MT47H512M8WTR-25E:C TR

TwinDie DDR2 SDRAM
MT47H1G4 – 64 Meg x 4 x 8 Banks x 2 Ranks
MT47H512M8 – 32 Meg x 8 x 8 Banks x 2 Ranks
Features
Uses 2Gb Micron die
Two ranks (includes dual CS#, ODT, and CKE balls)
Each rank has 8 internal banks for concurrent oper-
ation
V
DD
= V
DDQ
= +1.8V ±0.1V
JEDEC-standard 63-ball FBGA
Low-profile package – 1.35mm MAX thickness
Functionality
The 4Gb (TwinDie) DDR2 SDRAM uses Micron’s
2Gb DDR2 monolithic die and has similar functionali-
ty. This TwinDie data sheet is intended to provide a
general description, package dimensions, and the
ballout only. Refer to Micron's 2Gb DDR2 data sheet
for complete information or for specifications not in-
cluded in this document.
Options Marking
Configuration
64 Meg x 4 x 8 banks x 2 ranks 1G4
32 Meg x 8 x 8 banks x 2 ranks 512M8
FBGA package (Pb-free)
63-ball FBGA (9mm x 11.5mm) Rev.
C
WTR
Timing – cycle time
1
2.5ns @ CL = 5 (DDR2-800) -25E
2.5ns @ CL = 6 (DDR2-800) -25
3.0ns @ CL = 5 (DDR2-667) -3
3.75ns @ CL = 4 (DDR2-533) -37E
Self refresh
Standard None
Operating temperature
Commercial (0°C T
C
85°C) None
Revision :C
Note:
1. CL = CAS (READ) latency.
Table 1: Key Timing Parameters
Speed
Grade
Data Rate (MT/s)
t
RCD (ns)
t
RP (ns)
t
RC (ns)
t
RFC (ns)CL = 3 CL = 4 CL = 5 CL = 6
-25E 400 533 800 800 12.5 12.5 55 197.5
-25 400 533 667 800 15 15 55 197.5
-3 400 533 667 n/a 15 15 55 197.5
-37E 400 533 n/a n/a 15 15 55 197.5
Table 2: Addressing
Parameter 1 Gig x 4 512 Meg x 8
Configuration 64 Meg x 4 x 8 banks x 2 ranks 32 Meg x 8 x 8 banks x 2 ranks
Refresh count 8K 8K
Row address A[14:0] (32K) A[14:0] (32K)
Bank address BA[2:0] (8) BA[2:0] (8)
Column address A[11, 9:0] (2K) A[9:0] (1K)
4Gb: x4, x8 TwinDie DDR2 SDRAM
Features
PDF: 09005aef8227ee4d
mt47h1g_64m_32m_twindie.pdf - Rev. I 01/14 EN
1
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2006 Micron Technology, Inc. All rights reserved.
Products and specifications discussed herein are subject to change by Micron without notice.
Ball Assignments and Descriptions
Figure 1: 63-Ball FBGA – x4, x8 Ball Assignments (Top View)
1 2 3 4 6 7 8 95
V
DD
NF, DQ6
V
DDQ
NF, DQ4
V
DDL
BA2
CKE1
V
SS
V
DD
NF, NU/RDQS#
V
SSQ
DQ1
V
SSQ
V
REF
CKE0
BA0
A10
A3
A7
A12
V
SS
DM, RDQS
V
DDQ
DQ3
V
SS
WE#
BA1
A1
A5
A9
A14
V
SSQ
DQS
V
DDQ
DQ2
V
SSDL
RAS#
CAS#
A2
A6
A11
RFU
V
DDQ
NF, DQ7
V
DDQ
NF, DQ5
V
DD
ODT0
CS1#
V
DD
ODT1
V
SS
DQS#/NU
V
SSQ
DQ0
V
SSQ
CK
CK#
CS0#
A0
A4
A8
A13
A
B
C
D
E
F
G
H
J
K
L
Note:
1. Dark balls (with ring) designate balls that differ from the monolithic versions.
4Gb: x4, x8 TwinDie DDR2 SDRAM
Ball Assignments and Descriptions
PDF: 09005aef8227ee4d
mt47h1g_64m_32m_twindie.pdf - Rev. I 01/14 EN
2
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2006 Micron Technology, Inc. All rights reserved.
Table 3: FBGA 63-Ball Descriptions
Symbol Type Description
A[14:0] Input Address inputs: Provide the row address for ACTIVATE commands, and the column ad-
dress and auto precharge bit (A10) for READ/WRITE commands, to select one location out
of the memory array in the respective bank. A10 sampled during a PRECHARGE com-
mand determines whether the PRECHARGE applies to one bank (A10 LOW, bank selected
by BA[2:0]) or all banks (A10 HIGH). The address inputs also provide the op-code during a
LOAD MODE command.
