MAX1153/MAX1154
Stand-Alone, 10-Channel, 10-Bit System Monitors
with Internal Temperature Sensor and V
DD
Monitor
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TIMING CHARACTERISTICS
(V
DD
= +2.7V to +3.6V (MAX1153), V
DD
= +4.5V to +5.5V (MAX1154), T
A
= T
MIN
to T
MAX
, unless otherwise noted.) (Note 1) (Figures 1,
2, and 4)
Note 1: The devices are 100% tested at T
A
= +25°C and +85°C. Specification over temperature range is guaranteed by design.
Note 2: Relative accuracy is the deviation of the analog value at any code from its theoretical value after the gain and offset errors
have been calibrated.
Note 3: Offset nulled.
Note 4: In reference mode 00, the reference system powers up for each temperature measurement. In reference mode 01, the ref-
erence system powers up once per sequence of channels scanned. If a sample wait <80µs is programmed, the reference
system is on all the time. In reference mode 10, the reference system is on all the time (see Table 7).
Note 5: No external capacitor on REF.
Note 6: The operational input voltage range for each individual input of a differentially configured pair (AIN0–AIN7) is from GND to
V
DD
.
The operational input voltage difference is from -V
REF
/2 to +V
REF
/2.
Note 7: See Figure 3 and the Sampling Error vs. Input Source Impedance graph in the
Typical Operating Characteristics
section.
Note 8: Grade A tested at +10°C and +55°C. -20°C to +85°C and -40°C to +85°C specifications guaranteed by design. Grade B
tested at +25°C. T
MIN
to T
MAX
specification guaranteed by design.
Note 9: External temperature measurement mode using an MMBT3904 (Diodes Inc.) as a sensor. External temperature sensing
from -40°C to +85°C; MAX1153/MAX1154 held at +25°C.
Note 10: Performing eight single-ended external channels’ temperature measurements, an internal temperature measurement, and
an internal V
DD
measurement with no sample wait results in a conversion rate of 2ksps per channel.
Note 11: Performing eight single-ended voltage measurements, an internal temperature measurement, and an internal V
DD
mea-
surement with no sample wait results in a conversion rate of 7ksps per channel.
Note 12: Performing eight single-ended voltage measurements, an internal temperature measurement, and an internal V
DD
mea-
surement with maximum sample wait results in a conversion rate of 3ksps per channel.
Note 13: Defined as the shift in the code boundary as a result of supply voltage change. V
DD
= min to max; full-scale input, mea-
sured using external reference.
