ispLSI
®
2128VE
3.3V In-System Programmable
SuperFAST™ High Density PLD
2128ve_12 1
Features
SuperFAST HIGH DENSITY IN-SYSTEM
PROGRAMMABLE LOGIC
6000 PLD Gates
128 and 64 I/O Pin Versions, Eight Dedicated Inputs
128 Registers
High Speed Global Interconnect
Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
Small Logic Block Size for Random Logic
100% Functional, JEDEC and Pinout Compatible
with ispLSI 2128V Devices
3.3V LOW VOLTAGE 2128 ARCHITECTURE
Interfaces with Standard 5V TTL Devices
HIGH PERFORMANCE E
2
CMOS
®
TECHNOLOGY
fmax = 250MHz Maximum Operating Frequency
tpd = 4.0ns Propagation Delay
Electrically Erasable and Reprogrammable
Non-Volatile
100% Tested at Time of Manufacture
Unused Product Term Shutdown Saves Power
IN-SYSTEM PROGRAMMABLE
3.3V In-System Programmability (ISP™) Using
Boundary Scan Test Access Port (TAP)
Open-Drain Output Option for Flexible Bus Interface
Capability, Allowing Easy Implementation of Wired-
OR Bus Arbitration Logic
Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
Reprogram Soldered Devices for Faster Prototyping
100% IEEE 1149.1 BOUNDARY SCAN TESTABLE
THE EASE OF USE AND FAST SYSTEM SPEED OF
PLDs WITH THE DENSITY AND FLEXIBILITY OF FPGAS
Enhanced Pin Locking Capability
Three Dedicated Clock Input Pins
Synchronous and Asynchronous Clocks
Programmable Output Slew Rate Control
Flexible Pin Placement
Optimized Global Routing Pool Provides Global
Interconnectivity
LEAD-FREE PACKAGE OPTIONS
Functional Block Diagram*
Description
The ispLSI 2128VE is a High Density Programmable
Logic Device available in 128 and 64 I/O-pin versions.
The device contains 128 Registers, eight Dedicated
Input pins, three Dedicated Clock Input pins, two dedi-
cated Global OE input pins and a Global Routing Pool
(GRP). The GRP provides complete interconnectivity
between all of these elements. The ispLSI 2128VE
features in-system programmability through the Bound-
ary Scan Test Access Port (TAP) and is 100% IEEE
1149.1 Boundary Scan Testable. The ispLSI 2128VE
offers non-volatile reprogrammability of the logic, as well
as the interconnect to provide truly reconfigurable sys-
tems.
The basic unit of logic on the ispLSI 2128VE device is the
Generic Logic Block (GLB). The GLBs are labeled A0, A1
.. D7 (see Figure 1). There are a total of 32 GLBs in the
ispLSI 2128VE device. Each GLB is made up of four
macrocells. Each GLB has 18 inputs, a programmable
AND/OR/Exclusive OR array, and four outputs which can
be configured to be either combinatorial or registered.
Inputs to the GLB come from the GRP and dedicated
inputs. All of the GLB outputs are brought back into the
GRP so that they can be connected to the inputs of any
GLB on the device.
Global Routing Pool (GRP)
Output Routing Pool (ORP) Output Routing Pool (ORP)
Output Routing Pool (ORP) Output Routing Pool (ORP)
Output Routing Pool (ORP) Output Routing Pool (ORP)
CLK 0
Output Routing Pool (ORP) Output Routing Pool (ORP)
CLK 1
CLK 2
Logic
Array
GLB
DQ
DQ
DQ
DQ
0139A/2128V
E
C7
C6
C5
C4
C3
C2
C1
C0
D3
D2
D1
D0
D7
D6
D5
D4
B4
B5
B6
B7
B0
B1
B2
B3
A0
A1
A2
A3
A4
A5
A6
A7
*128 I/O Version Shown
Copyright © 2004 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. August 2004
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
Lead-
Free
Package
Options
Available!
