CY7B991
CY7B992
Document #: 38-07138 Rev. ** Page 4 of 15
Electrical Characteristics Over the Operating Range
[6]
CY7B991 CY7B992
Parameter Description Test Conditions Min. Max. Min. Max. Unit
V
OH
Output HIGH Voltage V
CC
= Min., I
OH
= 16 mA 2.4 V
V
CC
= Min., I
OH
=40 mA V
CC
0.75
V
OL
Output LOW Voltage V
CC
= Min., I
OL
= 46 mA 0.45 V
V
CC
= Min., I
OL
= 46 mA 0.45
V
IH
Input HIGH Voltage
(REF and FB inputs only)
2.0 V
CC
V
CC
1.35
V
CC
V
V
IL
Input LOW Voltage
(REF and FB inputs only)
0.5 0.8 0.5 1.35 V
V
IHH
Three-Level Input HIGH
Voltage (Test, FS, xFn)
[7]
Min. V
CC
Max. V
CC
0.85 V
CC
V
CC
0.85 V
CC
V
V
IMM
Three-Level Input MID
Voltage (Test, FS, xFn)
[7]
Min. V
CC
Max. V
CC
/2
500 mV
V
CC
/2 +
500 mV
V
CC
/2
500 mV
V
CC
/2 +
500 mV
V
V
ILL
Three-Level Input LOW
Voltage (Test, FS, xFn)
[7]
Min. V
CC
Max. 0.0 0.85 0.0 0.85 V
I
IH
Input HIGH Leakage Current
(REF and FB inputs only)
V
CC
= Max., V
IN
= Max. 10 10 µA
I
IL
Input LOW Leakage Current
(REF and FB inputs only)
V
CC
= Max., V
IN
= 0.4V 500 500 µA
I
IHH
Input HIGH Current
(Test, FS, xFn)
V
IN
= V
CC
200 200 µA
I
IMM
Input MID Current
(Test, FS, xFn)
V
IN
= V
CC
/2 50 50 50 50 µA
I
ILL
Input LOW Current
(Test, FS, xFn)
V
IN
= GND 200 200 µA
I
OS
Output Short Circuit
Current
[8]
V
CC
= Max., V
OUT
= GND (25
°C only)
250 N/A mA
I
CCQ
Operating Current Used by
Internal Circuitry
V
CCN
= V
CCQ
=
Max., All Input
Selects Open
Coml 85 85 mA
Mil/Ind 90 90
I
CCN
Output Buffer Current per
Output Pair
[9]
V
CCN
= V
CCQ
= Max.,
I
OUT
= 0 mA
Input Selects Open, f
MAX
14 19 mA
PD Power Dissipation per
Output Pair
[10]
V
CCN
= V
CCQ
= Max.,
I
OUT
= 0 mA
Input Selects Open, f
MAX
78 104
[11]
mW
Notes:
6. See the last page of this specification for Group A subgroup testing information.
7. These inputs are normally wired to V
CC
, GND, or left unconnected (actual threshold voltages vary as a percentage of V
CC
). Internal termination resistors hold
unconnected inputs at V
CC
/2. If these inputs are switched, the function and timing of the outputs may glitch and the PLL may require an additional t
LOCK
time
before all datasheet limits are achieved.
8. CY7B991 should be tested one output at a time, output shorted for less than one second, less than 10% duty cycle. Room temperature only. CY7B992 outputs
should not be shorted to GND. Doing so may cause permanent damage.
9. Total output current per output pair can be approximated by the following expression that includes device current plus load current:
CY7B991: I
CCN
= [(4 + 0.11F) + [((835 3F)/Z) + (.0022FC)]N] x 1.1
CY7B992: I
CCN
= [(3.5+ 0.17F) + [((1160 2.8F)/Z) + (.0025FC)]N] x 1.1
Where
F = frequency in MHz
C = capacitive load in pF
Z = line impedance in ohms
N = number of loaded outputs; 0, 1, or 2
FC = F
< C
10. Total power dissipation per output pair can be approximated by the following expression that includes device power dissipation plus power dissipation due to
the load circuit:
CY7B991: PD = [(22 + 0.61F) + [((1550 2.7F)/Z) + (.0125FC)]N] x 1.1
CY7B992: PD = [(19.25+ 0.94F) + [((700 + 6F)/Z) + (.017FC)]N] x 1.1
See note 9 for variable definition.
11. CMOS output buffer current and power dissipation specified at 50-MHz reference frequency.
CY7B991
CY7B992
Document #: 38-07138 Rev. ** Page 5 of 15
Capacitance
[12]
Parameter Description Test Conditions Max. Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz, V
CC
= 5.0V 10 pF
Note:
12. Applies to REF and FB inputs only. Tested initially and after any design or process changes that may affect these parameters.
