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AD7899BRZ-1

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P17
REV. A
–3–
AD7899
ABS
Parameter Version
1
Version
1
Version
1
Unit Test Conditions/Comments
L
OGIC INPUTS
Input High Voltage, V
INH
V
DRIVE
/2 + 0.4 V
DRIVE
/2 + 0.4 V
DRIVE
/2 + 0.4 V min V
DD
= 5 V ± 5%
Input Low Voltage, V
INL
V
DRIVE
/2 – 0.4 V
DRIVE
/2 – 0.4 V
DRIVE
/2 – 0.4 V max V
DD
= 5 V ± 5%
Input Current, I
IN
± 10 ± 10 ± 10 µA max
Input Capacitance, C
IN
4
10 10 10 pF max
LOGIC OUTPUTS
Output High Voltage, V
OH
V
DRIVE
– 0.4 V
DRIVE
– 0.4 V
DRIVE
– 0.4 V min I
SOURCE
= 400 µA
Output Low Voltage, V
OL
0.4 0.4 0.4 V max I
SINK
= 1.6 mA
DB13–DB0
High Impedance
Leakage Current ± 10 ± 10 ± 10 µA max
Capacitance
4
10 10 10 pF max
Output Coding
AD7899-1, AD7899-3 Two’s Complement
AD7899-2 Straight (Natural) Binary
CONVERSION RATE
Conversion Time 2.2 2.2 2.2 µs max
Track/Hold Acquisition Time
2, 3
0.3 0.3 0.3 µs max
Throughput Time 400 400 400 kSPS max
POWER REQUIREMENTS
V
DD
5 5 5 V nom
I
DD
Normal Mode 25 25 25 mA max Typically 16 mA
Standby Mode 20 20 20 µA max (5 µA typ) Logic Inputs = 0 V or
V
DD
Power Dissipation
Normal Mode 125 125 125 mW max Typically 80 mW, V
DD
= 5 V
Standby Mode 100 100 125 µW max
NOTES
1
Temperature Ranges are as follows : A, B Versions: –40C to +85C. S Version: –55°C to +125°C.
2
Performance measured through full channel (SHA and ADC).
3
See Terminology.
4
Sample tested @ 25°C to ensure compliance.
Specifications subject to change without notice.
REV. A
AD7899
–4–
TIMING CHARACTERISTICS
1, 2
A, B and S
Parameter Versions Unit Test Conditions/Comments
t
CONV
2.2 µs max Conversion Time, Internal Clock
2.46 µs max CLKIN = 6.5 MHz
t
ACQ
0.3 µs max Acquisition Time
t
EOC
120 ns min EOC Pulsewidth
180 ns max
t
WAKE-UP
– External V
REF
5
2 µs max STBY Rising Edge to CONVST Rising Edge
(See Standby Mode Operation)
t
1
35 ns min CONVST Pulsewidth
t
2
70 ns min CONVST Rising Edge to BUSY Rising Edge
Read Operation
t
3
0 ns min CS to RD Setup Time
t
4
0 ns min CS to RD Hold Time
t
5
35 ns min Read Pulsewidth
t
6
3
35 ns max Data Access Time after Falling Edge of RD, V
DRIVE
= 5 V
40 ns max Data Access Time after Falling Edge of RD, V
DRIVE
= 3 V
t
7
4
5 ns min Bus Relinquish Time after Rising Edge of RD
30 ns max
t
8
0 ns min BUSY Falling Edge to RD Delay
External Clock
t
9
0 ns min CLKIN to CONVST Rising Edge Setup Time
t
10
20 ns min CLKIN to CONVST Rising Edge Hold Time
t
11
100 ns min CONVST Rising Edge to CLK Falling Edge
NOTES
1
Sample tested at 25°C to ensure compliance. All input signals are measured with tr = tf = 1 ns (10% to 90% of V
DRIVE
) and timed from a voltage level of V
DRIVE
/2.
2
See Figures 5, 6, 7, and 8.
3
Measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.0 V.
4
These times are derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then
extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the times quoted in the timing characteristics are the true bus
relinquish times of the part and as such are independent of external bus loading capacitances.
5
Refer to the Standby Mode Operation section.
Specifications subject to change without notice.
(V
DD
= 5 V ⴞ 5%, AGND = DGND = 0 V, V
REF
= Internal, Clock = Internal; All specifications T
MIN
to T
MAX
and valid for V
DRIVE
= 3 V ⴞ 5% and 5 V ⴞ 5% unless otherwise noted.)
1.6mA
1.6V
400␮A
50pF
TO
OUTPUT
PIN
Figure 1. Load Circuit for Access Time and Bus Relinquish Time
REV. A
AD7899
–5–
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD7899 features proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS*
(T
A
= 25°C unless otherwise noted)
V
DD
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
DD
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
DRIVE
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . V
DD
+ 0.3 V
Analog Input Voltage to AGND
AD7899-1 (±10 V Range) . . . . . . . . . . . . . . . . . . . . ± 18 V
AD7899-1 (±5 V Range) . . . . . . . . . . . . . . . –9 V to +18 V
AD7899-2 . . . . . . . . . . . . . . . . . . . . . . . . . . –1 V to +18 V
AD7899-3 . . . . . . . . . . . . . . . . . . . . . . . . . . –4 V to +18 V
Reference Input Voltage to AGND . . . –0.3 V to V
DD
+ 0.3 V
Digital Input Voltage to DGND . . . . . –0.3 V to V
DD
+ 0.3 V
Digital Output Voltage to DGND . . . . –0.3 V to V
DD
+ 0.3 V
Operating Temperature Range
Commercial (A, B Version) . . . . . . . . . . . –40°C to +85°C
Military (S Version) . . . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150°C
SOIC Package, Power Dissipation . . . . . . . . . . . . . . . 450 mW
θ
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . . 95°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . 215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . 220°C
SSOP Package, Power Dissipation . . . . . . . . . . . . . . . 450 mW
θ
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . . 95°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . 215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . 220°C
*
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
ORDERING GUIDE
Relative Temperature Package Package
Model Input Ranges Accuracy Range Description Option
AD7899AR-1
±
5V,
±
10 V
±
2 LSB –40C to +85C Small Outline R-28
AD7899BR-1
±
5V,
±
10 V
±
1.5 LSB –40C to +85C Small Outline R-28
AD7899SR-1
±
5V,
±
10 V
±
2 LSB –55C to +125C Small Outline R-28
AD7899AR-2 0 V to 5 V, 0 V to 2.5 V
±
2 LSB –40C to +85C Small Outline R-28
AD7899AR-3
±
2.5 V
±
2 LSB –40C to +85C Small Outline R-28
AD7899BR-3
±
2.5 V
±
1.5 LSB –40C to +85C Small Outline R-28
AD7899ARS-1
±
5V,
±
10 V
±
2 LSB –40C to +85C Shrink Small Outline RS-28
AD7899ARS-2 0 V to 5 V, 0 V to 2.5 V
±
2 LSB –40C to +85C Shrink Small Outline RS-28
AD7899ARS-3
±
2.5 V
±
2 LSB –40C to +85C Shrink Small Outline RS-28
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P17

AD7899BRZ-1

Mfr. #:
Buy AD7899BRZ-1
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC 5V SGL Supply 14-Bit 400 kSPS
Lifecycle:
New from this manufacturer.
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