Document Number: 001-48998 Rev. *K Page 17 of 19
*C (cont.) 2737164 VKN /
AESA
07/13/09 Updated Electrical Characteristics:
Updated details in “Test Conditions” column of V
OH
, V
OL
, V
IH
, V
IL
parameters
(Included V
CC
range).
Changed maximum value of V
IL
parameter from 0.8 V to 0.7 V corresponding
to Test Condition “V
CC
= 2.7 V to 3.7 V”.
Changed typical value of I
CC
parameter from 35 mA to 45 mA at f = f
max
corresponding to 55 ns speed bin.
Changed typical value of I
CC
parameter from 28 mA to 35 mA at f = f
max
corresponding to 70 ns speed bin.
Changed typical value of I
CC
parameter from 3.5 mA to 4 mA at f = 1 MHz
corresponding to 55 ns and 70 ns speed bins.
Updated Capacitance:
Changed maximum value of C
IN
parameter from 20 pF to 25 pF.
Changed maximum value of C
OUT
parameter from 20 pF to 35 pF.
Updated Thermal Resistance:
Replaced TBD with values for 48-ball FBGA package.
Updated AC Test Loads and Waveforms:
Updated Table 1:
Included V
CC
range for V
TH
parameter.
Updated Switching Characteristics:
Changed minimum value of t
LZBE
parameter from 5 ns to 10 ns.
Updated Truth Table:
Added Note 30 and referred the same note in “X” in “CE
1
” and “CE
2
” columns.
*D 2765892 VKN 09/18/09 Removed 70 ns speed bin related information in all instances across the
document.
Updated Product Portfolio:
Changed maximum value of “Operating I
CC
” from 6 mA to 9 mA at f = 1 MHz
corresponding to 55 ns speed bin.
Updated Electrical Characteristics:
Changed typical value of I
CC
parameter from 4 mA to 7.5 mA at f = 1 MHz
corresponding to 55 ns speed bin.
Changed maximum value of I
CC
parameter from 6 mA to 9 mA at f = 1 MHz
corresponding to 55 ns speed bin.
*E 3177000 AJU 02/18/2011 Updated Features:
Changed value of “Typical Active Current”
from 4 mA to 7.5 mA.
Updated Pin Configuration:
Fixed typo in Figure 1 (Renamed “48-Ball VFBGA” as “48-ball FBGA”).
Updated Product Portfolio:
Changed typical value of “Operating I
CC
” from 4 mA to 7.5 mA at f = 1 MHz
corresponding to 55 ns speed bin.
Updated Electrical Characteristics:
Updated details in “Test Conditions” column of I
SB2
parameter (Included BHE
and BLE to reflect Byte power down feature).
Updated AC Test Loads and Waveforms:
Updated Table 1.
Updated Data Retention Characteristics:
Updated details in “Test Conditions” column of I
CCDR
parameter (Included BHE
and BLE to reflect Byte power down feature).
Changed minimum value of t
R
parameter from t
RC
to 55 ns.
Added Ordering Code Definitions under Ordering Information.
Updated Package Diagram.
Added Acronyms and Units of Measure.
Changed all instances of IO to I/O.
Updated to new template.
Document History Page (continued)
Document Title: CY62187EV30 MoBL
®
, 64-Mbit (4 M × 16) Static RAM
Document Number: 001-48998
Revision ECN
Orig. of
Change
Submission
Date
Description of Change
