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12061E224MAT2A

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P22
22
Specification
Appearance
No visual defects
Capacitance Variation
C0G (NP0): ± 2.5% or ± .25pF, whichever is greater
X7R: ≤ ± 7.5%
Z5U: ≤ ± 20%
Y5V: ≤ ± 20%
Q, Tan Delta
To meet initial requirement
Insulation Resistance
C0G (NP0), X7R: To meet initial requirement
Z5U, Y5V: ≥ Initial Value x 0.1
Dielectric Strength
No problem observed
Measuring Conditions
Step Temperature °C Time (minutes)
1
+65 +5/-0
15 ± 2
Pure Water
2
0 ± 3
15 ± 2
NaCl solution
Repeat cycle 2 times and wash with water and dry.
Store at room temperature for 48 ± 4 hours (24 hours for
C0G (NP0)) and measure.
General Specifications
Environmental
Specification
Appearance
No visual defects
Capacitance Variation
C0G (NP0): ± 2.5% or ± .25pF, whichever is greater
X7R: ≤ ± 7.5%
Z5U: ≤ ± 20%
Y5V: ≤ ± 20%
Q, Tan Delta
To meet initial requirement
Insulation Resistance
C0G (NP0), X7R: To meet initial requirement
Z5U, Y5V: ≥ Initial Value x 0.1
Dielectric Strength
No problem observed
Measuring Conditions
Step Temperature °C Time (minutes)
C0G (NP0), X7R: -55° ± 2°
1 Z5U: +10° ± 2° 30 ± 3
Y5V: -30° ± 2°
2 Room Temperature # 3
3
C0G (NP0), X7R: +125° ± 2°
30 ± 3
Z5U, Y5V: +85° ± 2°
4 Room Temperature # 3
Repeat for 5 cycles and measure after 48 hours ± 4 hours
(24 hours for C0G (NP0)) at room temperature.
THERMAL SHOCK
IMMERSION
MOISTURE RESISTANCE
Specification
Appearance
No visual defects
Capacitance Variation
C0G (NP0): ± 5% or ± .5pF, whichever is greater
X7R: ≤ ± 10%
Z5U: ≤ ± 30%
Y5V: ≤ ± 30%
Q, Tan Delta
C0G (NP0):≥ 30pF........................Q ≥ 350
≥ 10pF, < 30pF...........Q ≥ 275+5C/2
< 10pF ........................Q ≥ 200+10C
X7R: Initial requirement + .5%
Z5U: Initial requirement + 1%
Y5V: Initial requirement + 2%
Insulation Resistance
≥ Initial Value x 0.3
Measuring Conditions
Step Temp. °C Humidity % Time (hrs)
1 +25->+65 90-98 2.5
2 +65 90-98 3.0
3 +65->+25 80-98 2.5
4 +25->+65 90-98 2.5
5 +65 90-98 3.0
6 +65->+25 80-98 2.5
7 +25 90-98 2.0
7a -10 uncontrolled –
7b +25 90-98 –
Repeat 20 cycles (1-7) and store for 48 hours (24 hours
for C0G (NP0)) at room temperature before measuring.
Steps 7a & 7b are done on any 5 out of first 9 cycles.
23
General Specifications
Environmental
Specification
Appearance
No visual defects
Capacitance Variation
C0G (NP0): ± 5% or ± .5pF, whichever is greater
X7R: ≤ ± 10%
Z5U: ≤ ± 30%
Y5V: ≤ ± 30%
Q, Tan Delta
C0G (NP0): ≥ 30pF......................Q ≥ 350
≥ 10pF, < 30pF.........Q ≥ 275+5C/2
< 10pF ....................Q ≥ 200+10C
X7R: Initial requirement + .5%
Z5U: Initial requirement + 1%
Y5V: Initial requirement + 2%
Insulation Resistance
≥ Initial Value x 0.3
Measuring Conditions
Store at 85 ± 5% relative humidity and 85°C for 1000
hours, without voltage. Remove from test chamber
and stabilize at room temperature and humidity for
48 ± 4 hours (24 ±2 hours for C0G (NP0)) before
measuring.
Charge and discharge currents must be less than
50ma.
STEADY STATE HUMIDITY
(No Load)
Specification
Appearance
No visual defects
Capacitance Variation
C0G (NP0): ± 5% or ± .5pF, whichever is greater
X7R: ≤ ± 10%
Z5U: ≤ ± 30%
Y5V: ≤ ± 30%
Q, Tan Delta
C0G (NP0): ≥ 30pF .....................Q ≥ 350
≥ 10pF,< 30pF.........Q ≥ 275+5C/2
< 10pF ....................Q ≥ 200+10C
X7R: Initial requirement + .5%
Z5U: Initial requirement + 1%
Y5V: Initial requirement + 2%
LOAD HUMIDITY
Specification
Appearance
