CY28317-2
.....................Document #: 38-07094 Rev. *B Page 16 of 20
AC Electrical Characteristics
T
A
= 0°C to +70°C, V
DDQ3
= 3.3V±5%, f
XTL
= 14.31818 MHz
AC clock parameters are tested and guaranteed over stated operating conditions using the stated lump capacitive load at the
clock output; Spread Spectrum is disabled.
Notes:
5. X1 input threshold voltage (typical) is V
DD
/2.
6. The CY28317-2 contains an internal crystal load capacitor between pin X1 and ground and another between pin X2 and ground. The total load placed on the
crystal is 18 pF; this includes typical stray capacitance of short PCB traces to the crystal.
7. X1 input capacitance is applicable when driving X1 with an external clock source (X2 is left unconnected).
8. Determined as a fraction of 2* (t
RP
– t
RN
). Where t
RP
is a rising edge and t
RN
is an intersection falling edge.
Crystal Oscillator
V
TH
X1 Input Threshold Voltage
[5]
V
DDQ3
= 3.3V 1.65 V
C
LOAD
Load Capacitance, Imposed on
External Crystal
[6]
18 pF
C
IN,X1
X1 Input Capacitance
[7]
Pin X2 unconnected TBD pF
Pin Capacitance/Inductance
C
IN
Input Pin Capacitance Except X1 and X2 5 pF
C
OUT
Output Pin Capacitance 6 pF
L
IN
Input Pin Inductance 7nH
DC Electrical Characteristics: T
A
= 0°C to +70°C, V
DDQ3
= 3.3V ±5%
[3]
(continued)
Parameter Description Test Condition Min. Typ. Max. Unit
CPU Clock Outputs
[8]
Parameter Description Test Condition/Comments
CPU = 100 MHz CPU = 133 MHz
UnitMin. Typ. Max. Min. Typ. Max.
t
R
Output Rise Edge Rate 1.0 4.0 1.0 4.0 v/ns
t
F
Output Fall Edge Rate 1.0 2.0 1.0 2.0 v/ns
t
D
Duty Cycle Measured at 50% point 45 55 45 55 %
t
JC
Jitter, Cycle to Cycle 250 250 ps
f
ST
Frequency Stabilization
from Power-up (cold
start)
Assumes full supply voltage reached
within 1 ms from power-up. Short
cycles exist prior to frequency
stabilization.
33ms
Z
o
AC Output Impedance V
O
= V
X
50 50
CY28317-2
.....................Document #: 38-07094 Rev. *B Page 17 of 20
PCI Clock Outputs, PCI (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
t
P
Period Measured on the rising edge at 1.5V 30 ns
t
H
High Time Duration of clock cycle above 2.4V 12 ns
t
L
Low Time Duration of clock cycle below 0.4V 12 ns
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 1 4 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 1 4 V/ns
t
D
Duty Cycle Measured on the rising and falling edges at 1.5V 45 55 %
t
JC
Jitter, Cycle-to-Cycle Measured on the rising edge at 1.5V. Maximum
difference of cycle time between two adjacent cycles.
250 ps
t
SK
Output Skew Measured on the rising edge at 1.5V 500 ps
t
O
CPU to PCI Clock Skew Covers all CPU/PCI outputs. Measured on the rising
edge at 1.5V. CPU leads PCI output.
1.5 4 ns
f
ST
Frequency Stabilization
from Power-up (cold
start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to frequency
stabilization.
3ms
Z
o
AC Output Impedance Average value during switching transition. Used for
determining series termination value.
30
REF Clock Outputs (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency, Actual Frequency generated by crystal oscillator 14.318 MHz
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 0.5 2 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 0.5 2 V/ns
t
D
Duty Cycle Measured on the rising and falling edges at 1.5V 45 55 %
f
ST
Frequency Stabilization from
Power-up (cold start)
Assumes full supply voltage reached within
1 ms from power-up. Short cycles exist prior to
frequency stabilization.
3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
40
48-MHz Clock Output (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency, Actual Determined by PLL divider ratio (see m/n below) 48.008 MHz
f
D
Deviation from 48 MHz (48.008 – 48)/48 +167 ppm
m/n PLL Ratio (14.31818 MHz x 57/17 = 48.008 MHz) 57/17
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 0.5 2 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 0.5 2 V/ns
t
D
Duty Cycle Measured on the rising and falling edges at 1.5V 45 55 %
f
ST
Frequency Stabilization
from Power-up (cold start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to
frequency stabilization.
3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
40
CY28317-2
.....................Document #: 38-07094 Rev. *B Page 18 of 20
24-MHz Clock Output (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency, Actual Determined by PLL divider ratio (see m/n below) 24.004 MHz
f
D
Deviation from 24 MHz (24.004 – 24)/24 +167 ppm
m/n PLL Ratio (14.31818 MHz x 57/34 = 24.004 MHz) 57/34
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 0.5 2 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 0.5 2 V/ns
t
D
Duty Cycle Measured on the rising and falling edges at 1.5V 45 55 %
f
ST
Frequency Stabilization
from Power-up (cold start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to
frequency stabilization.
3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
40
Ordering Information
Ordering Code Package Type Operating Range
CY28317PVC-2 48-pin SSOP Commercial, 0°C to 70°C
CY28317PVC-2T 48-pin SSOP - Tape and Reel Commercial, 0°C to 70°C
CY28317ZC-2 48-pin TSSOP Commercial, 0°C to 70°C
CY28317ZC-2T 48-pin TSSOP - Tape and Reel Commercial, 0°C to 70°C

CY28317PVXC-2T

Mfr. #:
Manufacturer:
Silicon Labs
Description:
Clock Generators & Support Products NB clk for VIATM SDRAM chipsets / Tualatin
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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