MARCH 9, 2017 5 9-OUTPUT 1.5V PCIE GEN1-2-3 FANOUT BUFFER WITH ZO=100OHMS
9DBU0941 DATASHEET
Absolute Maximum Ratings
Stresses above the ratings listed below can cause permanent damage to the 9DBU0941. These ratings, which are standard
values for IDT commercially rated parts, are stress ratings only. Functional operation of the device at these or any other
conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods can affect product reliability. Electrical parameters are guaranteed only over the
recommended operating temperature range.
Electrical Characteristics–Clock Input Parameters
PARAMETER SYMBOL CONDITIONS
MIN TYP MAX
UNITS NOTES
Supply Voltage VDDx Applies to VDD, VDDA and VDDIO -0.5 2 V 1,2
Input Voltage V
IN
DD
+0.5 V 1,
Input High Voltage, SMBus V
IHSMB
SMBus clock and data pins 3.3 V 1
Storage Temperature Ts -65 150 °C 1
Junction Temperature Tj 125 °C 1
Input ESD protection
ESD prot Human Body Model 2000 V 1
1
Guaranteed by design and characterization, not 100% tested in production.
2
Operation under these conditions is neither implied nor guaranteed.
3
Not to exceed 2.0V.
TA = TAMB, Supply voltages per normal operation conditions; see Test Loads for loading conditions
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES
Input Common Mode
Voltage - DIF_IN
V
COM
Common Mode Input Voltage 200 725 mV 1
Input Swing - DIF_IN V
SWING
Differential value 300 1450 mV 1
Input Slew Rate - DIF_IN dv/dt Measured differentially 0.4 8 V/ns 1,2
Input Leakage Current I
IN
IN
DD ,
IN
GND -5 5 µA
Input Duty Cycle d
tin
Measurement from differential waveform 45 50 55 % 1
Input Jitter - Cycle to Cycle J
DIFI n
Differential Measurement 0 150 ps 1
1
Guaranteed by design and characterization, not 100% tested in production.
2
Slew rate measured through +/-75mV window centered around differential zero.
