18
LTC2420
into an internal static shift register. The device remains in
the sleep state until the first rising edge of SCK. Data is
shifted out the SDO pin on each falling edge of SCK
enabling external circuitry to latch data on the rising edge
of SCK. EOC can be latched on the first rising edge of SCK.
On the 24th falling edge of SCK, SDO goes HIGH (EOC = 1)
indicating a new conversion has begun.
Internal Serial Clock, Single Cycle Operation
This timing mode uses an internal serial clock to shift out
the conversion result and a CS signal to monitor and
control the state of the conversion cycle, see Figure 9.
In order to select the internal serial clock timing mode, the
serial clock pin (SCK) must be floating (Hi-Z) or pulled
HIGH prior to the falling edge of CS. The device will not
enter the internal serial clock mode if SCK is driven LOW
on the falling edge of CS. An internal weak pull-up resistor
is active on the SCK pin during the falling edge of CS;
therefore, the internal serial clock timing mode is auto-
matically selected if SCK is not externally driven.
The serial data output pin (SDO) is Hi-Z as long as CS is
HIGH. At any time during the conversion cycle, CS may be
pulled LOW in order to monitor the state of the converter.
Once CS is pulled LOW, SCK goes LOW and EOC is output
to the SDO pin. EOC = 1 while a conversion is in progress
and EOC = 0 if the device is in the sleep state.
When testing EOC, if the conversion is complete (EOC = 0),
the device will exit the sleep state and enter the data output
state if CS remains LOW. In order to prevent the device
from exiting the low power sleep state, CS must be pulled
HIGH before the first rising edge of SCK. In the internal
SCK timing mode, SCK goes HIGH and the device begins
outputting data at time t
EOCtest
after the falling edge of CS
(if EOC = 0) or t
EOCtest
after EOC goes LOW (if CS is LOW
during the falling edge of EOC). The value of t
EOCtest
is 23µs
if the device is using its internal oscillator (F
0
= logic LOW
or HIGH). If F
O
is driven by an external oscillator of
frequency f
EOSC
, then t
EOCtest
is 3.6/f
EOSC
. If CS is pulled
HIGH before time t
EOCtest
, the device remains in the sleep
state. The conversion result is held in the internal static
shift register.
If CS remains LOW longer than t
EOCtest
, the first rising
edge of SCK will occur and the conversion result is serially
shifted out of the SDO pin. The data output cycle begins on
this first rising edge of SCK and concludes after the 24th
rising edge. Data is shifted out the SDO pin on each falling
edge of SCK. The internally generated serial clock is output
to the SCK pin. This signal may be used to shift the
SDO
SCK
(INTERNAL)
CS
MSBEXRSIG
BIT 0
LSB
20
BIT 4
TEST EOC
BIT 19 BIT 18BIT 20BIT 21BIT 22
EOC
BIT 23
SLEEP DATA OUTPUT CONVERSIONCONVERSION
2420 F09
<t
EOCtest
V
CC
F
O
V
REF
SCK
V
IN
SDO
GND CS
V
REF
0.1V TO V
CC
V
IN
–0.12V
REF
TO 1.12V
REF
1µF
2.7V TO 5.5V
LTC2420
V
CC
10k
= 50Hz REJECTION
= EXTERNAL OSCILLATOR
= 60Hz REJECTION
Hi-Z Hi-Z Hi-Z Hi-Z
V
CC
TEST EOC
Figure 9. Internal Serial Clock, Single Cycle Operation
APPLICATIO S I FOR ATIO
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