4©2016 Integrated Device Technology, Inc Revision A March 30, 2016
830154I-08 Data Sheet
Table 4E. LVCMOS DC Characteristics, V
DD
= 3.3V ± 5%, T
A
= -40°C to 85°C
Table 4F. LVCMOS DC Characteristics, V
DD
= 2.5V ± 5%, T
A
= -40°C to 85°C
Table 4G. LVCMOS DC Characteristics, V
DD
= 1.8V ± 0.15V, T
A
= -40°C to 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage 0.65 * V
DD
3.6 V
V
IL
Input Low Voltage -0.3 0.35 * V
DD
V
I
IH
Input High Current
CLK_IN V
DD
= V
IN
= 3.465V 150 µA
OE V
DD
= V
IN
= 3.465V 5 µA
I
IL
Input Low Current
CLK_IN V
DD
= 3.465V, V
IN
= 0V -5 µA
OE V
DD
= 3.465V, V
IN
= 0V -150 µA
V
OH
Output High Voltage Q[4:1] I
OH
= -12mA 2.6 V
V
OL
Output Low Voltage Q[4:1] I
OL
= 12mA 0.5 V
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage 0.65 * V
DD
3.6 V
V
IL
Input Low Voltage -0.3 0.35 * V
DD
V
I
IH
Input High Current
CLK_IN V
DD
= V
IN
= 2.625V 150 µA
OE V
DD
= V
IN
= 2.625V 5 µA
I
IL
Input Low Current
CLK_IN V
DD
= 2.625V, V
IN
= 0V -5 µA
OE V
DD
= 2.625V, V
IN
= 0V -150 µA
V
OH
Output High Voltage Q[4:1]] I
OH
= -12mA 1.8 V
V
OL
Output Low Voltage Q[4:1] I
OL
= 12mA 0.5 V
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage 0.65 * V
DD
3.6 V
V
IL
Input Low Voltage -0.3 0.35 * V
DD
V
I
IH
Input High Current
CLK_IN V
DD
= V
IN
= 1.95V 150 µA
OE A
I
IL
Input Low Current
CLK_IN V
DD
= 1.95V, V
IN
= 0V -5 µA
OE V
DD
= 1.95V, V
IN
= 0V -150 µA
V
OH
Output High Voltage Q[4:1] I
OH
= -6mA V
DD
– 0.45 V
V
OL
Output Low Voltage Q[4:1] I
OL
= 6mA 0.45 V
5©2016 Integrated Device Technology, Inc Revision A March 30, 2016
830154I-08 Data Sheet
Table 4H. LVCMOS DC Characteristics, V
DD
= 1.5V ± 0.1V, T
A
= -40°C to 85°C
AC Electrical Characteristics
Table 5A. AC Characteristics, V
DD
= 3.3V ± 5%, T
A
= -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. Device will meet specifications after thermal equilibrium has
been reached under these conditions.
NOTE: Characterized up to F
OUT
150MHz.
NOTE 1: Measured from the V
DD
/2 of the input to V
DD
/2 of the output.
NOTE 2: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DD
/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature, same frequency and
with equal load conditions. Using the same type of inputs on each device, the outputs are measured at V
DD
/2.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage 0.65 * V
DD
3.6 V
V
IL
Input Low Voltage -0.3 0.35 * V
DD
V
I
IH
Input High Current
CLK_IN V
DD
= V
IN
= 1.6V 150 µA
OE V
DD
= V
IN
= 1.6V 5 µA
I
IL
Input Low Current
CLK_IN V
DD
= 1.6V, V
IN
= 0V -5 µA
OE V
DD
= 1.6V, V
IN
= 0V -150 µA
V
OH
Output High Voltage Q[4:1] I
OH
= -4mA 0.75 * V
DD
V
V
OL
Output Low Voltage Q[4:1] I
OL
= 4mA 0.25 * V
DD
V
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
OUT
Output Frequency 160 MHz
tp
LH
Propagation Delay
(low to high transition); NOTE 1
0.7 1.45 ns
tp
HL
Propagation Delay
(high to low transition); NOTE 1
0.7 1.45 ns
t
PLZ,
t
PHZ
Disable Time
(active to high-impedance)
10 ns
t
PZL,
t
PZH
Enable Time
(high-impedance to disable)
10 ns
tsk(o) Output Skew; NOTE 2, 3 250 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 4 800 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
25MHz, Integration Range:
12kHz - 5MHz
0.094 ps
t
R
/ t
F
Output Rise/Fall Time 10% to 90% 0.35 1.2 ns
odc Output Duty Cycle 48 52 %
6©2016 Integrated Device Technology, Inc Revision A March 30, 2016
830154I-08 Data Sheet
Table 5B. AC Characteristics, V
DD
= 2.5V ± 5%, T
A
= -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. Device will meet specifications after thermal equilibrium has
been reached under these conditions.
NOTE: Characterized up to F
OUT
150MHz.
NOTE 1: Measured from the V
DD
/2 of the input to V
DD
/2 of the output.
NOTE 2: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DD
/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature, same frequency and
with equal load conditions. Using the same type of inputs on each device, the outputs are measured at V
DD
/2.
Table 5C. AC Characteristics, V
DD
= 1.8V ± 0.15V, T
A
= -40°C to 85°C
For NOTES, see Table 5B above.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
OUT
Output Frequency 160 MHz
tp
LH
Propagation Delay
(low to high transition); NOTE 1
0.8 1.7 ns
tp
HL
Propagation Delay
(high to low transition); NOTE 1
0.8 1.7 ns
t
PLZ,
t
PHZ
Disable Time
(active to high-impedance)
10 ns
t
PZL,
t
PZH
Enable Time
(high-impedance to disable)
10 ns
tsk(o) Output Skew; NOTE 2, 3 250 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 4 800 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
25MHz, Integration Range:
12kHz - 5MHz
0.076 ps
t
R
/ t
F
Output Rise/Fall Time 10% to 90% 0.35 1.2 ns
odc Output Duty Cycle 48 52 %
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
OUT
Output Frequency 160 MHz
tp
LH
Propagation Delay
(low to high transition); NOTE 1
1.1 2.1 ns
tp
HL
Propagation Delay
(high to low transition); NOTE 1
1.1 2.1 ns
t
PLZ,
t
PHZ
Disable Time
(active to high-impedance)
10 ns
t
PZL,
t
PZH
Enable Time
(high-impedance to disable)
10 ns
tsk(o) Output Skew; NOTE 2, 3 250 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 4 800 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
25MHz, Integration Range:
12kHz - 5MHz
0.193 ps
t
R
/ t
F
Output Rise/Fall Time 0.63V to 1.17V 0.12 0.6 ns
odc Output Duty Cycle 47 53 %

830154AMI-08LFT

Mfr. #:
Manufacturer:
IDT
Description:
Clock Buffer ICS
Lifecycle:
New from this manufacturer.
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