Tyco Electronics Corporation
300 Constitutional Drive
Menlo Park, CA 94025 USA
No: C-6111
Rev: G
Date: November 5, 1993
Page: 22 of 35
If this document is printed it becomes uncontrolled. Check for the latest revision.
Test Group 5
Test Sequence
Requirement
Paragraph
Procedure
Paragraph
Visual examination 3.1, 3.4, 3.5,
3.7, 3.8
4.5.2
Low signal level contact resistance 3.6.3.2 4.5.5.3
Contact resistance at specified current 3.6.3.1 4.5.5.1
Industrial gas exposure 3.6.26 4.5.28
Low signal level contact resistance 3.6.3.2 4.5.5.3
Contact resistance at specified current 3.6.3.1 4.5.5.1
Post test examination 3.6.42 4.5.44
Test Group 6 (EME shielded class only)
Test Sequence
Requirement
Paragraph
Procedure
Paragraph
Visual examination 3.1, 3.4, 3.5,
3.7, 3.8
4.5.2
Shell-to-shell conductivity 3.6.4 4.5.6
Durability 3.6.7 4.5.9
Shell-to-shell conductivity 3.6.4 4.5.6
EME shielding 3.6.36 4.5.38
Test Group 7
Test Sequence
Requirement
Paragraph
Procedure
Paragraph
Salt spray (dynamic test) 3.6.21 4.5.23.2
Test Group 8
Test Sequence
Requirement
Paragraph
Procedure
Paraqraph
Solderability (PCB mount tails only) 3.6.25 4.5.27
Gas tightness (wrap-post terminals only) 3.6.38 4.5.40
Strip force (wrap-post terminals only) 3.6.39 4.5.41
Wrapper resistance (wrap-post terminals only) 3.6.40 4.5.42
Tyco Electronics Corporation
300 Constitutional Drive
Menlo Park, CA 94025 USA
No: C-6111
Rev: G
Date: November 5, 1993
Page: 23 of 35
If this document is printed it becomes uncontrolled. Check for the latest revision.
Test Group 9
Insert Materials Tests:
Requirement
Paragraph
Procedure
Paragraph
Tensile strength 3.6.30.1 4.5.32.1
Deflection temperature 3.6.30.2 4.5.32.2
Water absorption 3.6.30.3 4.5.32.3
Flammability 3.6.30.4 4.5.32.4
Smoke generation 3.6.30.5 4.5-32.5
Test Group 10 (Removable Inserts Only)
Requirement
Paragraph
Procedure
Paragraph
Insert impact resistance 3.6.31 4.5.33
Insert impact chip resistance 3.6.32 4.5.34
Insert flexure 3.6.33 4.5.35
Test Group 11
Requirement
Paragraph
Procedure
Paragraph
Contact inductive load switching 3.6.27 4.5.29
Overload current and circuit breaker compatibilit 3.6.28 4.5.30
Temperature rise at rated current 3.6.29 4.5.31
Test Group 12
Requirement
Paragraph
Procedure
Paragraph
Removable insert abuse 3.6.34 4.5.36
Retention system fluid resistance 3.6.35 4.5.37
Test Group S-1 (Special, Non-Standard Configurations)
Requirement
Paragraph
Procedure
Paragraph
Visual examination 3.1, 3.4, 3.5,
3.7, 3.8
4.5.2
Coupling over torque 3.6.12 4.5.14
Thermal shock 3.6.16 4.5.18
Altitude immersion
Insulation resistance measurement
Dielectric withstanding voltage test
3.6.19 4.5.21
Solder termination tensile strength 3.6.8 4.5.10
Tyco Electronics Corporation
300 Constitutional Drive
Menlo Park, CA 94025 USA
No: C-6111
Rev: G
Date: November 5, 1993
Page: 24 of 35
If this document is printed it becomes uncontrolled. Check for the latest revision.
4.4 Acceptance Inspection. Lot acceptance inspection shall consist of the tests listed in
Table XII. Acceptance inspection shall be performed on every lot of connectors
manufactured under this specification. The sample units shall be tested unterminated
and shipped against orders. Inprocess examination may be used for acceptance
inspection. Statistical process control (SPC) may be substituted for lot acceptance
inspection per Raychem Standard Operating Procedure 0001.
Table XII. Acceptance Inspection
Test Requirement
Paragraph
Procedure
Paragraph
Inspection Level AQL*
Visual examination 3.1, 3.4, 3.5,
3.7, 3.8
4.5.2 I 4.0
Insulation resistance at room
temperature (inserts only)
3.6.1 4.5.3 S-3 1.0
Dielectric withstanding voltage
(inserts only)
3.6.2 4.5.4.1 S-3 1.0
Contact engagement and
separation forces (min and max
only)
3.6.6 4.5.8 S-3 1.0
*AQL shall apply to individual defects in accordance with MIL-STD-105, Section 4.5
4.4.1 Sampling for Acceptance Inspection. MIL-STD-105 shall apply for definitions of
inspection terms used herein. For purposes of this specification, the following shall
apply:
4.4.1.1 Inspection Lot. The inspection lot shall consist of all connectors or components of one
part number, manufactured under essentially the same conditions, and offered for
inspection at one time.
4.4.1.2 Inspection Level and Acceptable Quality Levels (AQL).
The inspection levels and
acceptable quality levels shall be in accordance with MIL-STD-105 and shall be as
specified in Table XII.
4.4.2 Rejected Lots. If an inspection lot is rejected, the lot shall be replaced, or the defective
units shall be reworked to correct the defect or screened out. If the lot is reworked or
the defective units are screened out, the lot shall be resubmitted for inspection.
Resubmitted lots shall be inspected using tightened inspection in accordance with MIL-
STD-105.
4.4.3 Examination of Preparation for Delivery.
Preparation for delivery of material ready for
shipment shall be examined to determine compliance with the requirements of Section
5.

MTCC1P-COAX-01S-01

Mfr. #:
Manufacturer:
TE Connectivity
Description:
Rack & Panel Connectors MTCC1P-COAX-01S-01
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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