©2004 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD2200 Rev. 1.0.4 5
FOD2200 — Low Input Current Logic Gate Optocouplers
Electrical Characteristics (Continued)
Transfer Characteristics (T
A
= 0°C to +85°C, V
CC
= 4.5V to 20V, I
F(ON)
= 1.6mA to 5mA, V
EH
= 2V to 20V,
V
EL
= 0V to 0.8V, I
F(OFF)
= 0mA to 0.1mA unless otherwise specified.)
(1)
Isolation Characteristics (T
A
= 0°C to +85°C unless otherwise specified)
*Typical values at T
A
= 25°C, V
CC
= 5V, I
F(ON)
= 3mA unless otherwise stated.
Notes:
1. The V
CC
supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic
or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible
to the package V
CC
and GND pins of each device.
2. t
PLH
– Propagation delay is measured from the 50% level on the LOW to HIGH transition of the input current pulse
to the 1.3V level on the LOW to HIGH transition of the output voltage pulse.
3. t
PHL
– Propagation delay is measured from the 50% level on the HIGH to LOW transition of the input current pulse
to the 1.3V level on the HIGH to LOW transition of the output voltage pulse.
4. When the peaking capacitor is omitted, propagation delay times may increase by 100ns.
5. t
r
– Rise time is measured from the 10% to the 90% levels on the LOW to HIGH transition of the output pulse.
6. t
f
– Fall time is measured from the 90% to the 10% levels on the HIGH to LOW transition of the output pulse.
7. CM
H
– The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the high
state (i.e., V
OUT
> 2.0V).
8. CM
L
– The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the low
state (i.e., V
OUT
< 0.8V).
9. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted together.
10. Duration of output short circuit time should not exceed 10ms.
Symbol DC Characteristics Test Conditions Min. Typ.* Max. Unit
I
OHH
Output Leakage Current
(V
OUT
> V
CC
)
V
CC
= 4.5V, I
F
= 5mA V
O
= 5.5V 2.0 100 µA
V
O
= 20V 2.5 500
V
OL
Low Level Output Voltage V
CC
= 4.5 V, I
F
= 0mA, V
E
= 0.4 V,
I
OL
= 6.4mA
(2)
0.33 0.5 V
I
FT
Input Threshold Current V
CC
= 4.5V, V
O
= 0.5V, V
E
= 0.4V,
I
OL
= 6.4mA
1.6 mA
V
OH
Logic High Output Voltage I
OH
= -2.6mA 2.4 V
CC
– 1.8 V
I
OZL
High Impedance State
Output Current
V
O
= 0.4V, V
EN
= 2V, I
F
= 5mA -20 µA
I
OZH
High Impedance State
Output Current
V
O
= 2.4 V, V
EN
= 2 V, I
F
= 5mA 20 µA
V
O
= 5.5 V, V
EN
= 2 V, I
F
= 5mA 100
V
O
= 20 V, V
EN
= 2 V, I
F
= 5mA 500
I
OSL
Logic Low Short Circuit
Output Current
(10)
V
O
= V
CC
= 5.5V, I
F
= 0mA 25 mA
V
O
= V
CC
= 20V, I
F
= 0mA 40
I
OSH
Logic High Short Circuit
Output Current
(10)
V
CC
= 5.5V, I
F
= 5mA, V
O
= GND -10 mA
V
CC
= 20V, I
F
= 5mA, V
O
= GND -25
I
HYS
Input Current Hysteresis V
CC
= 4.5V 0.03 mA
Symbol Characteristics Test Conditions Min. Typ.* Max. Unit
V
ISO
Withstand Insulation Test Voltage R
H
< 50%, T
A
= 25°C, t = 1 min.
(9)
5000 V
RMS
R
I-O
Resistance (Input to Output) V
I-O
= 500 VDC
(9)
10
12
Ω
C
I-O
Capacitance (Input to Output) V
I-O
= 0V, f = 1MHz
(9)
0.6 pF
