74LVT_LVTH16374A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 10 — 2 April 2012 9 of 19
NXP Semiconductors
74LVT16374A; 74LVTH16374A
3.3 V 16-bit edge-triggered D-type flip-flop; 3-state
[1] All typical values are at V
CC
= 3.3 V and T
amb
= 25 C.
[2] t
su
is the same as t
su(H)
and t
su(L)
.
[3] t
h
is the same as t
h(H)
and t
h(L)
.
[4] t
W
is the same as t
W(H)
and t
W(L)
.
11. Waveforms
t
su
set-up time nDn to nCP; HIGH or LOW; see Figure 9
[2]
V
CC
= 3.3 V 0.3 V 2.0 0.7 - ns
V
CC
= 2.7 V 2.0 - - ns
t
h
hold time nDn to nCP; HIGH or LOW; see Figure 9
[3]
V
CC
= 3.3 V 0.3 V 0.8 0 - ns
V
CC
= 2.7 V 0.1 - - ns
t
W
pulse width nCP HIGH; see Figure 7
[4]
V
CC
= 3.3 V 0.3 V 1.5 0.6 - ns
V
CC
= 2.7 V 1.5 - - ns
nCP LOW; see Figure 7
V
CC
= 3.3 V 0.3 V 3.0 1.6 - ns
V
CC
= 2.7 V 3.0 - - ns
Table 7. Dynamic characteristics
…continued
Voltages are referenced to GND (ground = 0 V); for test circuit see Figure 10.
Symbol Parameter Conditions Min Typ
[1]
Max Unit
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 7. Propagation delay clock input to output, clock pulse width and maximum clock frequency
001aaa256
nCP input
nQn
output
t
PHL
t
PLH
t
W
V
OH
V
I
GND
V
OL
V
M
V
M
V
M
1/f
max
Table 8. Measurement points
Input Output
V
M
V
M
V
X
V
Y
1.5 V 1.5 V V
OL
+ 0.3 V V
OH
0.3 V
74LVT_LVTH16374A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 10 — 2 April 2012 10 of 19
NXP Semiconductors
74LVT16374A; 74LVTH16374A
3.3 V 16-bit edge-triggered D-type flip-flop; 3-state
Measurements points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 8. Enable and disable times
001aae464
t
PZL
nYn output
nYn output
nOE input
V
OL
V
OH
3.0 V
V
I
V
M
GND
0 V
t
PLZ
t
PZH
t
PHZ
V
X
V
Y
V
M
V
M
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Remark: The shaded areas indicate when the input is permitted to change for predictable output performance.
Fig 9. Data set-up and hold times
001aaa257
GND
GND
t
h
t
su
t
h
t
su
V
M
V
M
V
M
V
I
V
OH
V
OL
V
I
nQn output
nCP input
nDn input
74LVT_LVTH16374A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 10 — 2 April 2012 11 of 19
NXP Semiconductors
74LVT16374A; 74LVTH16374A
3.3 V 16-bit edge-triggered D-type flip-flop; 3-state
Test data is given in Table 9.
Definitions test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
V
EXT
= Test voltage for switching times.
Fig 10. Test circuit for measuring switching times
V
EXT
V
CC
V
I
V
O
001aae235
DUT
C
L
R
T
R
L
R
L
PULSE
GENERATOR
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
Table 9. Test data
Input Load V
EXT
V
I
f
i
t
W
t
r
, t
f
C
L
R
L
t
PHZ
, t
PZH
t
PLZ
, t
PZL
t
PLH
, t
PHL
2.7 V 10 MHz 500 ns 2.5 ns 50 pF 500 GND 6 V open

74LVT16374AEVK

Mfr. #:
Manufacturer:
Nexperia
Description:
Flip Flops 74LVT16374AEV/VFBGA56/STANDARD
Lifecycle:
New from this manufacturer.
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