15.625MHZ to 62.5MHZ, 1:4 LVCMOS/
LVTTL Zero Delay Clock Buffer
86004I DATA SHEET
4 REVISION A 7/10/15
TABLE 5A. AC CHARACTERISTICS, V
DD
= V
DDA
= V
DDO
= 3.3V±5%, TA = -40°C TO 85°C
TABLE 4D. LVCMOS / LVTTL DC CHARACTERISTICS, V
DD
= V
DDA
= V
DDO
= 3.3V±5% OR 2.5V±5%, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage
V
DD
= 3.3V 2 V
DD
+ 0.3 V
V
DD
= 2.5V 1.7 V
DD
+ 0.3 V
V
IL
Input Low Voltage
V
DD
= 3.3V -0.3 0.8 V
V
DD
= 2.5V -0.3 0.7 V
I
IH
Input High Current
CLK, MR,
FB_IN, F_SEL
V
DD
= V
IN
= 3.465V 150 µA
PLL_SEL V
DD
= V
IN
= 3.465V 5 µA
I
IL
Input Low Current
CLK, MR,
FB_IN, F_SEL
V
DD
= 3.465V, V
IN
= 0V -5 µA
PLL_SEL V
DD
= 3.465V, V
IN
= 0V -150 µA
V
OH
Output High Voltage; NOTE 1
V
DDO
= 3.465V 2.6 V
V
DDO
= 2.625V 1.8 V
V
OL
Output Low Voltage; NOTE 1 V
DDO
= 3.465V or 2.625V 0.5 V
NOTE 1: Outputs terminated with 50W to V
DDO
/2. See Parameter Measurement Information Section,
Output Load Test Circuit diagrams.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency
F_SEL = 0 31.25 62.5 MHz
F_SEL = 1 15.625 31.25 MHz
tp
LH
Propagation Delay, Low-to-High; NOTE 1
PLL_SEL = 0V,
Bypass Mode
4.1 6.1 ns
t(Ø) Static Phase Offset; NOTE 2, 4 PLL_SEL = 3.3V -500 500 ps
tsk(o) Output Skew; NOTE 3, 4 PLL_SEL = 0V 65 ps
tjit(cc) Cycle-to-Cycle Jitter; NOTE 4 75 ps
t
L
PLL Lock Time 1mS
t
R
/ t
F
Output Rise/Fall Time 0.4 1 ns
odc Output Duty Cycle 49 51 %
All parameters measured at f
MAX
unless noted otherwise.
NOTE: Electrical parameters are guaranteed over the specifi ed ambient operating temperature range, which is established
when the device is mounted in a test socket with maintained transverse airfl ow greater than 500 lfpm. The device will meet
specifi cations after thermal equilibrium has been reached under these conditions.
NOTE 1: Measured from V
DD
/2 of the input crossing point to the output at V
DDO
/2.
NOTE 2: Defi ned as the time difference between the input reference clock and the average feedback input signal
when the PLL is locked and the input reference frequency is stable.
NOTE 3: Defi ned as skew between outputs at the same supply voltages and with equal load conditions.
Measured at V
DDO
/2.
NOTE 4: This parameter is defi ned in accordance with JEDEC Standard 65.
REVISION A 7/10/15
86004I DATA SHEET
5 15.625MHZ to 62.5MHZ, 1:4 LVCMOS/
LVTTL Zero Delay Clock Buffer
TABLE 5B. AC CHARACTERISTICS, V
DD
= V
DDA
= 3.3V±5%, V
DDO
= 2.5V±5%, TA = -40°C TO 85°C
TABLE 5C. AC CHARACTERISTICS, V
DD
= V
DDA
= V
DDO
= 2.5V±5%, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency
F_SEL = 0 31.25 62.5 MHz
F_SEL = 1 15.625 31.25 MHz
tp
LH
Propagation Delay, Low-to-High; NOTE 1
PLL_SEL = 0V,
Bypass Mode
4.25 6.25 ns
t(Ø) Static Phase Offset; NOTE 2, 4 PLL_SEL = 2.5V -500 500 ps
tsk(o) Output Skew; NOTE 3, 4 PLL_SEL = 0V 65 ps
tjit(cc) Cycle-to-Cycle Jitter; NOTE 4 75 ps
t
L
PLL Lock Time 1mS
t
R
/ t
F
Output Rise/Fall Time 0.4 1 ns
odc Output Duty Cycle 48 52 %
All parameters measured at f
MAX
unless noted otherwise.
NOTE: Electrical parameters are guaranteed over the specifi ed ambient operating temperature range, which is established
when the device is mounted in a test socket with maintained transverse airfl ow greater than 500 lfpm. The device will meet
specifi cations after thermal equilibrium has been reached under these conditions.
NOTE 1: Measured from V
DD
/2 of the input crossing point to the output at V
DDO
/2.
NOTE 2: Defi ned as the time difference between the input reference clock and the average feedback input signal
when the PLL is locked and the input reference frequency is stable.
NOTE 3: Defi ned as skew between outputs at the same supply voltages and with equal load conditions.
Measured at V
DDO
/2.
NOTE 4: This parameter is defi ned in accordance with JEDEC Standard 65.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency
F_SEL = 0 31.25 62.5 MHz
F_SEL = 1 15.625 31.25 MHz
tp
LH
Propagation Delay, Low-to-High; NOTE 1
PLL_SEL = 0V,
Bypass Mode
4.5 6.5 ns
t(Ø) Static Phase Offset; NOTE 2, 4 PLL_SEL = 2.5V -500 500 ps
tsk(o) Output Skew; NOTE 3, 4 PLL_SEL = 0V 65 ps
tjit(cc) Cycle-to-Cycle Jitter; NOTE 4 75 ps
t
L
PLL Lock Time 1mS
t
R
/ t
F
Output Rise/Fall Time 0.4 1 ns
odc Output Duty Cycle 48 52 %
All parameters measured at f
MAX
unless noted otherwise.
NOTE: Electrical parameters are guaranteed over the specifi ed ambient operating temperature range, which is established
when the device is mounted in a test socket with maintained transverse airfl ow greater than 500 lfpm. The device will meet
specifi cations after thermal equilibrium has been reached under these conditions.
NOTE 1: Measured from V
DD
/2 of the input crossing point to the output at V
DDO
/2.
NOTE 2: Defi ned as the time difference between the input reference clock and the average feedback input signal
when the PLL is locked and the input reference frequency is stable.
NOTE 3: Defi ned as skew between outputs at the same supply voltages and with equal load conditions.
Measured at V
DDO
/2.
NOTE 4: This parameter is defi ned in accordance with JEDEC Standard 65.
15.625MHZ to 62.5MHZ, 1:4 LVCMOS/
LVTTL Zero Delay Clock Buffer
86004I DATA SHEET
6 REVISION A 7/10/15
3.3V CORE/2.5V OUTPUT LOAD AC TEST CIRCUIT3.3V CORE/3.3V OUTPUT LOAD AC TEST CIRCUIT
CYCLE-TO-CYCLE JITTER
OUTPUT SKEW
STATIC PHASE OFFSET
(where t(Ø) is any random sample, and t(Ø) mean is the average
of the sampled cycles measured on controlled edges)
t(Ø)
mean = Static Phase Offset
PARAMETER MEASUREMENT INFORMATION
2.5VCORE/ 2.5V OUTPUT LOAD AC TEST CIRCUIT

86004BGILF

Mfr. #:
Manufacturer:
IDT
Description:
Clock Buffer 4 LVCMOS OUT ZDB
Lifecycle:
New from this manufacturer.
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