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NFM21HC101U1H3D

P1-P3P4-P6P7-P9P10-P11
NFM21HC102R1H3_ (0805, 1000pF, DC50V)
_: packaging code Reference Sheet
1.Scope
　　
2.MURATA Part NO. System
(Ex.)
3. Type & Dimensions
a)Equivalent Circuit
(Unit:mm)
4.Rated value
5.Package
Product specifications in this catalog are as of Mar.3,2016,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
Insulation
Resistance
mark
Packaging Unit
(7) Packaging
This product specification is applied to Chip EMIFIL®Chip 3-terminal Capacitor used for Automotive Electronic equipment.
(3) Nominal
Capacitance
Capacitance
Tolerance
(5)
DC Rated
Voltage
Rated
Current
(mA)
j
0.2+0.2/-0.1
Chip EMIFIL®Chip 3-terminal Capacitor for Automotive
Specifications and Test Methods
(Operating /Storage Temp. Range)
-55 to 125 °C / -55 to 125 °C
±20 %
1A(DC)
300mΩmax.
1000 pF
DC
Resistance
1000MΩmin.
DC 50 V
(1)-2 W
T
e
g
D
f180mm Reel
PAPER W8P4
4000 pcs./Reel
1.25±0.1
0.85±0.1
0.3±0.2
0.2 min.
(1)L/W
Dimensions
(2)Features
(3)Nominal
Capacitance
(4)Temperature
Characteristics
(5)DC Rated
Voltage
(6)Electrode
(7)Packaging
Code
NFM 21 HC 102 R 1H 3 D
NFM21HC102R1H3-01 1
■AEC-Q200 Murata Standard Specification and Test Methods
Electrical Performance
No Specification Test Method
1 Capacitance Shown in Rated value.
Frequency
(Cap.)
22 to 100pF : 1±0.1MHz
220pF to 1uF : 1±0.1kHz
Voltage : 1±0.2V(rms)
2
Voltage : Rated Voltage
Time : 2 minutes max.
3 DC Resistance Measured with 100mA max.
(Rdc1,2) Rdc1 : between signal terminals
Rdc2 : between ground terminals
4 Withstanding Voltage Products shall not be damaged.
Test Voltage : Rated Voltage X 300%
Time : 1 to 5 s
Charge Current : 50 mA max.
5
Operating Temperature
Shown in Rated value. Includes self-heating
6
Storage Temperature
Standard Testing Condition
< Unless otherwise specified >
< In case of doubt >
Temperature : Ordinary Temp. / 15 °C to 35 °C Temperature: 20 °C ± 2 °C
Humidity: Ordinary Humidity / 25 %(RH) to 85 %(RH)
Humidity: 60 %(RH) to 70 %(RH)
Atmospheric pressure: 86 kPa to 106 kPa
Item
Insulation
Resistance(I.R.)
Rdc2
Rdc1
Rdc1
Rdc2
JEMCPS-03093 2
■AEC-Q200 Murata Standard Specification and Test Methods
Mechanical Performance (based on Table 2 for Tantalum & Ceramic Capacitors)
AEC-Q200 Rev.C issued June 17. 2005
Murata Specification / Deviation
No. Stress
Test Method
3
High Temperature
Exposure
Unpowered
1000 hours @ T=150C (Ceramics)
Measurement at 24+/-2 hours after test
Meet Table D after testing.
4 Temperature Cycling
1000cycles (-55C to +125C)
Measurement at 24+/-2 hours after test
Meet Table A after testing.
6 Moisture Resistance
t=24 hours/cycle. Note: Steps 7a & 7b not
required.
Unpowered.
Meet Table D after testing.
7 Biased Humidity
1000hours 85C/85%RH.
Note: Ceramics only Specified conditions:
Rated Voltage and 1.3 to 1.5 volts.
Add 100Kohm resister.
Tantalums-Rated Voltage only.
Measurement at 24+/-2 hours after test
Meet Table D after testing.
8 Operational Life
Condition D Steady State TA=125C
Full rated ceramic caps
Measurement at 24+/-2 hours
after test conclusion.
Meet Table D after testing.
9 External Visual
Visual inspection No abnormalities
10 Physical Dimension
Within the specified dimensions. No defects
12 Resistance to Solvents
Per MIL-STD-202 Method 215 Not Applicable
13 Mechanical Shock
Figure 1 of Method 213.
SMD:Condition F
Leaded:Condition C
Meet Table C after testing.
14 Vibration
5g's for 20 minutes, 12cycles each of 3
oritentations
Use 8"X5" PCB, .031"thick. 7 secure points on
one long side and 2 secure points at corners of
opposite sides.
Parts mounted within 2" from any secure point.
Test from 10-2000Hz.
Meet Table C after testing.
15
Resistance to
Soldering Heat
Note: Condition B No pre-heat of samples.
Note:Single Wave Solder-Procedure 2 for SMD.
Procedure 1 for Leaded with solder within
1.5mm of device body.
Meet Table A after testing.
Deviation for AEC-Q200;
Testing condition
Flux: Ethanol solution of rosin, 25(wt)%
Pre-heating: 150C+/-10C, 60 to 90s
Solder: Sn-3.0Ag-0.5Cu
Solder Temperature: 270C+/-5C
Immesion Time: 10s+/-1s
Immesion and emersion rates: 25mm/s
Then measured after exposure in the room
16 Thermal Shock
-55C/+125C
Note: Number of cycles required-300,
Maximum transfer time-20 s,
Dwell time-15 minuites. Air-Air.
Meet Table A after testing.
17 ESD
Per AEC-Q200-002 Component Classification:Meet Table E
18 Solderability
Per J-STD-002
95% of the terminations is to be soldered.
Method B : Not Applicable
19
Electrical Characterization
Summary to show Min, Max, Mean and
Standard deviation at room as well as Min and
Max operating temperatures.
Deviation for AEC-Q200;
Shown in Rated value.
AEC-Q200
45
R340
F
Deflection
45
Product
Pressurejig
JEMCPS-03093 3
P1-P3P4-P6P7-P9P10-P11

NFM21HC101U1H3D

Mfr. #:
Buy NFM21HC101U1H3D
Manufacturer:
Murata Electronics
Description:
Feed Through Capacitors 0805 100pF +/-20% 50 volt 700mA
Lifecycle:
New from this manufacturer.
Delivery:
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