Data Sheet AD5601/AD5611/AD5621
Rev. H | Page 13 of 21
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer func-
tion. See Figure 5 to Figure 7 for plots of typical INL vs. code.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. See Figure 11 to Figure 13 for plots of
typical DNL vs. code.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5601/AD5611/AD5621 because the output of the DAC cannot
go below 0 V. Zero-code error is due to a combination of the
offset errors in the DAC and output amplifier. Zero-code error
is expressed in mV. See Figure 28 for a plot of zero-code error
vs. temperature.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded to the DAC register. Ideally, the output
should be V
DD
− 1 LSB. Full-scale error is expressed in mV. See
Figure 28 for a plot of full-scale error vs. temperature.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percent of the full-scale range.
Tota l Un a dju ste d E rror
Total unadjusted error (TUE) is a measure of the output error,
taking all the various errors into account. See Figure 8 to
Figure 10 for plots of typical TUE vs. code.
Zero-Code Error Drift
Zero-code error drift is a measure of the change in zero-code
error with a change in temperature. It is expressed in μV/°C.
Gain Temperature Coefficient
Gain temperature coefficient is a measure of the change in gain
error with changes in temperature. It is expressed in (ppm of
full-scale range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x2000 to 0x1FFF). See
Figure 19.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated.
It is specified in nV-s and is measured with a full-scale code
change on the data bus—from all 0s to all 1s and vice versa.
AD5601/AD5611/AD5621 Data Sheet
Rev. H | Page 14 of 21
THEORY OF OPERATION
DAC SECTION
The AD5601/AD5611/AD5621 DACs are fabricated on a
CMOS process. The architecture consists of a string DAC
followed by an output buffer amplifier. Figure 39 is a block
diagram of the DAC architecture.
Figure 39. DAC Architecture
Because the input coding to the DAC is straight binary, the ideal
output voltage is given by
n
DD
OUT
D
VV
2
where:
D is the decimal equivalent of the binary code that is loaded to
the DAC register.
n is the bit resolution of the DAC.
RESISTOR STRING
The resistor string structure is shown in Figure 40. It is simply a
string of resistors, each of Value R. The code loaded to the DAC
register determines at which node on the string the voltage is
tapped off to be fed into the output amplifier. The voltage is
tapped off by closing one of the switches connecting the string
to the amplifier. Because it is a string of resistors, it is guaran-
teed monotonic.
Figure 40. Resistor String Structure
OUTPUT AMPLIFIER
The output buffer amplifier is capable of generating rail-to-rail
voltages on its output, giving an output range of 0 V to V
DD
. It is
capable of driving a load of 2 kΩ in parallel with 1000 pF to
GND. The source and sink capabilities of the output amplifier
are shown in Figure 25. The slew rate is 0.5 V/μs, with a half-
scale settling time of 8 μs with the output loaded.
SERIAL INTERFACE
The AD5601/AD5611/AD5621 have a 3-wire serial interface
(
SYNC
, SCLK, and SDIN) that is compatible with SPI, QSPI,
and MICROWIRE interface standards as well as most DSPs. See
Figure 2 for a timing diagram of a typical write sequence.
The write sequence begins by bringing the
SYNC
line low. Data
from the SDIN line is clocked into the 16-bit shift register on
the falling edge of SCLK. The serial clock frequency can be as
high as 30 MHz, making the AD5601/AD5611/AD5621 com-
patible with high speed DSPs. On the 16
th
falling clock edge,
the last data bit is clocked in and the programmed function is
executed (a change in DAC register contents and/or a change
in the mode of operation). At this stage, the
SYNC
line may be
kept low or brought high. In either case, it must be brought high
for a minimum of 20 ns before the next write sequence so that a
falling edge of
SYNC
can initiate the next write sequence.
Because the
SYNC
buffer draws more current when V
IN
= 1.8 V
than it does when V
IN
= 0.8 V,
SYNC
should be idled low
between write sequences for even lower power operation of the
part, as mentioned previously. However, it must be brought
high again just before the next write sequence.
INPUT SHIFT REGISTER
The input shift register is 16 bits wide (see Figure 41). The first
two bits are control bits, which control the operating mode of
the part (normal mode or any one of three power-down
modes). For a complete description of the various modes, see
the Power-Down Modes section. For the AD5621, the next
12 bits are the data bits, which are transferred to the DAC
register on the 16
th
falling edge of SCLK. The information in
the last two bits is ignored by the AD5621. See Figure 42 and
Figure 43 for the AD5611 and AD5601 input shift register map.
SYNC INTERRUPT
In a normal write sequence, the
SYNC
line is kept low for at
least 16 falling edges of SCLK and the DAC is updated on the
16
th
falling edge. However, if
SYNC
is brought high before the
16
th
falling edge, this acts as an interrupt to the write sequence.
The shift register is reset and the write sequence is seen as
invalid. Neither an update of the DAC register contents nor a
change in the operating mode occurs (see Figure 44).
V
DD
V
OU
T
GND
RESISTOR
NETWORK
REF (+)
REF (–)
OUTPUT
AMPLIFIER
DAC REGISTER
0
6853-038
R
R
R
R
R
TO OUTPU
T
AMPLIFIER
06853-039
Data Sheet AD5601/AD5611/AD5621
Rev. H | Page 15 of 21
Figure 41. AD5621 Input Register Contents
Figure 42. AD5611 Input Register Contents
Figure 43. AD5601 Input Register Contents
Figure 44.
SYNC
Interrupt Facility
DB15 (MSB)
PD1 PD0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 X
X
DB0 (LSB)
DATA BITS
POWER-DOWN MODES
0
1
0
1
0
0
1
1
NORMAL OPERATION
1k TO GND
100k TO GND
THREE-STATE
06853-040
DB15 (MSB)
PD1 PD0 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 X X X
X
DB0 (LSB)
DATA BITS
POWER-DOWN MODES
0
1
0
1
0
0
1
1
NORMAL OPERATION
1k TO GND
100k TO GND
THREE-STATE
06853-041
DB15 (MSB)
PD1 PD0 D8 D7 D6 D5 D4 D3 D2 D1 X X X X X
X
DB0 (LSB)
DATA BITS
POWER-DOWN MODES
0
1
0
1
0
0
1
1
NORMAL OPERATION
1k TO GND
100k TO GND
THREE-STATE
06853-042
06853-043
DB15 DB15 DB0DB0
INVALID WRITE SEQUENCE:
SYNC HIGH BEFORE 16
TH
FALLING EDGE
VALID WRITE SEQUENCE, OUTPUT UPDATES
ON THE 16
TH
FALLING EDGE
SYN
C
SCLK
SDIN

AD5621AKSZ-500RL7

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Digital to Analog Converters - DAC SGL 2.7-5.5V 12Bit
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