NB100LVEP91
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4
Table 3. MAXIMUM RATINGS
Symbol Parameter Condition 1 Condition 2 Rating Unit
V
CC
Positive Power Supply GND = 0 V 3.8 to 0 V
V
EE
Negative Power Supply GND = 0 V −3.8 to 0 V
V
I
Positive Input Voltage GND = 0 V V
I
≤ V
CC
3.8 to 0 V
V
OP
Operating Voltage GND = 0 V V
CC
− V
EE
7.6 to 0 V
I
out
Output Current Continuous
Surge
50
100
mA
I
BB
PECL V
BB
Sink/Source ± 0.5 mA
T
A
Operating Temperature Range −40 to +85 °C
T
stg
Storage Temperature Range −65 to +150 °C
q
JA
Thermal Resistance (Junction-to-Ambient)
JESD 51−3 (1S-Single Layer Test Board)
0 lfpm
500 lfpm
SOIC−20 WB 90
60
°C/W
q
JA
Thermal Resistance (Junction-to-Ambient)
JESD 51−6 (2S2P Multilayer Test Board) with Filled Thermal Vias
0 lfpm
500 lfpm
QFN−24 37
32
°C/W
q
JC
Thermal Resistance (Junction-to-Case) Standard
Board
SOIC−20 WB
QFN−24
30 to 35
11
°C/W
T
sol
Wave Solder (Pb-Free) 225 °C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
Table 4. DC CHARACTERISTICS POSITIVE INPUTS (V
CC
= 2.5 V, V
EE
= −2.375 to −3.8 V, GND = 0 V (Note 1))
Symbol
Characteristic
−40°C 25°C 85°C
Unit
Min Typ Max Min Typ Max Min Typ Max
I
CC
Positive Power Supply Current 10 14 20 10 14 20 10 14 20 mA
V
IH
Input HIGH Voltage (Single-Ended) 1335 V
CC
1335 V
CC
1335 V
CC
mV
V
IL
Input LOW Voltage (Single-Ended) GND 875 GND 875 GND 875 mV
V
IHCMR
Input HIGH Voltage Common Mode Range
(Differential Configuration) (Note 2)
0 2.5 0 2.5 0 2.5 V
I
IH
Input HIGH Current (@ V
IH
) 150 150 150
mA
I
IL
Input LOW Current (@ V
IL
)
D
D
0.5
−150
0.5
−150
0.5
−150
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
1. Input parameters vary 1:1 with V
CC
. V
CC
can vary +1.3 V / −0.125 V.
2. V
IHCMR
min varies 1:1 with GND. V
IHCMR
max varies 1:1 with V
CC
.