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ATF1502ASV
All pin transitions are ignored until the PD pin is brought low. When the power-down feature is
enabled, the PD1 or PD2 pin cannot be used as a logic input or output. However, the pin’s mac-
rocell may still be used to generate buried foldback and cascade logic signals.
All power-down AC characteristic parameters are computed from external input or I/O pins, with
reduced-power bit turned on. For macrocells in reduced-power mode (reduced-power bit turned
on), the reduced-power adder, t
RPA
, must be added to the AC parameters, which include the
data paths t
LAD
, t
LAC
, t
IC
, t
ACL
, t
ACH
and t
SEXP
.
The ATF1502ASV macrocell also has an option whereby the power can be reduced on a per-
macrocell basis. By enabling this power-down option, macrocells that are not used in an applica-
tion can be turned down, thereby reducing the overall power consumption of the device.
Each output also has individual slew rate control. This may be used to reduce system noise by
slowing down outputs that do not need to operate at maximum speed. Outputs default to slow
switching, and may be specified as fast switching in the design file.
4. Power-up Reset
The ATF1502ASV is designed with a power-up reset, a feature critical for state machine initial-
ization. At a point delayed slightly from V
CC
crossing V
RST
, all registers will be initialized, and the
state of each output will depend on the polarity of its buffer. However, due to the asynchronous
nature of reset and uncertainty of how V
CC
actually rises in the system, the following conditions
are required:
1. The V
CC
rise must be monotonic,
2. After reset occurs, all input and feedback setup times must be met before driving the
clock pin high, and,
3. The clock must remain stable during T
D
.
The ATF1502ASV has two options for the hysteresis about the reset level, V
RST
, Small and
Large. To ensure a robust operating environment in applications where the device is operated
near 3.0V, Atmel recommends that during the fitting process users configure the device with the
Power-up Reset hysteresis set to Large. For conversions, Atmel POF2JED users should include
the flag “-power_reset” on the command line after “filename.POF”. To allow the registers to be
properly reinitialized with the Large hysteresis option selected, the following condition is added:
4. If V
CC
falls below 2.0V, it must shut off completely before the device is turned on again.
When the Large hysteresis option is active, I
CC
is reduced by several hundred microamps as
well.
5. Security Fuse Usage
A single fuse is provided to prevent unauthorized copying of the ATF1502ASV fuse patterns.
Once programmed, fuse verify is inhibited. However, the 16-bit User Signature remains
accessible.
6. Programming
ATF1502ASV devices are in-system programmable (ISP) devices utilizing the 4-pin JTAG proto-
col. This capability eliminates package handling normally required for programming and
facilitates rapid design iterations and field changes.
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ATF1502ASV
Atmel provides ISP hardware and software to allow programming of the ATF1502ASV via the
PC. ISP is performed by using either a download cable, a comparable board tester or a simple
microprocessor interface.
When using the ISP hardware or software to program the ATF1502ASV devices, four I/O pins
must be reserved for the JTAG interface. However, the logic features that the macrocells have
associated with these I/O pins are still available to the design for burned logic functions.
To facilitate ISP programming by the Automated Test Equipment (ATE) vendors. Serial Vector
Format (SVF) files can be created by Atmel-provided software utilities.
ATF1502ASV devices can also be programmed using standard third-party programmers. With a
third-party programmer, the JTAG ISP port can be disabled, thereby allowing four additional I/O
pins to be used for logic.
Contact your local Atmel representatives or Atmel PLD applications for details.
6.1 ISP Programming Protection
The ATF1502ASV has a special feature that locks the device and prevents the inputs and I/O
from driving if the programming process is interrupted for any reason. The inputs and I/O default
to high-Z state during such a condition. In addition, the pin-keeper option preserves the previous
state of the input and I/O PMS during programming.
All ATF1502ASV devices are initially shipped in the erased state, thereby making them ready to
use for ISP.
Note: For more information refer to the “Designing for In-System Programmability with Atmel CPLDs”
application note.
7. JTAG-BST/ISP Overview
The JTAG boundary-scan testing is controlled by the Test Access Port (TAP) controller in the
ATF1502ASV. The boundary-scan technique involves the inclusion of a shift-register stage
(contained in a boundary-scan cell) adjacent to each component so that signals at component
boundaries can be controlled and observed using scan testing methods. Each input pin and I/O
pin has its own boundary-scan cell (BSC) to support boundary-scan testing. The ATF1502ASV
does not include a Test Reset (TRST) input pin because the TAP controller is automatically
reset at power-up. The five JTAG modes supported include: SAMPLE/PRELOAD, EXTEST,
BYPASS, IDCODE and HIGHZ. The ATF1502ASV’s ISP can be fully described using JTAG’s
BSDL as described in IEEE Standard 1149.1b. This allows ATF1502ASV programming to be
described and implemented using any one of the third-party development tools supporting this
standard.
The ATF1502ASV has the option of using four JTAG-standard I/O pins for boundary-scan test-
ing (BST) and in-system programming (ISP) purposes. The ATF1502ASV is programmable
through the four JTAG pins using the IEEE standard JTAG programming protocol established by
IEEE Standard 1149.1 using 5V TTL-level programming signals from the ISP interface for in-
system programming. The JTAG feature is a programmable option. If JTAG (BST or ISP) is not
needed, then the four JTAG control pins are available as I/O pins.
7.1 JTAG Boundary-scan Cell (BSC) Testing
The ATF1502ASV contains up to 32 I/O pins and four input pins, depending on the device type
and package type selected. Each input pin and I/O pin has its own boundary-scan cell (BSC) in
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ATF1502ASV
order to support boundary-scan testing as described in detail by IEEE Standard 1149.1. A typi-
cal BSC consists of three capture registers or scan registers and up to two update registers.
There are two types of BSCs, one for input or I/O pin, and one for the macrocells. The BSCs in
the device are chained together through the capture registers. Input to the capture register chain
is fed in from the TDI pin while the output is directed to the TDO pin. Capture registers are used
to capture active device data signals, to shift data in and out of the device and to load data into
the update registers. Control signals are generated internally by the JTAG TAP controller. The
BSC configuration for the input and I/O pins and macrocells is shown below.
7.2 BSC Configuration for Input and I/O Pins (Except JTAG TAP Pins)
Figure 7-1. BSC Configuration for Input and I/O Pins (Except JTAG TAP Pins)
Note: The ATF1502ASV has a pull-up option on TMS and TDI pins. This feature is selected as a design
option.
Dedicated
Input
To Internal
Logic
TDI
(From Next Register)
SHIFT
CLOCK
Capture
Registers
TDO

ATF1502ASV-20JI44

Mfr. #:
Manufacturer:
Microchip Technology / Atmel
Description:
CPLD - Complex Programmable Logic Devices ASICS
Lifecycle:
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