Document Number: 69654
S09-2109-Rev. E, 12-Oct-09
www.vishay.com
3
Vishay Siliconix
Si4914BDY
Notes:
a. Guaranteed by design, not subject to production testing.
b. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
MOSFET SPECIFICATIONS T
J
= 25 °C, unless otherwise noted
Parameter Symbol Test Conditions Min. Typ.
a
Max. Unit
Dynamic
a
Tu r n - On D e l ay T i m e
t
d(on)
Channel-1
V
DD
= 15 V, R
L
= 3 Ω
I
D
≅ 5 A, V
GEN
= 10 V, R
g
= 1 Ω
Channel-2
V
DD
= 15 V, R
L
= 3 Ω
I
D
≅ 5 A, V
GEN
= 10 V, R
g
= 1 Ω
Ch-1 9 18
ns
Ch-2 10 20
Rise Time
t
r
Ch-1 10 20
Ch-2 9 18
Turn-Off Delay Time
t
d(off)
Ch-1 16 32
Ch-2 16 32
Fall Time
t
f
Ch-1 9 18
Ch-2 8 16
Source-Drain Reverse Recovery Time
t
rr
I
F
= 2.2 A, dI/dt = 100 A/µs
Ch-1 35 55
I
F
= 2.2 A, dI/dt = 100 A/µs
Ch-2 21 35
Body Diode Reverse Recovery Charge
Q
rr
I
F
= 2.2 A, dI/dt = 100 A/µs
Ch-1 40
nC
I
F
= 2.2 A, dI/dt = 100 A/µs
Ch-2 11
Reverse Recovery Fall Time
t
a
I
F
= 2.2 A, dI/dt = 100 A/µs
Ch-1 19
ns
I
F
= 2.2 A, dI/dt = 100 A/µs
Ch-2 11
Reverse Recovery Rise Time
t
b
I
F
= 2.2 A, dI/dt = 100 A/µs
Ch-1 16
I
F
= 2.2 A, dI/dt = 100 A/µs
Ch-2 10