Specifications ispLSI 2128VE
2
Functional Block Diagram
Figure 1. ispLSI 2128VE Functional Block Diagram (128-I/O and 64-I/O Versions)
The 128-I/O 2128VE contains 128 I/O cells, while the 64-
I/O version contains 64 I/O cells. Each I/O cell is directly
connected to an I/O pin and can be individually pro-
grammed to be a combinatorial input, output or
bi-directional I/O pin with 3-state control. The signal
levels are TTL compatible voltages and the output drivers
can source 4mA or sink 8mA. Each output can be
programmed independently for fast or slow output slew
rate to minimize overall output switching noise. Device
pins can be safely driven to 5V signal levels to support
mixed-voltage systems.
Eight GLBs, 32 or 16 I/O cells, two dedicated inputs and
two or one ORPs are connected together to make a
Megablock (see Figure 1). The outputs of the eight GLBs
are connected to a set of 32 or 16 universal I/O cells by
the two or one ORPs. Each ispLSI 2128VE device
contains four Megablocks.
The GRP has as its inputs, the outputs from all of the
GLBs and all of the inputs from the bi-directional I/O cells.
All of these signals are made available to the inputs of the
GLBs. Delays through the GRP have been equalized to
minimize timing skew.
Clocks in the ispLSI 2128VE device are selected using
the dedicated clock pins. Three dedicated clock pins (Y0,
Y1, Y2) or an asynchronous clock can be selected on a
GLB basis. The asynchronous or Product Term clock
can be generated in any GLB for its own clock.
Programmable Open-Drain Outputs
In addition to the standard output configuration, the
outputs of the ispLSI 2128VE are individually program-
mable, either as a standard totem-pole output or an
open-drain output. The totem-pole output drives the
specified Voh and Vol levels, whereas the open-drain
output drives only the specified Vol. The Voh level on the
open-drain output depends on the external loading and
pull-up. This output configuration is controlled by a pro-
grammable fuse. The default configuration when the
device is in bulk erased state is totem-pole configuration.
The open-drain/totem-pole option is selectable through
the Lattice software tools.
Global
Routing
Pool
(GRP)
0139B/2128VE
Megablock
RESET
Input Bus
D3
D2
D1
D0
D7
D6
D5
D4
Output Routing Pool (ORP) Output Routing Pool (ORP)
I/O 127
I/O 126
I/O 125
I/O 124
I/O 123
I/O 122
I/O 121
I/O 120
I/O 119
I/O 118
I/O 117
I/O 116
I/O 115
I/O 114
I/O 113
I/O 112
I/O 111
I/O 110
I/O 109
I/O 108
I/O 107
I/O 106
I/O 105
I/O 104
I/O 103
I/O 102
I/O 101
I/O 100
I/O 99
I/O 98
I/O 97
I/O 96
IN 7
C7
C6
C5
C4
C3
C2
C1
C0
Output Routing Pool (ORP) Output Routing Pool (ORP)
Input Bus
IN 5
IN 4
I/O 91
I/O 90
I/O 89
I/O 88
I/O 87
I/O 86
I/O 85
I/O 84
I/O 83
I/O 82
I/O 81
I/O 80
I/O 79
I/O 78
I/O 77
I/O 76
I/O 75
I/O 74
I/O 73
I/O 72
I/O 71
I/O 70
I/O 69
I/O 68
I/O 67
I/O 66
I/O 65
I/O 64
I/O 95
I/O 94
I/O 93
I/O 92
Output Routing Pool (ORP) Output Routing Pool (ORP)
