5
LT1115
1115fa
Slew Rate, Gain-Bandwidth-Product
vs Overcompensation Capacitor
CCIF IMD Test (Twin Equal
Amplitude Tones at 13 and 14kHz)*
0.001
0.0001
0.010
0.1
INTERMODULATION DISTORTION (at 1kHz) (%)
OUTPUT AMPLITUDE (V
RMS
)
10m
0.1
1
10
A
V
= 10
R
L
= 600
T
A
= 25
°
C
V
S
= ±18V
LT1115 • TPC10
CCIF IMD Test (Twin Equal
Amplitude Tones at 13 and 14kHz)*
0.001
0.0001
0.010
0.1
INTERMODULATION DISTORTION (at 1kHz) (%)
OUTPUT AMPLITUDE (V
RMS
)
10m
0.1
1
10
A
V
= 10
R
L
= 10k
T
A
= 25
°
C
V
S
= ±18V
LT1115 • TPC11
Total Noise vs Unmatched Source
Resistance Current Noise Spectrum
FREQUENCY (Hz)
10
CURRENT NOISE DENSITY (pA/√Hz)
100
1k
10k
10
100
1
0.1
TYPICAL
LT1115 • TPC14
1/f CORNER = 250Hz
Voltage Noise vs Temperature
TEMPERATURE (°C)
0
0
RMS VOLTAGE NOISE DENSITY (nV/√Hz)
0.8
1.2
30
2.0
0.4
15 75
60
45
1.6
V
S
= ±18V
AT 10Hz
AT 1kHz
LT1115 • TPC15
SUPPLY VOLTAGE (V)
0
1.0
1.25
±20
0.75
0.5
± 5
± 10
± 15
1.5
AT 1kHz
T
A
= 25°C
RMS VOLTAGE NOISE DENSITY (nV/√Hz)
LT1115 • TPC16
Voltage Noise vs Supply Voltage Supply Current vs Temperature
SUPPLY CURRENT (mA)
10
1
2
3
4
5
6
7
8
9
0
TEMPERATURE (°C)
0
30
15
75
60
45
V
S
= ±18V
V
S
= ±15V
V
S
= ± 5V
LT1115 • TPC17
Output Short-Circuit Current
vs Time
*See CCIF Test Note at end of “Typical Performance Characteristics”.
TIME FROM OUTPUT SHORT TO GROUND (MINUTES)
–50
SHORT-CIRCUIT CURRENT (mA)
SINKING SOURCING
–40
–20
–10
0
01
23
50
20
–30
30
40
10
V
S
= ± 18V
25°C
25°C
LT1115 • TPC18
UNMATCHED SOURCE RESISTANCE, R
S
(Ω)
10k
10
10
100
100
1k 3k
1.0
0.1
1
3
30
300
TOTAL NOISE DENSITY (nV/√Hz)
R
S
AT 1kHz
AT 10Hz
R
S
NOISE ONLY
V
S
= ± 18V
T
A
= 25
°
C
LT1115 • TPC13
OVERCOMPENSATION CAPACITOR (pF)
GAIN AT 20kHz
1
SLEW RATE (V/µs)
10
1 100
100
1000
1000
10000
10000
0.1
10
10
100
C
OC
FROM PIN 5 TO PIN 6
V
S
= ±18V
T
A
= 25
°
C
LT1115 • TPC12
GWB
SLEW
TYPICAL PERFOR A CE CHARACTERISTICS
UW
