ADXL1004BCPZ Datasheet ADXL1004BCPZ | P1-P3

Low Noise, Wide Bandwidth,

MEMS Accelerometer

Data Sheet

ADXL1004

Rev. 0 Document Feedback

Information furnished by Analog Devices is believed to be accurate and reliable. However, no

responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other

rights of third parties that may result from its use. Specifications subject to change without notice. No

license is granted by implication or otherwise under any patent or patent rights of Analog Devices.

Trademarks and registered trademarks are the property of their respective owners.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.

Technical Support www.analog.com

FEATURES

Single, in plane axis accelerometer with analog output

Full-scale range: ±500 g

Linear frequency response range: dc to 24 kHz typical

(3 dB point)

Resonant frequency: 45 kHz typical

Ultralow noise density: 125 µg/√Hz

Overrange sensing plus dc coupling allows fast recovery time

Complete electromechanical self test

Sensitivity performance

Sensitivity stability over temperature within 5%

Linearity to ±0.25% of full-scale range

Cross axis sensitivity: ±1.5% (Z-axis acceleration affect on

X-axis; Y-axis acceleration affect on X-axis)

Single-supply operation

Output voltage ratiometric to supply

Low power consumption: 1.0 mA typical

Power saving standby operation mode with fast recovery

RoHS compliant

−40°C to +125°C operating temperature range

32-lead, 5 mm × 5 mm × 1.80 mm LFCSP package

APPLICATIONS

Condition monitoring

Predictive maintenance

Asset health

Test and measurement

Health usage monitoring systems (HUMSs)

Acoustic emissions

FUNCTIONAL BLOCK DIAGRAM

TIMING

GENERATOR

ADXL1004

OUT

SENSOR

MOD

AMP

SELF TEST

OUTPUT

AMPLIFIER

DEMOD

OVERRANGE

DETECTION

STANDBY

16508-001

Figure 1.

GENERAL DESCRIPTION

The ADXL1004 delivers ultralow noise density over an

extended frequency range and is optimized for bearing fault

detection and diagnostics. The ADXL1004 has typical noise

density of 125 µg/√Hz across the linear frequency range.

Microelectronicmechanical systems (MEMS) accelerometers

have stable and repeatable sensitivity, and are immune to

external shocks up to 10,000 g.

The integrated signal conditioning electronics enable such

features as full electrostatic self test (ST) and an overrange (OR)

indicator, useful for embedded applications. With low power

and single-supply operation of 3.3 V to 5.25 V, the ADXL1004

also enables wireless sensing product design. The ADXL1004 is

available in a 5 mm × 5 mm × 1.80 mm LFCSP package, and

operates over the −40°C to +125°C temperature range.

ADXL1004 Data Sheet

Rev. 0 | Page 2 of 14

TABLE OF CONTENTS

Features .............................................................................................. 1

Applications ....................................................................................... 1

Functional Block Diagram .............................................................. 1

General Description ......................................................................... 1

Revision History ............................................................................... 2

Specifications ..................................................................................... 3

Absolute Maximum Ratings ............................................................ 4

Thermal Resistance ...................................................................... 4

Recommended Soldering Profile ............................................... 4

ESD Caution .................................................................................. 4

Pin Configuration and Function Descriptions ............................. 5

Typical Performance Characteristics ............................................. 6

Theory of Operation ........................................................................ 9

Mechanical Device Operation .................................................... 9

Operating Modes ...........................................................................9

Bandwidth ......................................................................................9

Applications Information .............................................................. 10

Application Circuit ..................................................................... 10

On Demand Self Test ................................................................. 10

Ratiometric Output Voltage ...................................................... 10

Interfacing Analog Output Below 10 kHz .............................. 11

Interfacing Analog Output Beyond 10 kHz ............................ 12

Overrange .................................................................................... 12

Mechanical Considerations for Mounting .............................. 12

Layout and Design Recommendations ................................... 13

Outline Dimensions ....................................................................... 14

Ordering Guide .......................................................................... 14

REVISION HISTORY

1/2018—Revision 0: Initial Version

Data Sheet ADXL1004

Rev. 0 | Page 3 of 14

SPECIFICATIONS

= 25°C, V

= 5.0 V, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications are guaranteed. Typical

specifications may not be guaranteed.

Table 1.

Parameter Test Conditions/Comments Min Typ Max Unit

SENSOR

Measurement Range ±500

Nonlinearity

Percentage of full-scale ±0.25 %

Cross Axis Sensitivity

Z-axis acceleration affect on X-axis ±1.5 %

Y-axis acceleration affect on X-axis ±1.5 %

SENSITIVITY (RATIOMETRIC TO V

)

Sensitivity DC 4 mV/g

Sensitivity Change Due to Temperature

= −40°C to +125°C

±5

ZERO g OFFSET (RATIOMETRIC TO V

)

0 g Output Voltage V

/2 V

0 g Output Range over Temperature

−40°C to +125°C 11

NOISE

Noise Density 100 Hz to 20 kHz 125 µg/√Hz

1/f Frequency Corner 0.1 Hz

FREQUENCY RESPONSE

Sensor Resonant Frequency 41 45 kHz

5% Bandwidth

10 kHz

3 dB Bandwidth

24 kHz

SELF TEST

Output Change (Ratiometric to V

) ST low to ST high 55 70 mV

Input Voltage Level

High, V

× 0.7 V

Low, V

× 0.3 V

Input Current 25 µA

OUTPUT AMPLIFIER

Short-Circuit Current 3 mA

Output Impedance <0.1 Ω

Maximum Resistive Load 20 MΩ

Maximum Capacitive Load

No external resistor 100 pF

With external resistor 22 nF

POWER SUPPLY (V

)

Operating Voltage Range 3.3 5.0 5.25 V

Quiescent Supply Current 1.0 1.15 mA

Standby Current 225 285 µA

Standby Recovery Time (Standby to Measure Mode) Output settled to 1% of final value <50 µs

Turn On Time

<550 µs

OPERATING TEMPERATURE RANGE −40 +125 °C

Nonlinearity is tested using sine vibration at 13 kHz.

Cross axis sensitivity is defined as the coupling of excitation along a perpendicular axis onto the measured axis output.

Includes package hysteresis from 25°C.

Difference between the maximum and the minimum values in temperature range.

Specified as a frequency range that is within a deviation range relative to dc sensitivity. The range is limited by an increase in response due to response gain at the

sensor resonant frequency.

Specified as a frequency range that is within a deviation range relative to dc sensitivity. The range is limited by an increase in response due to response gain at the

sensor resonant frequency.