BA[2:0] Input Bank address inputs: BA[2:0] define to which bank an ACTIVATE, READ, WRITE, or PRE-
CHARGE command is being applied. BA[2:0] define which mode register including MR,
EMR, EMR(2), and EMR(3) is loaded during the LOAD MODE command.
CK, CK# Input Clock: CK and CK# are differential clock inputs. All address and control input signals are
sampled on the crossing of the positive edge of CK and negative edge of CK#. Output
data (DQ and DQS/DQS#) is referenced to the crossings of CK and CK#.
CKE[1:0] Input Clock enable: CKE (registered HIGH) activates and CKE (registered LOW) deactivates
clocking circuitry on the DDR2 SDRAM. The specific circuitry that is enabled/disabled is
dependent on the DDR2 SDRAM configuration and operating mode. CKE LOW provides
precharge power-down and SELF REFRESH operations (all banks idle), or ACTIVATE pow-
er-down (row active in any bank). CKE is synchronous for power-down entry, power-
down exit, output disable, and for SELF REFRESH entry. CKE is asynchronous for SELF RE-
FRESH exit. Input buffers (excluding CK, CK#, CKE, and ODT) are disabled during POWER-
DOWN. Input buffers (excluding CKE) are disabled during SELF REFRESH. CKE is an
SSTL_18 input but will detect a LVCMOS LOW level once V
DD
is applied during first pow-
er-up. After V
REF
has become stable during the power-on and initialization sequence, it
must be maintained for proper operation of the CKE receiver. For proper SELF-REFRESH
operation, V
REF
must be maintained.
CS# Input Chip select: CS# enables (registered LOW) and disables (registered HIGH) the command
decoder. All commands are masked when CS# is registered HIGH. CS# provides for exter-
nal bank selection on systems with multiple ranks. CS# is considered part of the com-
mand code.
DM Input Input data mask: DM is an input mask signal for write data. Input data is masked when
DM is sampled HIGH along with that input data during a WRITE access. DM is sampled on
both edges of DQS. Although DM balls are input-only, the DM loading is designed to
match that of DQ and DQS balls.
ODT[1:0] Input On-die termination: ODT (registered HIGH) enables termination resistance internal to
the DDR2 SDRAM. When enabled, ODT is only applied to each of the following balls:
DQ[7:0], DQS, DQS#, and DM. The ODT input will be ignored if disabled via the LOAD
MODE command.
RAS#, CAS#, WE# Input Command inputs: RAS#, CAS#, and WE# (along with CS#) define the command being
entered.
DQ[3:0] I/O Data input/output: Bidirectional data bus for x4 configuration.
DQ[7:0] I/O Data input/output: Bidirectional data bus for x8 configuration.
DQS, DQS# I/O Data strobe: Output with read data, input with write data for source synchronous oper-
ation. Edge-aligned with read data, center-aligned with write data. DQS# is only used
when differential data strobe mode is enabled via the LOAD MODE command.
4Gb: x4, x8 TwinDie DDR2 SDRAM
Ball Assignments and Descriptions
PDF: 09005aef8227ee4d
mt47h1g_64m_32m_twindie.pdf - Rev. I 01/14 EN
3
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2006 Micron Technology, Inc. All rights reserved.

MT47H512M8WTR-25E:C TR

Mfr. #:
Manufacturer:
Micron
Description:
IC DRAM 4G PARALLEL 63FBGA
Lifecycle:
New from this manufacturer.
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