L9362
4/17
ELECTRICAL CHARACTERISTICS
4.5V
V
CC
5.5V, -40°C T
J
125°C, unless otherwise specified.
Symbol Parameter Test Conditions Min. Typ. Max. Unit
Supply current
I
CCRES
Standby current Without load.
T
j
85°C
NRES = LOW
1.3 mA
I
CCOPM
Operating mode I
OUT 1 ... 4
= 2A 11 17 mA
I
CCLV
Low voltage supply current V
CC
< 0,5V 80 A
Inputs (NONx; NCS; CLK; NRES; SDI)
V
INL
Low threshold -0.3 0.2
V
CC
V
V
INH
High threshold 0.7
V
CC
V
CC
+0.3
V
V
hyst
Hysteresis 0.85 V
I
IN
Input leakage current V
IN
= V
CC
10 A
I
IN
Input current (NONx, NCS, CLK,
SDI)
V
IN
0.8V
CC
20 100 A
I
IN NRES
Input current NRES 3 20 A
Serial Data Output
V
SDOH
High output level (I
SDO
= -2mA) V
CC
- 0.4
V
V
SDOL
Low output level (I
SDO
= 3.2mA) 0.4 V
I
SDOL
Tristate leakage current (NCS = HIGH;
V
SDO
= 0V ... V
CC
)
-10 10 A
Outputs (Out 1 ... 4)
I
OUTL1
Leakage current 1 (NON = HIGH;
V
OUT
= 14V;
V
CC
= 5V)
10 A
V
clpa
Output clamp voltage V
clpa
(I
OUT
= 0.5A) 45 50 60 V
W
OFF
Clamped energy at the switching
OFF
1)
For 2ms, see fig. 8 50 mJ
R
DSON
ON resistance I
OUT
= 2A; T
j
= 150°C;
T
j
= 25°C
2) 250
500
300
m
m
OVR
p1
OVR
p2
Positive output voltage ramp
(with inductive load)
V
OUT
= 30% ... 80% of
V
BAT
=16V 3)
V
OUT
=
V
BAT
... 0.9 V
clp
3)
0.3
0.75
0.9 1.35
2.25
V/s
V/s
OVR
n
Negative output voltage ramp 80% ... 30% of V
BAT
= 16V
with inductive load
3)
0.3 0.9 1.35 V/s
t
dON
Turn ON delay NON = 50%;
V
OUT
= 0.8 V
BAT
0410s
t
dOFF
Turn OFF delay NON = 50%;
V
OUT
= 0.3 V
BAT
0410s
Note 1: Typical loads for the zener clamping and the output voltage ramps are:
a) 10, 16mH at all outputs or
b) 25, 160mH
Note 2: At 150°C guaranteed by design and electrical characterisation
Note 3: Tested with resistive load of R
load
= 50
5/17
L9362
Powerstage protection
I
SCB
Short current detection and switch
off threshold
With filter-time t_SCB. 3.0 5.0 A
t_SCB Short circuit switch off delay time 3 30 s
V
ccmin
V
CC
undervoltage 3.0 4.0 V
Current feedback
T
Ratio 1
I
CFB
/ I
OUT
for I
OUT
=0.4...2A
4)
V
CFB
1.8V 1.45 1.65 2 mA/A
T
MPS1
6)
5)
Temperature stability
for 0.4A to < 2.0A, related to
25°C
3 6%
CURS1
for I
OUT
= 0.4A to 2A
5)
Current stability
gain/Gain at 2A
T
J
= -40°C -12 17 %
T
J
= +25°C -6 10 %
T
J
= +125°C -5 5 %
CURlin1
6)
CURlin2
for I
OUT
= 0.4A to 1.0A
4)
for I
OUT
= 1.0A to 2.0A
4)
Linearity Error
(within the calibration points
at 0.5A, 1A, 2A)
0.2 1
0.7
%
%
Note 4: At 150°C guaranteed by design and electrical characterisation
Note 5: Guaranteed by design and electrical characterisation
Note 6: Values for T
MPS1
, CURlin1 and CURlin2 are typical values from testing results
Diagnostic
V
REF1
Short to GND threshold voltage for I
OUT
2A 0.390
V
CC
0.435
V
CC
V
t_SCG Short to GND filter time 140 250 s
I
OL
Open load threshold current 10 55 mA
t_OL Open load filter time 140 265 s
R
OL
Pullup resistor at OUT1, OUT2,
OUT3 and OUT4 for OL detection
2.0 8.0 k
T
OFF
Temperature detection threshold
7)
155 170 190 °C
Note 7: Guaranteed by measurement and correlation
ELECTRICAL CHARACTERISTICS (continued)
4.5V
V
CC
5.5V, -40°C T
J
125°C, unless otherwise specified.
Symbol Parameter Test Conditions Min. Typ. Max. Unit
L9362
6/17
Note: 8. Input Pin Capacitance of SDI, CLK, NCS, NON1, NON2, NON3, NON4 6pF typical; Output Pin Capacitance of SDO 12pF typica
Serial diagnostic link (external Load capacitor at SDO = 100pF)
f
clk
Clock frequency 50% duty cycle. 0 3 MHz
t
clh
Minimum time CLK = HIGH 100 ns
t
cll
Minimum time CLK = LOW 100 ns
t
pcld
Propagation delay CLK to data at SDO valid. 100 ns
t
csdv
NCS = LOW To data at SDO valid. 100 ns
t
sclch
CLK low before NCS low Setup time CLK to NCS
change H/L.
100 ns
t
hclcl
CLK change L/H after
NCS = LOW
100 ns
t
scld
SDI input setup time CLK change H/L after SDI
data valid.
20 ns
t
hcld
SDI input hold time SDI data hold after CLK
change H/L.
20 ns
t
sclcl
CLK low before NCS high 150 ns
t
hclch
CLK high after NCS high 150 ns
t
pchdz
NCS L/H to output data float 100 ns
t
fNCS
NCS filter-time Pulses t
fNCS
will be
ignored.
10 40 ns
ELECTRICAL CHARACTERISTICS (continued)
4.5V
V
CC
5.5V, -40°C T
J
125°C, unless otherwise specified.
Symbol Parameter Test Conditions Min. Typ. Max. Unit

L9362

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
Gate Drivers Quad Low Side
Lifecycle:
New from this manufacturer.
Delivery:
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