1 General Description
1.1 Block Diagram
G-cell
Gain
Z+
Z-
Digital Logic
and
Control
MUX
X+
Y+
X-
Y-
C2V
X
OUT
Y
OUT
Z
OUT
g-Select
V
DD
ST
EN
BYP
ClockSelf TestReferences
10 KΩ
10 KΩ
10 KΩ
MUX
D2SAAF
D2SAAF
D2SAAF
a
X
,a
Y
,a
Z
Figure 1. FXLN83xxQ block diagram
General Description
4
Xtrinsic FXLN83xxQ 3-Axis Low-Power Analog-Output Accelerometer, Rev2.0,
7/2014.
Freescale Semiconductor, Inc.
1.2 Pin Descriptions
2
3
5
6
8
1
1
1
4
7
9
10
12
V
DD
ST
BYP
EN
Y
OUT
X
OUT
GND
g-Select
GND
NC
NC
Z
OUT
Figure 2. Pin locations
Table 1. Pin descriptions
Pin Name Description I/O
1 BYP Internal voltage regulator output capacitor connection Output
2 V
DD
Supply voltage Power
3 ST
1
Self-Test
When ST pin is logic high, the accelerometer is put into self-test mode.
When ST pin is logic low, the accelerometer is put into normal operating mode.
Input
4 EN Power enable pin
When the EN pin is logic low, the accelerometer is shut down, minimizing current
consumption.
When the EN pin is logic high, the accelerometer is fully functional.
Input
5 g-Select Full Scale Range selection:
For part numbers FXLN8361QR1 & FXLN8371QR1:
When the g-select pin is logic low, the accelerometer is in ±8 g mode
When the g-select pin is logic high, the accelerometer is in ±2 g mode
For part numbers FXLN8362QR1 & FXLN8372QR1:
When the g-select pin is logic low, the accelerometer is in ±16 g mode
When the g-select pin is logic high, the accelerometer is in ±4 g mode
Input
6 GND Ground Ground
7 GND Ground Ground
8 Z
OUT
Z-axis analog output Output
9 Y
OUT
Y-axis analog output Output
10 X
OUT
X-axis analog output Output
11 NC No internal connection, may be left floating or connected to GND
12 NC No internal connection, may be left floating or connected to GND
EP DNC Center pads should not be soldered, refer to Printed Circuit Board Layout and Device Mounting
General Description
Xtrinsic FXLN83xxQ 3-Axis Low-Power Analog-Output Accelerometer, Rev2.0,
7/2014.
5
Freescale Semiconductor, Inc.
1. The Self-Test function verifies the correct functioning of the sensor and signal path without the need to apply a
mechanical stimulus. When Self-Test is activated, an electrostatic actuation force is applied to the sensor, simulating a
small acceleration.
1.3 Typical Application Circuit
SELF-TEST
ENABLE
RANGE SELECT
XOUT
YOUT
ZOUT
V
DD
C6
C5
BYP
1
NC
11
GND
6
V
DD
2
EN
4
X
OUT
10
Z
OUT
8
NC
12
Y
OUT
9
g-Select
5
ST
3
GND
7
C1
0.1μF
C3
0.1μF
C4
C2
4.7μF
Notes:
1
. Position the decoupling capacitors (C2, C3) as near as
possible to the V
DD
pin (common practice to filter out
undesired noise from the power supply).
2. C1 is required to stabilize the output of the internal
voltage regulator.
3. Connecting the EN pin to the V
DD
pin is not a supported
configuration and may prevent the part from starting up.
Do not set the EN pin high until V
DD
> 1.71 V.
FXLN83xxQ
Part Number Bandwidth C4 (pF) C5 (pF) C6 (pF)
FXLN8361Q Low 9100 9100 9100
FXLN8362Q Lo
w 9100 9100 9100
FXLN8371Q High 8200 3300 3300
FXLN8372Q High 8200 3300 3300
Recommended Minimum Capacitance Specifications
Figure 3. Electrical Connections
General Description
6
Xtrinsic FXLN83xxQ 3-Axis Low-Power Analog-Output Accelerometer, Rev2.0,
7/2014.
Freescale Semiconductor, Inc.

BRKOUT-FXLN8361Q

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Sensor Development Tools Acceleration Sensor Development Tools Breakout board FXLN8361Q
Lifecycle:
New from this manufacturer.
Delivery:
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