AD7298 is a high speed, 8-channel, 12-bit ADC with an
internal temperature sensor. The part can be operated from
a 2.8 V to 3.6 V supply and is capable of throughput rates of
1 MSPS per analog input channel.
The AD7298 provides the user with an on-chip, track-and-hold
ADC and a serial interface housed in a 20-lead LFCSP. The
AD7298 has eight single-ended input channels with channel
repeat functionality, which allows the user to select a channel
sequence through which the ADC can cycle with each conse-
cutive
CS
falling edge. The serial clock input accesses data from
the part, controls the transfer of data written to the ADC, and
provides the clock source for the successive approximation
ADC. The analog input range for the AD7928 is 0 V to V
REF
.
The AD7298 operates with one cycle latency, which means that
the conversion result is available in the serial transfer following
the cycle in which the conversion is performed.
The AD7298 includes a high accuracy band gap temperature
sensor, which is monitored and digitized by the 12-bit ADC
to give a resolution of 0.25°C. The AD7298 provides flexible
power management options to allow the user to achieve the best
power performance for a given throughput rate. These options
are selected by programming the partial power-down bit, PPD,
in the control register and using the
PD
/
RST
pin.
CONVERTER OPERATION
The AD7298 is a 12-bit successive approximation ADC based
around a capacitive DAC. Figure 20 and Figure 21 show simplified
schematics of the ADC. The ADC is comprised of control logic,
SAR, and a capacitive DAC that are used to add and subtract
fixed amounts of charge from the sampling capacitor to bring
the comparator back into a balanced condition. Figure 20 shows
the ADC during its acquisition phase. SW2 is closed and SW1 is
in Position A. The comparator is held in a balanced condition
and the sampling capacitor acquires the signal on the selected
V
IN
channel.
CONTROL
LOGIC
CAPACITIVE
DAC
V
IN
A
B
SW1
SW2
GND1
COMPARATOR
08754-004
Figure 20. ADC Acquisition Phase
When the ADC starts a conversion (see Figure 21), SW2
opens and SW1 moves to Position B, causing the comparator
to become unbalanced. The control logic and the capacitive
DAC are used to add and subtract fixed amounts of charge to
bring the comparator back into a balanced condition. When the
comparator is rebalanced, the conversion is complete. The
control logic generates the ADC output code. Figure 23 shows
the ADC’s transfer functions.
CONTROL
LOGIC
CAPACITIVE
DAC
V
IN
A
B
SW1
SW2
GND1
COMPARATOR
08754-005
Figure 21. ADC Conversion Phase
ANALOG INPUT
Figure 22 shows an equivalent circuit of the analog input struc-
ture of the AD7298. The two diodes, D1 and D2, provide ESD
protection for the analog inputs. Care must be taken to ensure
that the analog input signal never exceeds the internally
generated LDO voltage of 2.5 V (D
CAP
) by more than 300 mV.
This causes the diodes to become forward-biased and start
conducting current into the substrate. The maximum current
these diodes can conduct without causing irreversible damage
to the part is 10 mA. Capacitor C1, in Figure 22, is typically
about 8 pF and can primarily be attributed to pin capacitance.
The Resistor R1 is a lumped component made up of the on
resistance of a switch (track-and-hold switch) and also includes
the on resistance of the input multiplexer. The total resistance is
typically about 155 . The capacitor, C2, is the ADC sampling
capacitor and has a capacitance of 34 pF typically.
C1
pF
C2
pF
R1
D2
CONVERSION PHASE: SWITCH OPEN
TRACK PHASE: SWITCH CLOSED
D1
D
CAP
(2.5V)
V
IN
08754-006
Figure 22. Equivalent Analog Input Circuit
For ac applications, removing high frequency components from
the analog input signal is recommended by using an RC low-
pass filter on the relevant analog input pin. In applications
where harmonic distortion and signal-to-noise ratios are
critical, the analog input should be driven from a low impedance
source. Large source impedances significantly affect the ac
performance of the ADC. This may necessitate the use of an
input buffer amplifier. The choice of the op amp is a function
of the particular application performance criteria.