AC Test Loads and Waveforms
7B9914
7B9915
TTL ACTest Load (CY7B991) TTL Input Test Waveform (CY7B991)
5V
R1
R2
C
L
R1
R2
C
L
7B9916
CMOS AC Test Load (CY7B992)
3.0V
2.0V
V
th
=1.5V
0.8V
0.0V
1ns 1ns
2.0V
0.8V
V
th
=1.5V
80%
V
th
=V
CC
/2
20%
0.0V
3ns 3ns
80%
20%
V
th
=V
CC
/2
7B9917
CMOS InputTest Waveform (CY7B992)
V
CC
R1=130
R2=91
C
L
=50pF(C
L
=30 pF for 2 and 5 devices)
(Includes fixture and probe capacitance)
R1=100
R2=100
C
L
=50pF(C
L
(Includes fixture and probe capacitance)
V
CC
=30 pF for 2 and 5 devices)
CY7B991
CY7B992
Document #: 38-07138 Rev. ** Page 6 of 15
Switching Characteristics Over the Operating Range
[2, 13]
CY7B9912
[14]
CY7B9922
[14]
Parameter Description Min. Typ. Max. Min. Typ. Max. Unit
f
NOM
Operating Clock
Frequency in MHz
FS = LOW
[1, 2]
15 30 15 30 MHz
FS = MID
[1, 2]
25 50 25 50
FS = HIGH
[1, 2 , 3]
40 80 40 80
[15]
t
RPWH
REF Pulse Width HIGH 5.0 5.0 ns
t
RPWL
REF Pulse Width LOW 5.0 5.0 ns
t
U
Programmable Skew Unit See Table 1
t
SKEWPR
Zero Output Matched-Pair Skew
(XQ0, XQ1)
[16, 17]
0.05 0.20 0.05 0.20 ns
t
SKEW0
Zero Output Skew (All Outputs)
[16, 18,19]
0.1 0.25 0.1 0.25 ns
t
SKEW1
Output Skew (Rise-Rise, Fall-Fall, Same
Class Outputs)
[16, 20]
0.25 0.5 0.25 0.5 ns
t
SKEW2
Output Skew (Rise-Fall, Nominal-Inverted,
Divided-Divided)
[16, 20]
0.3 0.5 0.3 0.5 ns
t
SKEW3
Output Skew (Rise-Rise, Fall-Fall, Different
Class Outputs)
[16, 20]
0.25 0.5 0.25 0.5 ns
t
SKEW4
Output Skew (Rise-Fall, Nominal-Divided,
Divided-Inverted)
[16, 20]
0.5 0.9 0.5 0.7 ns
t
DEV
Device-to-Device Skew
[14, 21]
0.75 0.75 ns
t
PD
Propagation Delay, REF Rise to FB Rise 0.25 0.0 +0.25 0.25 0.0 +0.25 ns
t
ODCV
Output Duty Cycle Variation
[22]
0.65 0.0 +0.65 0.5 0.0 +0.5 ns
t
PWH
Output HIGH Time Deviation from 50%
[23, 24]
2.0 3.0 ns
t
PWL
Output LOW Time Deviation from 50%
[23, 24]
1.5 3.0 ns
t
ORISE
Output Rise Time
[23, 25]
0.15 1.0 1.2 0.5 2.0 2.5 ns
t
OFALL
Output Fall Time
[23, 25]
0.15 1.0 1.2 0.5 2.0 2.5 ns
t
LOCK
PLL Lock Time
[26]
0.5 0.5 ms
t
JR
Cycle-to-Cycle Output
Jitter
RMS
[14]
25 25 ps
Peak-to-Peak
[14]
200 200 ps
Note:
13. Test measurement levels for the CY7B991 are TTL levels (1.5V to 1.5V). Test measurement levels for the CY7B992 are CMOS levels (V
CC
/2 to V
CC
/2). Test
conditions assume signal transition times of 2 ns or less and output loading as shown in the AC Test Loads and Waveforms unless otherwise specified.
14. Guaranteed by statistical correlation. Tested initially and after any design or process changes that may affect these parameters.
15. Except as noted, all CY7B9922 and 5 timing parameters are specified to 80-MHz with a 30-pF load.
16. SKEW is defined as the time between the earliest and the latest output transition among all outputs for which the same t
U
delay has been selected when all are
loaded with 50 pF and terminated with 50
to 2.06V (CY7B991) or V
CC
/2 (CY7B992).
17. t
SKEWPR
is defined as the skew between a pair of outputs (XQ0 and XQ1) when all eight outputs are selected for 0t
U
.
18. t
SKEW0
is defined as the skew between outputs when they are selected for 0t
U
. Other outputs are divided or inverted but not shifted.
19. C
L
=0 pF. For C
L
=30 pF, t
SKEW0
=0.35 ns.
20. There are three classes of outputs: Nominal (multiple of t
U
delay), Inverted (4Q0 and 4Q1 only with 4F0 = 4F1 = HIGH), and Divided (3Qx and 4Qx only in Divide-by-2
or Divide-by-4 mode).
21. t
DEV
is the output-to-output skew between any two devices operating under the same conditions (V
CC
ambient temperature, air flow, etc.)
22. t
ODCV
is the deviation of the output from a 50% duty cycle. Output pulse width variations are included in t
SKEW2
and t
SKEW4
specifications.
23. Specified with outputs loaded with 30 pF for the CY7B99X2 and 5 devices and 50 pF for the CY7B99X7 devices. Devices are terminated through 50
to
2.06V (CY7B991) or V
CC
/2 (CY7B992).
24. t
PWH
is measured at 2.0V for the CY7B991 and 0.8 V
CC
for the CY7B992. t
PWL
is measured at 0.8V for the CY7B991 and 0.2 V
CC
for the CY7B992.
25. t
ORISE
and t
OFALL
measured between 0.8V and 2.0V for the CY7B991 or 0.8V
CC
and 0.2V
CC
for the CY7B992.
26. t
LOCK
is the time that is required before synchronization is achieved. This specification is valid only after V
CC
is stable and within normal operating limits. This parameter
is measured from the application of a new signal or frequency at REF or FB until t
PD
is within specified limits.

CY7B991-2JC

Mfr. #:
Manufacturer:
Cypress Semiconductor
Description:
Phase Locked Loops - PLL 5V 80MHz 8 TLL COM Programable
Lifecycle:
New from this manufacturer.
Delivery:
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