AMIS−49587
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11
4 ELECTRICAL CHARACTERISTICS
4.1 DC AND AC CHARACTERISTICS
4.1.1 Oscillator: Pin XIN, XOUT
In production the actual oscillation of the oscillator and duty cycle will not be tested. The production test will be based on the
static parameters and the inversion from XIN to XOUT in order to guarantee the functionality of the oscillator.
Table 8. OSCILLATOR
Parameter Test Conditions Symbol Min Typ Max Unit
Crystal frequency (Note 1) f
CLK
−100 ppm 24 +100 ppm MHz
Duty cycle with quartz connected (Note 1) 40 61 %
Start−up time (Note 1) T
startup
50 ms
Maximum Capacitive load on XOUT XIN used as clock input CL
XOUT
50 pF
Low input threshold voltage XIN used as clock input VIL
XOUT
0.3 V
DD
V
High input threshold voltage XIN used as clock input VIH
XOUT
0.7 V
DD
V
Low output voltage XIN used as clock input,
XOUT = 2 mA
VOL
XOUT
0.3 V
High input voltage XIN used as clock input VOH
XOUT
V
DD
−0.3 V
1. Guaranteed by design. Maximum allowed series loss resistance up to 80 W.
4.1.2 Zero Crossing Detector and 50/60 Hz PLL: Pin M50HZ_IN
Table 9. ZERO CROSSING DETECTOR AND 50/60 Hz PLL
Parameter Test Conditions Symbol Min Typ Max Unit
Maximum peak input current Imp
M50HZIN
−20 20 mA
Maximum average input current During 1 ms Imavg
M50HZIN
−2 2 mA
Mains voltage (ms) range With protection resistor at
M50HZIN
V
MAINS
90 550 V
Rising threshold level (Note 2) VIRM
50HZIN
1.9 V
Falling threshold level (Note 2) VIFM
50HZIN
0.82 V
Hysteresis (Note 2) VHY
50HZIN
0.4 V
Lock range for 50 Hz (Note 3) MAINS_FREQ = 0 (50 Hz) Flock
50Hz
45 55 Hz
Lock range for 60 Hz (Note 3) MAINS_FREQ = 0 (60 Hz) Flock
60Hz
54 66 Hz
Lock time (Note 3) MAINS_FREQ = 0 (50 Hz) Tlock
50Hz
15 s
Lock time (Note 3) MAINS_FREQ = 0 (60 Hz) Tlock
60Hz
20 s
Frequency variation without going out of
lock (Note 3)
MAINS_FREQ = 0 (50 Hz) DF
60Hz
0.1 Hz/s
Frequency variation without going out of
lock (Note 3)
MAINS_FREQ = 0 (60 Hz) DF
50Hz
0.1 Hz/s
Jitter of CHIP_CLK (Note 3) Jitter
CHIP_CLK
−25 25
ms
2. Measured relative to V
SS
.
3. These parameters will not be measured in production since the performance is totally dependent of a digital circuit which will be guaranteed
by the digital test patterns.