Table 7: Electrical Characteristics and AC Operating Conditions for Speed Extensions (Continued)
Notes 1–8 apply to the entire table
Parameter Symbol
DDR3L-1866
Unit NotesMin Max
Power-down entry period: ODT either
synchronous or asynchronous
PDE Greater of
t
ANPD or
t
RFC -
REFRESH command to CKE
LOW time
CK
Power-down exit period: ODT either
synchronous or asynchronous
PDX
t
ANPD +
t
XPDLL CK
Power-Down Entry Minimum Timing
ACTIVATE command to power-down entry
t
ACTPDEN MIN = 2 CK
PRECHARGE/PRECHARGE ALL command to
power-down entry
t
PRPDEN MIN = 2 CK
REFRESH command to power-down entry
t
REFPDEN MIN = 2 CK 37
MRS command to power-down entry
t
MRSPDEN MIN =
t
MOD (MIN) CK
READ/READ with auto precharge command to
power-down entry
t
RDPDEN MIN = RL + 4 + 1 CK
WRITE command to pow-
er-down entry
BL8 (OTF, MRS)
BC4OTF
t
WRPDEN MIN = WL + 4 +
t
WR/
t
CK (AVG)
CK
BC4MRS
t
WRPDEN MIN = WL + 2 +
t
WR/
t
CK (AVG)
CK
WRITE with auto pre-
charge command to pow-
er-down entry
BL8 (OTF, MRS)
BC4OTF
t
WRAPDEN MIN = WL + 4 + WR + 1 CK
BC4MRS
t
WRAPDEN MIN = WL + 2 + WR + 1 CK
Power-Down Exit Timing
DLL on, any valid command, or DLL off to
commands not requiring locked DLL
t
XP MIN = greater of 3CK or
6ns;
MAX = N/A
CK
Precharge power-down with DLL off to
commands requiring a locked DLL
t
XPDLL MIN = greater of 10CK or
24ns; MAX = N/A
CK 28
ODT Timing
R
TT
synchronous turn-on delay ODTL on CWL + AL - 2CK CK 38
R
TT
synchronous turn-off delay ODTL off CWL + AL - 2CK CK 40
R
TT
turn-on from ODTL on reference
t
AON –195 195 ps 23, 38
R
TT
turn-off from ODTL off reference
t
AOF 0.3 0.7 CK 39, 40
Asynchronous R
TT
turn-on delay
(power-down with DLL off)
t
AONPD MIN = 2; MAX = 8.5 ns 38
Asynchronous R
TT
turn-off delay
(power-down with DLL off)
t
AOFPD MIN = 2; MAX = 8.5 ns 40
ODT HIGH time with WRITE command and BL8 ODTH8 MIN = 6; MAX = N/A CK
ODT HIGH time without WRITE command or with
WRITE command and BC4
ODTH4 MIN = 4; MAX = N/A CK
Dynamic ODT Timing
1Gb: x8, x16 Automotive DDR3L SDRAM Addendum
Electrical Characteristics and AC Operating Conditions
09005aef86775d6d
1gb_aut_DDR3L_1_35v_addendum.pdf - Rev. C 2/17 EN
13
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.
Table 7: Electrical Characteristics and AC Operating Conditions for Speed Extensions (Continued)
Notes 1–8 apply to the entire table
Parameter Symbol
DDR3L-1866
Unit NotesMin Max
R
TT,nom
-to-R
TT(WR)
change skew ODTLcnw WL - 2CK CK
R
TT(WR)
-to-R
TT,nom
change skew - BC4 ODTLcwn4 4CK + ODTLoff CK
R
TT(WR)
-to-R
TT,nom
change skew - BL8 ODTLcwn8 6CK + ODTLoff CK
R
TT
dynamic change skew
t
ADC 0.3 0.7 CK 39
Write Leveling Timing
First DQS, DQS# rising edge
t
WLMRD 40 CK
DQS, DQS# delay
t
WLDQSEN 25 CK
Write leveling setup from rising CK, CK#
crossing to rising DQS, DQS# crossing
t
WLS 140 ps
Write leveling hold from rising DQS, DQS#
crossing to rising CK, CK# crossing
t
WLH 140 ps
Write leveling output delay
t
WLO 0 7.5 ns
Write leveling output error
t
WLOE 0 2 ns
Notes:
1. AC timing parameters are valid from specified T
C
MIN to T
C
MAX values.
2. All voltages are referenced to V
SS
.
3. Output timings are only valid for R
ON34
output buffer selection.
4. The unit
t
CK (AVG) represents the actual
t
CK (AVG) of the input clock under operation.
The unit CK represents one clock cycle of the input clock, counting the actual clock
edges.
5. AC timing and I
DD
tests may use a V
IL
-to-V
IH
swing of up to 900mV in the test environ-
ment, but input timing is still referenced to V
REF
(except
t
IS,
t
IH,
t
DS, and
t
DH use the
AC/DC trip points and CK, CK# and DQS, DQS# use their crossing points). The minimum
slew rate for the input signals used to test the device is 1 V/ns for single-ended inputs
(DQs are at 2V/ns for DDR3-1866 and DDR3-2133) and 2 V/ns for differential inputs in
the range between V
IL(AC)
and V
IH(AC)
.
6. All timings that use time-based values (ns, µs, ms) should use
t
CK (AVG) to determine the
correct number of clocks (Table 7 (page 9) uses CK or
t
CK [AVG] interchangeably). In the
case of noninteger results, all minimum limits are to be rounded up to the nearest
whole integer, and all maximum limits are to be rounded down to the nearest whole
integer.