ADC Transfer Function
The output coding of the AD7298 is straight binary for the
analog input channel conversion results and twos complement,
for the temperature conversion result. The designed code
transitions occur at successive LSB values (that is, 1 LSB, 2 LSBs,
and so forth). The LSB size is V
REF
/4096 for the AD7298. The
ideal transfer characteristic for the AD7298 for straight binary
coding is shown in Figure 23.
AD7298
Rev. B | Page 14 of 24
111...111
111...110
111...000
011...111
000...010
000...001
000...000
1LSB = V
REF
/4096
ANALOG INPUT
NOTES
1. V
REF
IS 2.5V.
ADC CODE
+V
REF
–1LSB1LSB
0V
08754-007
Figure 23. Straight Binary Transfer Characteristic
TEMPERATURE SENSOR OPERATION
The AD7298 contains one local temperature sensor. The
on-chip, band gap temperature sensor measures the temp-
erature of the AD7298 die.
The temperature sensor module on the AD7298 is based on
the three-current principle (see Figure 24), where three currents
are passed through a diode and the forward voltage drop is
measured, allowing the temperature to be calculated free of
errors caused by series resistance.
I4 × I
INTERNAL
SENSE
TRANSISTOR
BIAS
DIODE
V
DD
8 × I I
BIAS
V
OUT+
V
OUT
TO ADC
08754-008
Figure 24. Top-Level Structure of Internal Temperature Sensor
The temperature conversion consists of two phases, the integra-
tion followed by the conversion. The integration is initiated on
the
CS
falling edge. It takes a period of approximately 100 s to
complete the integration and conversion of the temperature
result. When the integration is completed, the conversion is
initiated automatically. Once the temperature integration is
initiated, the T
SENSE_
BUSY signal goes high to indicate that a
temperature conversion is in progress and remains high until
the conversion is completed.
Theoretically, the temperature measuring circuit can measure
temperatures from –512°C to +511°C with a resolution of
0.25°C. However, temperatures outside T
A
(the specified
temperature range for the AD7298) are outside the guaranteed
operating temperature range of the device. The temperature
sensor is selected by setting the T
SENSE
bit in the control register.
TEMPERATURE SENSOR AVERAGING
The AD7298 incorporates a temperature sensor averaging
feature to enhance the accuracy of the temperature measure-
ments. To enable the temperature sensor averaging feature, both
the T
SENSE
AVG bit and the T
SENSE
bit must be enabled in the
control register. In this mode the temperature is internally
averaged to reduce the effect of noise on the temperature result.
The temperature is measured each time a T
SENSE
conversion is
performed and a moving average method is used to determine
the result in the T
SENSE
Result Register. The average result is
given by the following equation:
()()
ResultCurrentResultAveragePreviousAVGT
SENSE
_
8
1
__
8
7
+=
The T
SENSE
result read when averaging is enabled is the
T
SENSE
AVG result, a moving average temperature measurement.
The first T
SENSE
conversion result given by the AD7298 after the
temperature sensor and averaging mode has been selected in
the control register (Bit D1 and Bit D5) is the actual first T
SENSE
conversion result. If the control register is written to and the
content of the T
SENSE
AVG bit changed, the averaging function is
reset and the next T
SENSE
average conversion result is the current
temperature conversion result. If the status of the T
SENSE
AVG bit
is not changed on successive writes to the control register, the
averaging function is reinitialized and continues calculating the
cumulative average.
The user has the option of disabling the averaging by setting
Bit T
SENSE
AVG to 0 in the control register. The AD7298 defaults
on power-up with the averaging function disabled. The total
time to measure a temperature channel is typically 100 s.

AD7298BCPZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC 8-Ch 1 MSPS 10B SAR
Lifecycle:
New from this manufacturer.
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