7©2016 Integrated Device Technology, Inc Revision D March 30, 2016
83948I-147 Data Sheet
Table 5C. AC Characteristics, V
DD
= 3.3V ± 5%, V
DDO
= 2.5V ± 5%, T
A
= -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE 1: Measured from the differential input crossing point to V
DDO
/2 of the output.
NOTE 2: Measured from V
DD
/2 of the input to V
DDO
/2 of the output.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DDO
/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage and with equal load conditions. Using
the same type of input on each device, the output is measured at V
DDO
/2.
NOTE 5: These parameters are guaranteed by characterization. Not tested in production.
NOTE 6: Setup and Hold times are relative to the rising edge of the input clock.
NOTE 7: This parameter is defined in accordance with JEDEC Standard 65.
Parameter Symbol Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency 350 MHz
t
PD
Propagation
Delay
CLK/nCLK; NOTE 1 ƒ 350MHz 2 4 ns
LVCMOS_CLK;
NOTE 2
ƒ 350MHz 2 4 ns
tjit
Buffer Additive Phase Jitter, RMS; refer
to Additive Phase Jitter Section
155.52MHz,
Integration Range:
12kHz – 20MHz
0.14 1 ps
tsk(o) Output Skew; NOTE 3, 7
Measured on the Rising Edge
@ V
DDO
/2
100 ps
tsk(pp) Part-to-Part Skew; NOTE 4, 7
Measured on the Rising Edge
@ V
DDO
/2
1ns
t
R
/ t
F
Output Rise/Fall Time 0.8V to 2V 0.1 1.0 ns
odc Output Duty Cycle ƒ 200MHz, Ref = CLK/nCLK 45 55 %
t
PZL,
t
PZH
Output Enable Time; NOTE 5 5ns
t
PLZ,
t
PHZ
Output Disable Time; NOTE 5 5ns
t
S
Clock Enable
Setup Time;
NOTE 6
CLK_EN to CLK/nCLK 1 ns
CLK_EN to
LVCMOS_CLK
0ns
t
H
Clock Enable
Hold Time;
NOTE 6
CLK/nCLK to CLK_EN 0 ns
LVCMOS_CLK to
CLK_EN
1ns
8©2016 Integrated Device Technology, Inc Revision D March 30, 2016
83948I-147 Data Sheet
Additive Phase Jitter
The spectral purity in a band at a specific offset from the
fundamental compared to the power of the fundamental is called the
dBc Phase Noise. This value is normally expressed using a Phase
noise plot and is most often the specified plot in many applications.
Phase noise is defined as the ratio of the noise power present in a
1Hz band at a specified offset from the fundamental frequency to the
power value of the fundamental. This ratio is expressed in decibels
(dBm) or a ratio of the power in the 1Hz band to the power in the
fundamental. When the required offset is specified, the phase noise
is called a dBc value, which simply means dBm at a specified offset
from the fundamental. By investigating jitter in the frequency
domain, we get a better understanding of its effects on the desired
application over the entire time record of the signal. It is
mathematically possible to calculate an expected bit error rate given
a phase noise plot.
As with most timing specifications, phase noise measurements has
issues relating to the limitations of the equipment. Often the noise
floor of the equipment is higher than the noise floor of the device.
This is illustrated above. The device meets the noise floor of what is
shown, but can actually be lower. The phase noise is dependent on
the input source and measurement equipment.
Additive Phase Jitter, RMS
@ 155.52MHz (12kHz to 20MHz) =
0.14ps (typical)
SSB Phase Noise dBc/Hz
Offset From Carrier Frequency (Hz)
9©2016 Integrated Device Technology, Inc Revision D March 30, 2016
83948I-147 Data Sheet
Parameter Measurement Information
3.3V Core/3.3V LVCMOS Output Load AC Test Circuit
3.3V Core/2.5V LVCMOS Output Load AC Test Circuit
Part-to-Part Skew
2.5V Core/2.5V LVCMOS Output Load AC Test Circuit
Differential Input Level
Output Skew
SCOPE
Qx
GND
V
DD,
1.65V±5%
-1.65V±5%
V
DDO
SCOPE
Qx
GND
V
DD
-1.25V±5%
1.25V±5%
2.05V±5%
V
DDO
tsk(pp)
V
DDO
2
V
DDO
2
Part 1
Part 2
Qx
Qy
SCOPE
Qx
GND
V
DD,
1.25V±5%
-1.25V±5%
V
DDO
V
DD
GND
CLK
nCLK
V
CMR
Cross Points
V
PP
tsk(o)
V
DDO
2
V
DDO
2
Qx
Qy

83948AYI-147LFT

Mfr. #:
Manufacturer:
IDT
Description:
Clock Drivers & Distribution 12 LVCMOS OUT BUFFER
Lifecycle:
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