AD7156
Rev. 0 | Page 3 of 28
SPECIFICATIONS
V
DD
= 1.8 V to 3.6 V, GND = 0 V, temperature range = −40°C to +85°C, unless otherwise noted.
Table 1.
Parameter Min Typ Max Unit
1
Test Conditions/Comments
CAPACITIVE INPUT
Conversion Input Range, CIN to EXC
2, 3
3.2 4 pF 4 pF input range
1.6 2 pF 2 pF input range
0.8 1 pF 1 pF input range
0.4 0.5 pF 0.5 pF input range
Resolution
4, 5
2.0 fF 4 pF input range
1.6 fF 2 pF input range
1.4 fF 1 pF input range
1.0 fF 0.5 pF input range
Maximum Allowed Capacitance, CIN to GND
4, 6
50 pF
See Figure 4, Figure 5, and
Figure 6
Minimum Allowed Resistance, CIN to GND
4, 6
10 MΩ See Figure 10 and Figure 11
Maximum Allowed Serial Resistance
4, 6
50 kΩ See Figure 14
Gain Error −20 +20 %
Gain Deviation over Temperature
4
0.5 %FSR See Figure 17
Gain Matching Between Ranges
4
−2 +2 %
Offset Error
4
50 fF CIN and EXC pins disconnected
Offset Deviation over Temperature
4
5 fF
CIN and EXC pins disconnected
See Figure 16
Integral Nonlinearity (INL)
4
0.05 %
Channel-to-Channel Isolation
4
60 dB
Power Supply Rejection
4
4 fF/V
CAPDAC
Full Range 10 12.5 pF
Resolution (LSB)
4
200 fF
Differential Nonlinearity (DNL)
4
0.25 LSB
Auto-DAC Increment/Decrement
4, 7
25 75 % of C
IN
range
EXCITATION
Voltage
4, 7
±V
DD
/2
V
Frequency 16 kHz See Figure 18
Maximum Allowed Capacitance EXC to GND
4, 6
1000 pF
See Figure 7, Figure 8, and
Figure 9
Minimum Allowed Resistance EXC to GND
4, 6
1 MΩ See Figure 12 and Figure 13
LOGIC OUTPUTS (OUT1, OUT2)
Output Low Voltage (V
OL
) 0.4 V I
SINK
= −3 mA
Output High Voltage (V
OH
) V
DD
– 0.6 V I
SOURCE
= +3 mA
SERIAL INTERFACE INPUTS (SCL, SDA)
Input High Voltage (V
IH
) 70 % of V
DD
Input Low Voltage (V
IL
) 25 % of V
DD
Input Leakage Current ±0.1 ±5 µA
Input Pin Capacitance 6 pF
OPEN-DRAIN OUTPUT (SDA)
Output Low Voltage (V
OL
) 0.4 V
I
SINK
= 6.0 mA
Output High Leakage Current (I
OH
) 0.1 5 µA V
OUT
= V
DD
AD7156
Rev. 0 | Page 4 of 28
Parameter Min Typ Max Unit
1
Test Conditions/Comments
POWER REQUIREMENTS
V
DD
-to-GND Voltage 1.8 3.6 V
I
DD
Current
4, 8
65 75 µA V
DD
≤ 2.7 V, see Figure 20
70 85 µA V
DD
= 3.6 V, see Figure 20
I
DD
Current Power-Down Mode
4, 8
2 10 µA V
DD
≤ 2.7 V, see Figure 21
2 17 µA V
DD
= 3.6 V, see Figure 21
1
Capacitance units: 1 pF = 1 × 10
−12
F; 1 fF = 10
−15
F.
2
The CAPDAC can be used to shift (offset) the input range. The total capacitance of the sensor can therefore be up to the sum of the CAPDAC value and the conversion
input range. With the auto-DAC feature, the CAPDAC is adjusted automatically when the CDC input value is lower than 25% or higher than 75% of the CDC nominal
input range.
3
The maximum capacitance of the sensor connected between the EXCx and CINx pins is equal to the sum of the minimum guaranteed value of the CAPDAC and the
minimum guaranteed input range.
4
The maximum specification is not production tested but is supported by characterization data at initial product release.
5
The resolution of the converter is not limited by the output data format or output data LSB (least significant bit) size, but by the converter and system noise level. The
noise-free resolution is defined as level of peak-to-peak noise coming from the converter itself, with no connection to the CIN and EXC pins.
6
These specifications are understood separately. Any combination of the capacitance to ground and serial resistance may result in additional errors, for example gain
error, gain drift, offset error, offset drift, and power supply rejection.
7
Specification is not production tested but is guaranteed by design.
8
Digital inputs equal to V
DD
or GND.
AD7156
Rev. 0 | Page 5 of 28
TIMING SPECIFICATIONS
V
DD
= 1.8 V to 3.6 V, GND = 0 V, Input Logic 0 = 0 V, Input Logic 1 = V
DD
, temperature range = −40°C to +85°C, unless otherwise noted.
Table 2.
Parameter Min Typ Max Unit Test Conditions/Comments
CONVERTER
Conversion Time
1
20 ms Both channels, 10 ms per channel.
Wake-Up Time from Power-Down Mode
2, 3
0.3 ms
Power-Up Time
2, 4
2 ms
Reset Time
2, 5
2 ms
SERIAL INTERFACE
6, 7
See Figure 2.
SCL Frequency 0 400 kHz
SCL High Pulse Width, t
HIGH
0.6 µs
SCL Low Pulse Width, t
LOW
1.3 µs
SCL, SDA Rise Time, t
R
0.3 µs
SCL, SDA Fall Time, t
F
0.3 µs
Hold Time (Start Condition), t
HD;STA
0.6 µs After this period, the first clock is generated.
Setup Time (Start Condition), t
SU;STA
0.6 µs Relevant for repeated start condition.
Data Setup Time, t
SU;DAT
0.1 µs
Setup Time (Stop Condition), t
SU;STO
0.6 µs
Data Hold Time (Master), t
HD;DAT
10 ns
Bus-Free Time (Between Stop and Start Conditions), t
BUF
1.3 µs
1
Conversion time is 304 internal clock cycles for both channels (nominal clock 16 kHz); the internal clock frequency is equal to the specified excitation frequency.
2
Specification is not production tested but is supported by characterization data at initial product release.
3
Wake-up time is the maximum delay between the last SCL edge writing the configuration register and the start of conversion.
4
Power-up time is the maximum delay between the V
DD
crossing the minimum level (1.8 V) and either the start of conversion or when ready to receive a serial
interface command.
5
Reset time is the maximum delay between the last SCL edge writing the reset command and either the start of conversion or when ready to receive a serial
interface command.
6
Sample tested during initial release to ensure compliance.
7
All input signals are specified with input rise/fall times = 3 ns, measured between the 10% and 90% points. Timing reference points at 50% for inputs and outputs.
Output load = 10 pF.
P
S
t
LOW
t
R
t
F
t
HD;STA
t
HD;DAT
t
SU;DAT
t
SU;STA
t
HD;STA
t
SU;STO
t
HIGH
SCL
PS
SDA
07726-002
t
BUF
Figure 2. Serial Interface Timing Diagram

AD7156BCPZ-REEL

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Data Acquisition ADCs/DACs - Specialized 1.8V 3mm X 3 mm 2-CH Cap Cnvtr
Lifecycle:
New from this manufacturer.
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