MT47H512M8WTR-25E:C TR

Electrical Specifications – I
CDD
Parameters
Table 7: DDR2 I
DD
Specifications and Conditions (Die Revision C)
Notes: 1–8 apply to the entire table
Parameter/Condition
Com-
bined
Symbol
Individual
Die Status
Bus
Width
-25E/
-25 -3E/-3 Units
Operating one bank active-precharge current:
t
CK =
t
CK
(I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, CS#
is HIGH between valid commands; address bus inputs are
switching; Data bus inputs are switching (inactive die is in
I
DD2P
condition, but with inputs switching)
I
CDD0
I
CDD0
=
I
DD0
+ I
CDD2P
x4, x8 92 87 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC
(I
DD
),
t
RAS =
t
RAS MIN (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH,
CS# is HIGH between valid commands; address bus inputs are
switching; Data pattern is same as I
DD4W
(inactive die is in
I
DD2P
condition, but with inputs switching)
I
CDD1
I
CDD1
=
I
DD1
+ I
CDD2P
x4, x8 107 102 mA
Precharge power-down current: All banks idle;
t
CK =
t
CK
(I
DD
); CKE is LOW; Other control and address bus inputs are
stable; Data bus inputs are floating
I
CDD2P
I
CDD2P
=
I
DD2P
+ I
DD2P
x4, x8 24 24 mA
Precharge quiet standby current: All banks idle;
t
CK =
t
CK
(I
DD
); CKE is HIGH, CS# is HIGH; Other control and address bus
inputs are stable; Data bus inputs are floating
I
CDD2Q
I
CDD2Q
=
I
DD2Q
+ I
DD2P
x4, x8 47 42 mA
Precharge standby current: All banks idle;
t
CK =
t
CK (I
DD
);
CKE is HIGH, CS# is HIGH; Other control and address bus in-
puts are switching; Data bus inputs are switching (inactive
die is in I
DD2P
condition, but with inputs switching)
I
CDD2N
I
CDD2N
=
I
DD2N
+ I
CDD2P
x4, x8 52 47 mA
Active power-down current: All banks open;
t
CK =
t
CK (I
DD
); CKE is LOW; Other control and address bus in-
puts are stable; Data bus inputs are floating (individual die
status: I
CDD3P
= I
DD3P
+ I
DD2P
)
I
CDD3P
Fast PDN exit
MR[12] = 0
x4, x8 42 37 mA
Slow PDN exit
MR[12] = 1
x4, x8 26 26
Active power-down current: All banks open;
t
CK =
t
CK (I
DD
); CKE is LOW; Other control and address bus in-
puts are stable; Data bus inputs are floating (individual die
status: I
CDD3P
= I
DD3P
+ I
DD2P
)
I
CDD3N
I
CDD3N
=
I
DD3N
+ I
CDD2P
x4, x8 62 57 mA
Active standby current: All banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, CS# is
HIGH between valid commands; Other control and address
bus inputs are switching; Data bus inputs are switching (inac-
tive die is in I
DD2P
condition, but with inputs switching)
I
CDD4W
I
CDD4W
=
I
DD4W
+ I
CDD2P
x4, x8 162 142 mA
Operating burst read current: All banks open, continuous
burst reads, Iout = 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH,
CS# is HIGH between valid commands; address bus inputs are
switching; Data bus inputs are switching (inactive die is in
I
DD2P
condition, but with inputs switching)
I
CDD4R
I
CDD4R
=
I
DD4R
+ I
CDD2P
x4, x8 162 142 mA
4Gb: x4, x8 TwinDie DDR2 SDRAM
Electrical Specifications – I
CDD
Parameters
PDF: 09005aef8227ee4d
mt47h1g_64m_32m_twindie.pdf - Rev. I 01/14 EN
10
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2006 Micron Technology, Inc. All rights reserved.
Table 7: DDR2 I
DD
Specifications and Conditions (Die Revision C) (Continued)
Notes: 1–8 apply to the entire table
Parameter/Condition
Com-
bined
Symbol
Individual
Die Status
Bus
Width
-25E/
-25 -3E/-3 Units
Burst refresh current:
t
CK =
t
CK (I
DD
); refresh command at
every
t
RFC(I
DD
) interval; CKE is HIGH, CS# is HIGH between
valid commands; Other control and address bus inputs are
switching; Data bus inputs are switching (inactive die is in
I
DD2P
condition, but with inputs switching)
I
CDD5
I
CDD5
=
I
DD5
+ I
CDD2P
x4, x8 197 177 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other