No visual defects
Capacitance Variation
C0G (NP0): ± 3% or ± .3pF, whichever is greater
X7R: ≤ ± 10%
Z5U: ≤ ± 30%
Y5V: ≤ ± 30%
Q, Tan Delta
C0G (NP0): ≥ 30pF......................Q ≥ 350
≥ 10pF, < 30pF.........Q ≥ 275+5C/2
< 10pF ....................Q ≥ 200+10C
X7R: Initial requirement + .5%
Z5U: Initial requirement + 1%
Y5V: Initial requirement + 2%
Insulation Resistance
C0G (NP0), X7R: To meet initial value x 0.3
Z5U, Y5V: ≥ Initial Value x 0.1
Charge devices with twice rated voltage in test
chamber set at +125°C ± 2°C for C0G (NP0) and X7R,
+85° ± 2°C for Z5U, and Y5V for 1000 (+48,-0) hours.
Remove from test chamber and stabilize at room
temperature for 48 ± 4 hours (24 ±2 hours for C0G
(NP0)) before measuring.
Charge and discharge currents must be less than
50ma.
LOAD LIFE
Insulation Resistance
C0G (NP0), X7R: To meet initial value x 0.3
Z5U, Y5V: ≥ Initial Value x 0.1
Charge devices with rated voltage in test chamber set
at 85 ± 5% relative humidity and 85°C for 1000
(+48,-0) hours. Remove from test chamber and
stabilize at room temperature and humidity for 48 ± 4
hours (24 ±2 hours for C0G (NP0)) before measuring.
Charge and discharge currents must be less than
50ma.
24
General Specifications
Mechanical
Specification
No evidence of peeling of end terminal
Measuring Conditions
After soldering devices to circuit board apply 5N
(0.51kg f) for 10 ± 1 seconds, please refer to Figure 1.
Specification
Appearance:
No visual defects
Capacitance
Within specified tolerance
Q, Tan Delta
To meet initial requirement
Insulation Resistance
C0G (NP0), X7R ⱖ Initial Value x 0.3
Z5U, Y5V ⱖ Initial Value x 0.1
Measuring Conditions
Vibration Frequency
10-2000 Hz
Maximum Acceleration
20G
Swing Width
1.5mm
Test Time
X, Y, Z axis for 2 hours each, total 6 hours of test
END TERMINATION ADHERENCE
RESISTANCE TO VIBRATION
Specification
ⱖ 95% of each termination end should be covered with
fresh solder
Measuring Conditions
Dip device in eutectic solder at 230 ± 5°C for
2 ± .5 seconds
Figure 2. Bend Strength
Figure 1.
Terminal Adhesion
SOLDERABILITY
Specification
Appearance:
No visual defects
Capacitance Variation
C0G (NP0): ± 5% or ± .5pF, whichever is larger
X7R: ≤ ± 12%
Z5U: ≤ ± 30%
Y5V: ≤ ± 30%
Insulation Resistance
C0G (NP0): ≥ Initial Value x 0.3
X7R: ≥ Initial Value x 0.3
Z5U: ≥ Initial Value x 0.1
Y5V: ≥ Initial Value x 0.1
Measuring Conditions
Please refer to Figure 2
Deflection:
2mm
Test Time:
30 seconds
BEND STRENGTH
Specification
Appearance:
No serious defects, <25% leaching of either end
terminal
Capacitance Variation
C0G (NP0): ± 2.5% or ± 2.5pF, whichever is greater
X7R: ≤ ± 7.5%
Z5U: ≤ ± 20%
Y5V: ≤ ± 20%
Q, Tan Delta
To meet initial requirement
Insulation Resistance
To meet initial requirement
Dielectric Strength
No problem observed
Measuring Conditions
Dip device in eutectic solder at 260°C, for 1 minute.
Store at room temperature for 48 hours (24 hours for
C0G (NP0)) before measuring electrical parameters.
Part sizes larger than 3.20mm x 2.49mm are reheated
at 150°C for 30 ±5 seconds before performing test.
RESISTANCE TO SOLDER HEAT
Speed = 1mm/sec
R340mm
Supports
2mm
Deflection
45mm 45mm
5N FORCE
DEVICE UNDER TEST
TEST BOARD
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P22

12061E224MAT2A

Mfr. #:
Buy 12061E224MAT2A
Manufacturer:
N/A
Description:
Multilayer Ceramic Capacitors MLCC - SMD/SMT 100V .22uF Z5U 1206 20% Tol
Lifecycle:
New from this manufacturer.
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