CM1235-08DE

CM1235
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4
PIN DESCRIPTIONS
Pin Name Description
1 In_1+ Bidirectional Clamp to ASIC (inside system)
2 In_1 Bidirectional Clamp to ASIC (inside system)
3 In_2+ Bidirectional Clamp to ASIC (inside system)
4 In_2 Bidirectional Clamp to ASIC (inside system)
5 In_3+ Bidirectional Clamp to ASIC (inside system)
6 In_3 Bidirectional Clamp to ASIC (inside system)
7 In_4+ Bidirectional Clamp to ASIC (inside system)
8 In_4 Bidirectional Clamp to ASIC (inside system)
9 Out_4 Bidirectional Clamp to Connector (outside system)
10 Out_4+ Bidirectional Clamp to Connector (outside system)
11 Out_3 Bidirectional Clamp to Connector (outside system)
12 Out_3+ Bidirectional Clamp to Connector (outside system)
13 Out_2 Bidirectional Clamp to Connector (outside system)
14 Out_2+ Bidirectional Clamp to Connector (outside system)
15 Out_1 Bidirectional Clamp to Connector (outside system)
16 Out_1+ Bidirectional Clamp to Connector (outside system)
PAD GND Ground return to shield
CM1235
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5
Specifications
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameter Rating Units
Operating Temperature Range 40 to +85 °C
Storage Temperature Range 65 to +150 °C
Breakdown Voltage (Positive) 6 V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
Table 2. ELECTRICAL OPERATING CHARACTERISTICS
(All parameters specified at T
A
= –40°C to +85°C unless otherwise noted.)
Symbol
Parameter Conditions Min Typ Max Units
V
IN
I/O Voltage Relative to GND 0.5 5.5 V
I
IN
Continuous Current through signal pins
(IN to OUT) 1000 Hr
100 mA
I
F
Channel Leakage Current T
A
= 25°C; V
IN
= 5 V ±0.1 ±1.0
mA
V
ESD
ESD Protection Peak Discharge Voltage
at any channel input, in system:
Contact discharge per
IEC 6100042 Standard
T
A
= 25°C ±8 kV
I
RES
Residual ESD Peak Current on RDUP
(Resistance of Device Under Protection)
IEC 6100042 8 kV;
RDUP = 5 W, T
A
= 25°C;
See Figure 7
3.0 A
V
CL
Channel Clamp Voltage
(Channel clamp voltage per
IEC 6100045 Standard)
Positive Transients
Negative Transients
I
PP
= 1 A, T
A
= 25°C,
t
P
= 8/20 mS
+9.2
1.6
V
R
DYN
Dynamic Resistance
Positive Transients
Negative Transients
I
PP
= 1 A, T
A
= 25°C,
t
P
= 8/20 mS
0.6
0.5
W
Z
TDR
Differential Impedance
TDR excursion from 100 W
characteristic impedance transmis-
sion line;
TR = 200 ps; (Note 1)
87 103
W
Zo Differential Channels pair
characteristic impedance
T
R
= 200 ps; (Note 1)
100
W
DZo
ChanneltoChannel Impedance Match
(Differential)
T
R
= 200 ps; T
A
= 25°C;
(Note
1)
2 %
1. Impedance values for deviation from continuous 100 W uncompensated differential microstrip, with typical layout as measured. See Figure 7.
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
CM1235
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6
Performance Information
Graphical Comparison and Test Setup
Figure 5 shows that the CM1235 (ESD protector) lowers the peak voltage and clamping voltage by 45% across a wide range
of loading conditions in comparison to a standard ESD protection device. Figure 6 also indicates that the DUP/ASIC protected
by the CM1235 dissipates less energy than a standard ESD protection device. This data was derived using the test setups shown
in Figure 7.
Figure 5. Normalized VPeak (8 KV IEC61000
42 ESD Contract Strike) vs. Loading (RDUP)*
Figure 6. Normalized Residual Current into
DUP vs. RDUP*
RDUP (W) RDUP (W)
20105
0
0.2
0.4
0.6
0.8
1.0
1.2
20105
0
0.1
0.2
0.3
0.4
0.5
V
CLAMP(peak)
(Normalized)
RESIDUAL CURRENT (Normalized)
CM1235
STD ESD Device
CM1235
STD ESD Device
*RDUP is the emulated Dynamic Resistance (load) of the Device Under Protection (DUP).
Figure 7. Test Setups: Standard Device (Left) and CM1235 (Right)
Standard ESD
Device Test Setup
CM1235 Test Setup
Voltage
Probe
Current
Probe
I
RESIDUAL
R
VARIABLE
Standard
ESD Device
IEC 6100042
Test Standards
Device Under
Protection (DUP)
Voltage
Probe
Current
Probe
I
RESIDUAL
R
VARIABLE
CM1235
IEC 6100042
Test Standards
Device Under
Protection (DUP)

CM1235-08DE

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
TVS Diodes / ESD Suppressors 4 CH ESD 8kV
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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