Input Bus
CLK 0
I/O 32
I/O 33
I/O 34
I/O 35
I/O 36
I/O 37
I/O 38
I/O 39
I/O 40
I/O 41
I/O 42
I/O 43
I/O 44
I/O 45
I/O 46
I/O 47
I/O 48
I/O 49
I/O 50
I/O 51
I/O 52
I/O 53
I/O 54
I/O 55
I/O 56
I/O 57
I/O 58
I/O 59
I/O 60
I/O 61
I/O 62
I/O 63
Y0
Y1
Y2
TDO/IN 2
TCK/IN 3
B4
B5
B6
B7
B0
B1
B2
B3
Output Routing Pool (ORP) Output Routing Pool (ORP)
A0
A1
A2
A3
A4
A5
A6
A7
BSCAN
I/O 4
I/O 5
I/O 6
I/O 7
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
I/O 16
I/O 17
I/O 18
I/O 19
I/O 20
I/O 21
I/O 22
I/O 23
I/O 24
I/O 25
I/O 26
I/O 27
I/O 28
I/O 29
I/O 30
I/O 31
I/O 0
I/O 1
I/O 2
I/O 3
GOE 0
GOE 1
CLK 1
CLK 2
Input Bus
TDI/IN 0
TMS/IN 1
IN 6
G
eneric Lo
gic
B
lo
cks (G
L
Bs)
Global
Routing
Pool
(GRP)
0139B/2128VE.64IO
Megablock
RESET
Input Bus
D3
D2
D1
D0
D7
D6
D5
D4
Output Routing Pool (ORP)
I/O 63
I/O 62
I/O 61
I/O 60
I/O 59
I/O 58
I/O 57
I/O 56
I/O 55
I/O 54
I/O 53
I/O 52
I/O 51
I/O 50
I/O 49
I/O 48
IN 7*
C7
C6
C5
C4
C3
C2
C1
C0
Output Routing Pool (ORP)
Input Bus
IN 5*
IN 4*
I/O 43
I/O 42
I/O 41
I/O 40
I/O 39
I/O 38
I/O 37
I/O 36
I/O 35
I/O 34
I/O 33
I/O 32
I/O 47
I/O 46
I/O 45
I/O 44
Output Routing Pool (ORP)
Input Bus
CLK 0
Y0
Y1
Y2
TDO/IN 2
TCK/IN 3
B4
B5
B6
B7
B0
B1
B2
B3
Output Routing Pool (ORP)
A0
A1
A2
A3
A4
A5
A6
A7
BSCAN
I/O 4
I/O 5
I/O 6
I/O 7
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
I/O 16
I/O 17
I/O 18
I/O 19
I/O 20
I/O 21
I/O 22
I/O 23
I/O 24
I/O 25
I/O 26
I/O 27
I/O 28
I/O 29
I/O 30
I/O 31
I/O 0
I/O 1
I/O 2
I/O 3
GOE 0
GOE 1
CLK 1
CLK 2
Input Bus
TDI/IN 0
TMS/IN 1
*Not available on 84-PLCC Device
IN 6*
G
en
eric L
ogic
B
locks (G
LB
s
)
Specifications ispLSI 2128VE
3
Absolute Maximum Ratings
1
Supply Voltage V
cc
.................................. -0.5 to +5.4V
Input Voltage Applied............................... -0.5 to +5.6V
Off-State Output Voltage Applied ............ -0.5 to +5.6V
Storage Temperature................................ -65 to 150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (T
J
) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
DC Recommended Operating Condition
Erase Reprogram Specifications
Capacitance (T
A
=25°C, f=1.0 MHz)
C
SYMBOL
Table 2-0006/2128VE
C
PARAMETER
I/O Capacitance
6
UNITSTYPICAL TEST CONDITIONS
1
2
8Dedicated Input Capacitance
pf
pf
V = 3.3V, V = 0.0V
V = 3.3V, V = 0.0V
CC
CC I/O
IN
C
Clock and Global Output Enable Capacitance
10
3
pf V = 3.3V, V = 0.0V
CC Y
Table 2-0008/2128VE
PARAMETER MINIMUM MAXIMUM UNITS
Erase/Reprogram Cycles
10,000 Cycles
T
A
= 0°C to + 70°C
T
A
= -40°C to + 85°C
SYMBOL
Table 2-0005/2128VE
V
CC
V
IH
V
IL
PARAMETER
Supply Voltage
Input High Voltage
Input Low Voltage
MIN. MAX. UNITS
3.0
3.0
2.0
V – 0.5
3.6
3.6
5.25
0.8
V
V
V
V
SS
Commercial
Industrial

ISPLSI 2128VE-250LQ160

Mfr. #:
Manufacturer:
Lattice
Description:
CPLD - Complex Programmable Logic Devices PROGRAMMABLE SUPER FAST HI DENSITY PLD
Lifecycle:
New from this manufacturer.
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