7. Strobe or DQSdiff refers to the DQS and DQS# differential crossing point when DQS is
the rising edge. Clock or CK refers to the CK and CK# differential crossing point when
CK is the rising edge.
8. This output load is used for all AC timing (except ODT reference timing) and slew rates.
The actual test load may be different. The output signal voltage reference point is
V
DDQ
/2 for single-ended signals and the crossing point for differential signals (see Figure
25: Differential Output Signal in the data sheet).
9. When operating in DLL disable mode, Micron does not warrant compliance with normal
mode timings or functionality.
10. The clock’s
t
CK (AVG) is the average clock over any 200 consecutive clocks and
t
CK (AVG)
MIN is the smallest clock rate allowed, with the exception of a deviation due to clock
jitter. Input clock jitter is allowed provided it does not exceed values specified and must
be of a random Gaussian distribution in nature.
1Gb: x8, x16 Automotive DDR3L SDRAM Addendum
Electrical Characteristics and AC Operating Conditions
09005aef86775d6d
1gb_aut_DDR3L_1_35v_addendum.pdf - Rev. C 2/17 EN
14
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.
11. Spread spectrum is not included in the jitter specification values. However, the input
clock can accommodate spread-spectrum at a sweep rate in the range of 20–60 kHz with
an additional 1% of
t
CK (AVG) as a long-term jitter component; however, the spread
spectrum may not use a clock rate below
t
CK (AVG) MIN.
12. The clock’s
t
CH (AVG) and
t
CL (AVG) are the average half clock period over any 200 con-
secutive clocks and is the smallest clock half period allowed, with the exception of a de-
viation due to clock jitter. Input clock jitter is allowed provided it does not exceed values
specified and must be of a random Gaussian distribution in nature.
13. The period jitter (
t
JITper) is the maximum deviation in the clock period from the average
or nominal clock. It is allowed in either the positive or negative direction.
14.
t
CH (ABS) is the absolute instantaneous clock high pulse width as measured from one
rising edge to the following falling edge.
15.
t
CL (ABS) is the absolute instantaneous clock low pulse width as measured from one fall-
ing edge to the following rising edge.
16. The cycle-to-cycle jitter
t
JITcc is the amount the clock period can deviate from one cycle
to the next. It is important to keep cycle-to-cycle jitter at a minimum during the DLL
locking time.
17. The cumulative jitter error
t
ERRnper, where n is the number of clocks between 2 and 50,
is the amount of clock time allowed to accumulate consecutively away from the average
clock over n number of clock cycles.
18.
t
DS (base) and
t
DH (base) values are for a single-ended 1 V/ns slew rate DQs (DQs are at
2V/ns for DDR3-1866 and DDR3-2133) and 2 V/ns slew rate differential DQS, DQS#; when
DQ single-ended slew rate is 2V/ns, the DQS differential slew rate is 4V/ns.
19. These parameters are measured from a data signal (DM, DQ0, DQ1, and so forth) transi-
tion edge to its respective data strobe signal (DQS, DQS#) crossing.
20. The setup and hold times are listed converting the base specification values (to which
derating tables apply) to V
REF
when the slew rate is 1 V/ns (DQs are at 2V/ns for
DDR3-1866 and DDR3-2133). These values, with a slew rate of 1 V/ns (DQs are at 2V/ns
for DDR3-1866 and DDR3-2133), are for reference only.
21. When the device is operated with input clock jitter, this parameter needs to be derated
by the actual
t
JITper (larger of
t
JITper (MIN) or
t
JITper (MAX) of the input clock (output
deratings are relative to the SDRAM input clock).
22. Single-ended signal parameter.
23. The DRAM output timing is aligned to the nominal or average clock. Most output pa-
rameters must be derated by the actual jitter error when input clock jitter is present,
even when within specification. This results in each parameter becoming larger. The fol-
lowing parameters are required to be derated by subtracting
t
ERR10per (MAX):
t
DQSCK
(MIN),
t
LZDQS (MIN),
t
LZDQ (MIN), and
t
AON (MIN). The following parameters are re-
quired to be derated by subtracting
t
ERR10per (MIN):
t
DQSCK (MAX),
t
HZ (MAX),
t
LZDQS
(MAX),
t
LZDQ (MAX), and
t
AON (MAX). The parameter
t
RPRE (MIN) is derated by sub-
tracting
t
JITper (MAX), while
t
RPRE (MAX) is derated by subtracting
t
JITper (MIN).
24. The maximum preamble is bound by
t
LZDQS (MAX).
25. These parameters are measured from a data strobe signal (DQS, DQS#) crossing to its re-
spective clock signal (CK, CK#) crossing. The specification values are not affected by the
amount of clock jitter applied, as these are relative to the clock signal crossing. These
parameters should be met whether clock jitter is present.
26. The
t
DQSCK (DLL_DIS) parameter begins CL + AL - 1 cycles after the READ command.
27. The maximum postamble is bound by
t
HZDQS (MAX).
28. Commands requiring a locked DLL are: READ (and RDAP) and synchronous ODT com-
mands. In addition, after any change of latency
t
XPDLL, timing must be met.
29.
t
IS (base) and
t
IH (base) values are for a single-ended 1 V/ns control/command/address
slew rate and 2 V/ns CK, CK# differential slew rate.
1Gb: x8, x16 Automotive DDR3L SDRAM Addendum
Electrical Characteristics and AC Operating Conditions
09005aef86775d6d
1gb_aut_DDR3L_1_35v_addendum.pdf - Rev. C 2/17 EN
15
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.

MT41K128M8DA-107 AIT:J TR

Mfr. #:
Manufacturer:
Micron
Description:
DRAM DDR3 1G 128MX8 FBGA
Lifecycle:
New from this manufacturer.
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