Specifications ispLSI 2128VE
4
Switching Test Conditions
Figure 2. Test Load
Input Pulse Levels
Table 2 - 0003/2128VE
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
GND to 3.0V
1.5ns 10% to 90%
1.5V
1.5V
See Figure 2
3-state levels are measured 0.5V from steady-state active level.
DC Electrical Characteristics
Over Recommended Operating Conditions
Output Load Conditions (see Figure 2)
TEST CONDITION R1 R2 CL
A 316 348 35pF
B
348 35pF
316 348 35pF
Active High
Active Low
C
316 348 5pF
348 5pF
Active Low to Z
at V +0.5V
OL
Active High to Z
at V -0.5V
OH
Table 2-0004/2128VE
VOL
SYMBOL
1. One output at a time for a maximum duration of one second. V = 0.5V was selected to avoid test
problems by tester ground degradation. Characterized but not 100% tested.
2. Measured using eight 16-bit counters.
3. Typical values are at V = 3.3V and T = 25°C.
4. Maximum I varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum I .
Table 2-0007/2128VE
1
VOH
IIH
IIL
IIL-isp
PARAMETER
IIL-PU
IOS
2, 4
ICC
Output Low Voltage
Output High Voltage
Input or I/O High Leakage Current
Input or I/O Low Leakage Current
BSCAN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
I = 8 mA
I = -4 mA
0V V V (Max.)
0V V V
0V V V
V = 3.3V, V = 0.5V
V = 0.0V, V = 3.0V
f = 1 MHz
OL
OH
IN IL
IN
IL
IN IL
CC OUT
CLOCK
IL
IH
CONDITION MIN. TYP. MAX. UNITS
3
2.4
195
0.4
10
10
-10
-150
-150
-100
V
V
µA
µA
µA
µA
µA
mA
mA
CC
A
OUT
CC
CC
(V - 0.2)V V V
V V 5.25V
CC CC IN
IN
CC
+ 3.3V
R
1
R
2
C
L
*
Device
Output
Test
Point
*C
L
includes Test Fixture and Probe Capacitance.
0213A/2128VE
Specifications ispLSI 2128VE
5
USE 2128VE-250
FOR NEW DESIGNS
External Timing Parameters
Over Recommended Operating Conditions
t
pd1
UNITS
TEST
COND.
1. Unless noted otherwise, all parameters use a GRP load of four, 20 PTXOR path, ORP and Y0 clock.
2. Standard 16-bit counter using GRP feedback.
3. Reference Switching Test Conditions section.
Table 2-0030A/2128VE
v.1.0
1
3
2
1
tsu2 + tco1
( )
DESCRIPTION#PARAMETER
A1Data Propagation Delay, 4PT Bypass, ORP Bypass ns
t
pd2
A2Data Propagation Delay ns
f
max
A3Clock Frequency with Internal Feedback MHz
f
max (Ext.)
–4Clock Frequency with External Feedback MHz
f
max (Tog.)
–5Clock Frequency, Max. Toggle MHz
t
su1
–6GLB Reg. Setup Time before Clock, 4 PT Bypass ns
t
co1
A7GLB Reg. Clock to Output Delay, ORP Bypass ns
t
h1
–8GLB Reg. Hold Time after Clock, 4 PT Bypass ns
t
su2
–9GLB Reg. Setup Time before Clock ns
t
co2
A10GLB Reg. Clock to Output Delay ns
t
h2
–11GLB Reg. Hold Time after Clock ns
t
r1
A12Ext. Reset Pin to Output Delay, ORP Bypass ns
t
rw1
–13Ext. Reset Pulse Duration ns
t
ptoeen
B14Input to Output Enable ns
t
ptoedis
C15Input to Output Disable ns
t
goeen
B16Global OE Output Enable ns
t
goedis
C17Global OE Output Disable ns
t
wh
–18External Synchronous Clock Pulse Duration, High ns
t
wl
–19External Synchronous Clock Pulse Duration, Low ns
-180
MIN. MAX.
5.0
180
0.0
4.5
0.0
4.0
2.5
2.5
125
200
3.5
3.5
4.5
7.0
10.0
10.0
5.0
5.0
7.5
-250
MIN. MAX.
4.0
250
0.0
3.3
0.0
3.5
1.8
1.8
158
277
2.5
3.0
3.7
6.0
6.0
6.0
4.0
4.0
6.0
Specifications ispLSI 2128VE
6
External Timing Parameters
Over Recommended Operating Conditions
t
pd1
UNITS
TEST
COND.
1. Unless noted otherwise, all parameters use a GRP load of four, 20 PTXOR path, ORP and Y0 clock.
2. Standard 16-bit counter using GRP feedback.
3. Reference Switching Test Conditions section.
Table 2-0030B/2128VE
v.1.0
1
3
2
1
tsu2 + tco1
( )
DESCRIPTION#PARAMETER
A1Data Propagation Delay, 4PT Bypass, ORP Bypass ns
t
pd2
A2Data Propagation Delay ns
f
max
A3Clock Frequency with Internal Feedback MHz
f
max (Ext.)
—4Clock Frequency with External Feedback MHz
f
max (Tog.)
—5Clock Frequency, Max. Toggle MHz
t
su1
—6GLB Reg. Setup Time before Clock, 4 PT Bypass ns
t
co1
A7GLB Reg. Clock to Output Delay, ORP Bypass ns
t
h1
—8GLB Reg. Hold Time after Clock, 4 PT Bypass ns
t
su2
—9GLB Reg. Setup Time before Clock ns
t
co2
A10GLB Reg. Clock to Output Delay ns
t
h2
—11GLB Reg. Hold Time after Clock ns
t
r1
A12Ext. Reset Pin to Output Delay, ORP Bypass ns
t
rw1
—13Ext. Reset Pulse Duration ns
t
ptoeen
B14Input to Output Enable ns
t
ptoedis
C15Input to Output Disable ns
t
goeen
B16Global OE Output Enable ns
t
goedis
C17Global OE Output Disable ns
t
wh
—18External Synchronous Clock Pulse Duration, High ns
t
wl
—19External Synchronous Clock Pulse Duration, Low ns
-135
MIN.
-100
MIN.MAX. MAX.
7.5 10.0
——
135 100
——
——
——
——
0.0
6.0
——
0.0
——
5.0
——
——
——
——
3.5
3.5
100
143
5.0
4.0
5.0
9.0
12.0
12.0
7.0
7.0
10.0
77
100
6.5
0.0
8.0
0.0
6.5
5.0
5.0
13.0
5.0
6.0
12.5
15.0
15.0
9.0
9.0

ISPLSI 2128VE-250LQ160

Mfr. #:
Manufacturer:
Lattice
Description:
CPLD - Complex Programmable Logic Devices PROGRAMMABLE SUPER FAST HI DENSITY PLD
Lifecycle:
New from this manufacturer.
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