Spec No.JELF243A-0050AA-01 P.6/14
MURATA MFG.CO.,LTD
Reference Only
6.Electrical Performance
No. Item Specification Test Method
6.1
Inductance Inductance shall meet item 3. Measuring Equipment:
KEYSIGHT E4991A or equivalent
Measuring Frequency:
<Inductance> 100MHz
<Q> 250MHz/ 1.5nH~43nH
200MHz/ 47nH~68nH
150MHz/ 72nH~120nH
Measuring Condition:
Test signal level / about 0dBm
Electrical length / 0.94cm
Measuring Fixture: KEYSIGHT 16193A
Position coil under test as shown in below and
contact coil with each terminal by adding weight.
Measuring Method: See the endnote.
<Electrical Performance:Measuring
Method of Inductance/Q>
6.2 Q Q shall meet item 3.
6.3 DC Resistance DC Resistance shall meet item 3.
Measuring Equipment:Digital multi meter
6.4 Self Resonant
Frequency
(S.R.F)
S.R.F shall meet item 3. Measuring Equipment:KEYSIGHT N5230A
or equivalent
6.5 Rated Current Self temperature rise shall be
limited to 20°C max.
The rated current is applied.
7.Mechanical Performance
No. Item Specification Test Method
7.1
Shear Test
Chip coil shall not be damaged
after tested as test method.
Substrate:Glass-epoxy substrate
(in mm)
Applied Direction:
Force:5N
Hold Duration:5s±1s
7.2 Bending Test Substrate:Glass-epoxy substrate
(100mm
×40mm×0.8mm)
Speed of Applying Force:1mm / s
Deflection:2mm
Hold Duration:5s
(in mm)
0.5mm
45
R340
F
Deflection
45
Product
Pressure jig
Substrate
F
Chip Coil
1.2
0.65
0.5
Chip Coil
Pattern
Solder resist
Substrate
