74LVC32A_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 2 — 28 February 2013 6 of 15
NXP Semiconductors
74LVC32A-Q100
Quad 2-input OR gate
10. Dynamic characteristics
[1] Typical values are measured at T
amb
=25C and V
CC
= 1.2 V, 1.8 V, 2.5 V, 2.7 V, and 3.3 V respectively.
[2] t
pd
is the same as t
PLH
and t
PHL
.
[3] Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
[4] C
PD
is used to determine the dynamic power dissipation (P
D
in W).
P
D
=C
PD
V
CC
2
f
i
N+(C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz; f
o
= output frequency in MHz
C
L
= output load capacitance in pF
V
CC
= supply voltage in Volts
N = number of inputs switching
(C
L
V
CC
2
f
o
) = sum of the outputs
Table 7. Dynamic characteristics
Voltages are referenced to GND (ground = 0 V). For test circuit see Figure 7.
Symbol Parameter Conditions 40 C to +85 C 40 C to +125 C Unit
Min Typ
[1]
Max Min Max
t
pd
propagation delay nA, nB to nY; see Figure 6
[2]
V
CC
= 1.2 V - 10 - - - ns
V
CC
= 1.65 V to 1.95 V 0.5 4.2 9.0 0.5 10.4 ns
V
CC
= 2.3 V to 2.7 V 1.5 2.4 4.9 1.05 5.7 ns
V
CC
= 2.7 V 1.5 2.5 4.4 1.5 5.5 ns
V
CC
= 3.0 V to 3.6 V 1.0 2.2 3.8 1.0 5.0 ns
t
sk(o)
output skew time V
CC
= 3.0 V to 3.6 V
[3]
- - 1.0 - 1.5 ns
C
PD
power dissipation
capacitance
per gate; V
I
=GNDtoV
CC
[4]
V
CC
= 1.65 V to 1.95 V - 4.7 - - - pF
V
CC
= 2.3 V to 2.7 V - 8.0 - - - pF
V
CC
= 3.0 V to 3.6 V - 11.0 - - - pF
74LVC32A_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 2 — 28 February 2013 7 of 15
NXP Semiconductors
74LVC32A-Q100
Quad 2-input OR gate
11. AC waveforms
V
M
=1.5VatV
CC
2.7 V
V
M
=0.5 V
CC
at V
CC
<2.7V.
V
OL
and V
OH
are typical output voltage levels that occur
with the output load.
Test data is given in Table 8
. Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe
capacitance.
R
T
= Termination resistance should be equal to output
impedance Z
o
of the pulse generator.
Fig 6. The input nA, nB to output nY propagation
delays
Fig 7. Test circuit for measuring switching times
mna244
t
PHL
t
PLH
V
M
V
M
nA, nB input
nY output
GND
V
I
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aaf615
V
CC
V
I
V
O
DUT
C
L
R
T
R
L
PULSE
GENERATOR
Table 8. Test data
Supply voltage Input Load
V
I
t
r
, t
f
C
L
R
L
1.2 V V
CC
2 ns 30 pF 1 k
1.65 V to 1.95 V V
CC
2 ns 30 pF 1 k
2.3 V to 2.7 V V
CC
2 ns 30 pF 500
2.7V 2.7V 2.5 ns 50 pF 500
3.0Vto3.6V 2.7V 2.5 ns 50 pF 500
74LVC32A_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 2 — 28 February 2013 8 of 15
NXP Semiconductors
74LVC32A-Q100
Quad 2-input OR gate
12. Package outline
Fig 8. Package outline SOT108-1 (SO14)
UNIT
A
max.
A
1
A
2
A
3
b
p
cD
(1)
E
(1)
(1)
eH
E
LL
p
QZywv θ
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC JEITA
mm
inches
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
8.75
8.55
4.0
3.8
1.27
6.2
5.8
0.7
0.6
0.7
0.3
8
0
o
o
0.25 0.1
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
1.0
0.4
SOT108-1
X
w M
θ
A
A
1
A
2
b
p
D
H
E
L
p
Q
detail X
E
Z
e
c
L
v M
A
(A )
3
A
7
8
1
14
y
076E06 MS-012
pin 1 index
0.069
0.010
0.004
0.057
0.049
0.01
0.019
0.014
0.0100
0.0075
0.35
0.34
0.16
0.15
0.05
1.05
0.041
0.244
0.228
0.028
0.024
0.028
0.012
0.01
0.25
0.01 0.004
0.039
0.016
99-12-27
03-02-19
0 2.5 5 mm
scale
SO14: plastic small outline package; 14 leads; body width 3.9 mm
SOT108-1

74LVC32AD-Q100J

Mfr. #:
Manufacturer:
Nexperia
Description:
Logic Gates 74LVC32AD-Q100/SO14/REEL 13" Q
Lifecycle:
New from this manufacturer.
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