control and address bus inputs are floating; Data bus inputs
are floating
I
CDD6
I
CDD6
=
I
DD6
+ I
DD6
x4, x8 24 24 mA
Operating bank interleave read current: All bank inter-
leaving reads, Iout = 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD
(I
DD
) - 1 x
t
CK (I
DD
);
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (Idd); CKE is HIGH, CS# is HIGH be-
tween valid commands; address bus inputs are stable during
deselects; Data bus inputs are switching (inactive die is in
I
DD2P
condition, but with inputs switching)
I
CDD7
I
CDD7
=
I
DD7
+ I
CDD2P
x4, x8 262 237 mA
Notes:
1. I
CDD
/I
DD
specifications are tested after the device is properly initialized. 0°C T
C
+85°C.
V
DD
= V
DDQ
= +1.8V ±0.1V; V
DDL
= +1.8V ±0.1V; V
REF
= V
DDQ
/2.
2. I
CDD
/I
DD
parameters are specified with ODT disabled.
3. Data bus consists of DQ, DM, DQS, DQS#, RDQS, and RDQS#. Idd values must be met
with all combinations of EMR bits 10 and 11.
4. I
CDD
/I
DD
values must be met with all combinations of EMR bits 10 and 11.
5. Definitions for I
CDD
/I
DD
conditions:
LOW
V
IN(AC)
V
IL(AC)max
HIGH V
IN
V
IH(AC)min
Stable Inputs stable at a HIGH or LOW level
Floating Inputs at V
REF
= V
DDQ
/2
Switching Inputs changing between HIGH and LOW every other clock cycle (once per
two clocks) for address and control signals
Switching Inputs changing between HIGH and LOW every other data transfer (once
per clock) for DQ signals, not including masks or strobes
6. I
DD1
, I
DD4R
, and I
DD7
require A12 in EMR1 to be enabled during testing.
7. I
CDD
values reflect the combined current of both individual die. I
DDx
represents individual
die values.
8. The following I
DD
values must be derated (I
DD
limits increase) on IT-option or on AT-op-
tion devices when operated outside of the range 0°C T
C
85°C:
When
T
C
0°C
I
DD2P
and I
DD3P(SLOW)
must be derated by 4%; I
DD4R
and I
DD5W
must be derat-
ed by 2%; and I
DD6
and I
DD7
must be derated by 7%
When
T
C
85°C
I
DD0
, I
DD1
, I
DD2N
, I
DD2Q
, I
DD3N
, I
DD3P(FAST)
, I
DD4R
, I
DD4W
, and I
DD5W
must be de-
rated by 2%; I
DD2P
must be derated by 20%; I
DD3P
slow must be derated by
30%; and I
DD6
must be derated by 80% (I
DD6
will increase by this amount if
T
C
< 85°C and the 2X refresh option is still enabled)
4Gb: x4, x8 TwinDie DDR2 SDRAM
Electrical Specifications – I
CDD
Parameters
PDF: 09005aef8227ee4d
mt47h1g_64m_32m_twindie.pdf - Rev. I 01/14 EN
11
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2006 Micron Technology, Inc. All rights reserved.
Package Dimensions
Figure 5: 63-Ball FBGA (9mm x 11.5mm) (WTR)
Ball A1 ID
Seating
plane
0.12
A
A
0.8 ±0.1
1.2 MAX
0.25 MIN
9 ±0.15
Ball A1 ID
8 CTR
Solder ball
material: SAC305.
Dimensions apply
to solder balls
post-reflow on
Ø0.33 NSMD
ball pads.
63X Ø0.45
11.5 ±0.15
0.8 TYP
0.8 TYP
6.4 CTR
9 8 7 3 2 1
A
B
C
D
E
F
G
H
J
K
L
Note:
1. All dimensions are in millimeters.
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
www.micron.com/productsupport Customer Comment Line: 800-932-4992
Micron and the Micron logo are trademarks of Micron Technology, Inc. TwinDie is a trademark of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein.
Although considered final, these specifications are subject to change, as further product development and data characterization some-
times occur.
4Gb: x4, x8 TwinDie DDR2 SDRAM
Package Dimensions
PDF: 09005aef8227ee4d
mt47h1g_64m_32m_twindie.pdf - Rev. I 01/14 EN
12
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2006 Micron Technology, Inc. All rights reserved.

MT47H512M8WTR-25E:C TR

Mfr. #:
Manufacturer:
Micron
Description:
IC DRAM 4G PARALLEL 63FBGA
Lifecycle:
New from this manufacturer.
Delivery:
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Payment:
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